Identifying Native Point Defects in the Topological Insulator Bi2Te3

We successfully identified native point defects that occur in Bi2Te3 crystals by combining high-resolution bias-dependent scanning tunneling microscopy and density functional theory based calculations. As-grown Bi2Te3 crystals contain vacancies, antisites, and interstitial defects that may result in...

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Veröffentlicht in:	ACS NANO 2020-10, Vol.14 (10), p.13172-13179
Hauptverfasser:	Netsou, Asteriona-Maria, Muzychenko, Dmitry A, Dausy, Heleen, Chen, Taishi, Song, Fengqi, Schouteden, Koen, Van Bael, Margriet J, Van Haesendonck, Chris
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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