Effective DC fault models and testing approach for open defects in analog circuits

© 2016 IEEE. The detection level of defects in today's mixed-signal ICs lags behind the extremely high demand of industries such as automotive. This is mainly because analog blocks in these ICs have high test escape rates as a result of the typical testing based on the performance specification...

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Hauptverfasser:	Esen, Vahap Baris, Coyette, Anthony, Dobbelaere, Wim, Vanhooren, Ronny, Gielen, Georges
Format:	Tagungsbericht
Sprache:	eng
Online-Zugang:	Volltext bestellen
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