Electronic Band Structures and Native Point Defects of Ultrafine ZnO Nanocrystals

Ultrafine ZnO nanocrystals with a thickness down to 0.25 nm are grown by a metalorganic chemical vapor deposition method. Electronic band structures and native point defects of ZnO nanocrystals are studied by a combination of scanning tunneling microscopy/spectroscopy and first-principles density fu...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	ACS APPLIED MATERIALS & INTERFACES 2015, Vol.7 (19), p.10617-10622
Hauptverfasser:	Zeng, Yujia, Schouteden, Koen, Amini, Mozhgan N, Ruan, Shuang-Chen, Lu, Yang-Fan, Ye, Zhi-Zhen, Partoens, Bart, Lamoen, Dirk, Van Haesendonck, Chris
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!