A Novel Voltage Clamp Circuit for the Measurement of Transistor Dynamic On-Resistance

For determining the dynamic on-resistance Rdynon of a power transistor, the voltage and current waveforms have to be measured during the switching operation. In measurements of voltage waveforms, using an oscilloscope, the characteristics of an amplifier inside the oscilloscope are distorted when the...

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Hauptverfasser:	Gelagaev, Ratmir, Jacqmaer, Pieter, Everts, Jordi, Driesen, Johan
Format:	Tagungsbericht
Sprache:	eng
Online-Zugang:	Volltext bestellen
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