Fabrication of Three-Dimensional Reflective White Pattern using Dry-Film Resist
White reflective patterns are very difficult to fabricate, due to the scattering and reflection of light, especially when the pattern size goes down to micron size. A reflective white barrier structure of height $50{\mu}m$ and width $80{\mu}m$ was fabricated using dry-film resist as an intermediate...
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| Veröffentlicht in: | Journal of the Optical Society of Korea 2015, Vol.19 (1), p.80-83 |
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| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | kor |
| Online-Zugang: | Volltext |
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