A Study on the Properties of Optically Induced Layers in Semiconductors Aided by the Reflection of Optically Controlled Microwave Pulses

A Study on the Properties of Optically Induced Layers in Semiconductors Aided by the Reflection of Optically Controlled Microwave Pulses

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Veröffentlicht in:Transactions on electrical and electronic materials 2009-08, Vol.10 (4), p.111
Hauptverfasser: Xue Wang, Yue Soon Choi, Jong Goo Park, Yong K. Kim
Format: Artikel
Sprache:kor
Schlagworte:
Micro-strip Lines
Non-uniform plasma
Optically controlled microwave
Semiconductor Layer
Transient Response
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source Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals; Alma/SFX Local Collection
subjects Micro-strip Lines
Non-uniform plasma
Optically controlled microwave
Semiconductor Layer
Transient Response
title A Study on the Properties of Optically Induced Layers in Semiconductors Aided by the Reflection of Optically Controlled Microwave Pulses
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