Low-Energy Photoemission Study of C60/Rubrene/Au Interfaces in Practical Device Thickness

Low-energy photoelectron spectroscopy combined with photoelectron yield spectroscopy was developed to investigate the buried organic interfaces in the practical device thickness. Ultralow background signal and charging durability were achieved by utilizing monochromatic low-energy photons. C 60 /rub...

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Veröffentlicht in:	Applied physics express 2013-02, Vol.6 (2), p.025801-025801-4
Hauptverfasser:	Machida, Shin'ichi, Ozawa, Yusuke, Takahashi, Jun-ichi, Tokairin, Hiroshi, Nakayama, Yasuo, Ishii, Hisao
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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