High-temperature tensile testing machine for investigation of brittle-ductile transition behavior of single crystal silicon microstructure

This paper reports development of a high-temperature tensile testing machine and testing of single crystal silicon (SCS) for investigation of the size effect on brittle-ductile transition temperature (BDTT). Two different-width 〈110〉 SCS specimens (120 µm long, 5 µm thick and 4 or 9 µm wide) were te...

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Veröffentlicht in:	Japanese Journal of Applied Physics 2015-06, Vol.54 (6S1), p.6
Hauptverfasser:	Uesugi, Akio, Yasutomi, Takahiro, Hirai, Yoshikazu, Tsuchiya, Toshiyuki, Tabata, Osamu
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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