Uniform bipolar resistive switching behaviors in BiFeO3 thin films on Fe-doped LaNiO3 electrodes
The uniform bipolar resistive switching effect has been observed in Pt/BiFeO3/LaNi0.95Fe0.05O3/Si structures. The use of Fe doped LaNiO3 as electrodes can improve the resistive switching performance of Pt/BiFeO3/LaNi0.95Fe0.05O3/Si devices, such as lower operating voltages and power consumption. Suc...
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Veröffentlicht in: | Applied physics express 2014-08, Vol.7 (9) |
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creator | Chen, Ruqi Lao, Meimei Xu, Jun Xu, Chudong |
description | The uniform bipolar resistive switching effect has been observed in Pt/BiFeO3/LaNi0.95Fe0.05O3/Si structures. The use of Fe doped LaNiO3 as electrodes can improve the resistive switching performance of Pt/BiFeO3/LaNi0.95Fe0.05O3/Si devices, such as lower operating voltages and power consumption. Such devices also exhibit stable bipolar resistive switching characteristics with a resistance ratio of about 20 and a retention time of 103 s. On the basis of the current-voltage characteristics, the dominant conduction mechanisms were inferred to be ohmic conduction in the low-resistance state and Schottky emission in the high-resistance state. The conducting filament-related model has been proposed to explain the physical mechanism underlying the bipolar resistive switching behavior in terms of the migration of oxygen vacancies. |
doi_str_mv | 10.7567/APEX.7.095801 |
format | Article |
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The use of Fe doped LaNiO3 as electrodes can improve the resistive switching performance of Pt/BiFeO3/LaNi0.95Fe0.05O3/Si devices, such as lower operating voltages and power consumption. Such devices also exhibit stable bipolar resistive switching characteristics with a resistance ratio of about 20 and a retention time of 103 s. On the basis of the current-voltage characteristics, the dominant conduction mechanisms were inferred to be ohmic conduction in the low-resistance state and Schottky emission in the high-resistance state. 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Phys. Express</addtitle><description>The uniform bipolar resistive switching effect has been observed in Pt/BiFeO3/LaNi0.95Fe0.05O3/Si structures. The use of Fe doped LaNiO3 as electrodes can improve the resistive switching performance of Pt/BiFeO3/LaNi0.95Fe0.05O3/Si devices, such as lower operating voltages and power consumption. Such devices also exhibit stable bipolar resistive switching characteristics with a resistance ratio of about 20 and a retention time of 103 s. On the basis of the current-voltage characteristics, the dominant conduction mechanisms were inferred to be ohmic conduction in the low-resistance state and Schottky emission in the high-resistance state. 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Phys. Express</addtitle><date>2014-08-05</date><risdate>2014</risdate><volume>7</volume><issue>9</issue><issn>1882-0778</issn><eissn>1882-0786</eissn><coden>APEPC4</coden><abstract>The uniform bipolar resistive switching effect has been observed in Pt/BiFeO3/LaNi0.95Fe0.05O3/Si structures. The use of Fe doped LaNiO3 as electrodes can improve the resistive switching performance of Pt/BiFeO3/LaNi0.95Fe0.05O3/Si devices, such as lower operating voltages and power consumption. Such devices also exhibit stable bipolar resistive switching characteristics with a resistance ratio of about 20 and a retention time of 103 s. On the basis of the current-voltage characteristics, the dominant conduction mechanisms were inferred to be ohmic conduction in the low-resistance state and Schottky emission in the high-resistance state. The conducting filament-related model has been proposed to explain the physical mechanism underlying the bipolar resistive switching behavior in terms of the migration of oxygen vacancies.</abstract><pub>The Japan Society of Applied Physics</pub><doi>10.7567/APEX.7.095801</doi><tpages>4</tpages></addata></record> |
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title | Uniform bipolar resistive switching behaviors in BiFeO3 thin films on Fe-doped LaNiO3 electrodes |
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