Nanoscale Raman Imaging with Nanogold-Topped AFM Probes Fabricated by Area-Selective Electroless Deposition

A single gold nanostructure is successfully deposited at the tip apex of a silicon probe for atomic force microscopes (AFM) in an electroless and area-selective manner. The tip apex of a commercially available silicon AFM probe is irradiated with a focused ion beam (FIB) to remove the native oxide l...

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Veröffentlicht in:	Journal of the Electrochemical Society 2018, Vol.165 (14), p.D711-D715
Hauptverfasser:	Itasaka, Hiroki, Nishi, Masayuki, Shimizu, Masahiro, Okuno, Yoshito, Kashiwagi, Shinsuke, Naka, Nobuyuki, Hirao, Kazuyuki
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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