Development of Water Vapor Transport Resistance Protocol and Analysis

Methodology for a robust water vapor transport protocol is discussed. Transport across the membrane was driven by a water activity gradient for a range of relative humidity conditions at 95°C. An Evaluating the Measurement Process study demonstrated the ability to detect a difference in total resist...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:ECS transactions 2019-07, Vol.92 (8), p.445-454
Hauptverfasser: Redmond, Erin L., Hansen, Kentaro U., Berg, David W.
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 454
container_issue 8
container_start_page 445
container_title ECS transactions
container_volume 92
creator Redmond, Erin L.
Hansen, Kentaro U.
Berg, David W.
description Methodology for a robust water vapor transport protocol is discussed. Transport across the membrane was driven by a water activity gradient for a range of relative humidity conditions at 95°C. An Evaluating the Measurement Process study demonstrated the ability to detect a difference in total resistance greater than 0.003 ±0.0001 cm2-s/µmol, with 90% power and 95% confidence. Electrodes used in this study increased transport resistance when applied to ePTFE reinforced membranes 10 µm or less. The resistance of a series of cast films of varying thickness were measured under hydrogen and nitrogen to isolate the interfacial and gas-phase contributions to the total resistance. The interfacial effect is not statistically significant as measured in this study.
doi_str_mv 10.1149/09208.0445ecst
format Article
fullrecord <record><control><sourceid>iop_cross</sourceid><recordid>TN_cdi_iop_journals_10_1149_09208_0445ecst</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10.1149/09208.0445ecst</sourcerecordid><originalsourceid>FETCH-LOGICAL-c226t-d40c4a86c3b5289578c23cf9070c22b2e930ef38606eee797ab524ae0825b9673</originalsourceid><addsrcrecordid>eNp1kM1LAzEQxYMoWKtXzzkLu85ms_k4llo_oKBI1WPIprPQst0sSRT63xttPXqaB_PeMO9HyHUFZVVxfQuagSqB8wZdTCdkUulaFULW8vSoGyXYObmIcQsgckZOyOIOv7D34w6HRH1HP2zCQN_t6ANdBTvELBJ9xbiJyQ4O6UvwyTvfUzus6Wyw_T6vLslZZ_uIV8c5JW_3i9X8sVg-PzzNZ8vCMSZSsebguFXC1W3DlG6kcqx2nQYJ2dAy1DVgVysBAhGlljb7uEVQrGl1bjIl5eGuCz7GgJ0Zw2Znw95UYH4gmF8I5g9CDtwcAhs_mq3_DPnh-J_5G7QEXZg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Development of Water Vapor Transport Resistance Protocol and Analysis</title><source>HEAL-Link subscriptions: Institute of Physics (IOP) Journals</source><source>Institute of Physics Journals</source><creator>Redmond, Erin L. ; Hansen, Kentaro U. ; Berg, David W.</creator><creatorcontrib>Redmond, Erin L. ; Hansen, Kentaro U. ; Berg, David W.</creatorcontrib><description>Methodology for a robust water vapor transport protocol is discussed. Transport across the membrane was driven by a water activity gradient for a range of relative humidity conditions at 95°C. An Evaluating the Measurement Process study demonstrated the ability to detect a difference in total resistance greater than 0.003 ±0.0001 cm2-s/µmol, with 90% power and 95% confidence. Electrodes used in this study increased transport resistance when applied to ePTFE reinforced membranes 10 µm or less. The resistance of a series of cast films of varying thickness were measured under hydrogen and nitrogen to isolate the interfacial and gas-phase contributions to the total resistance. The interfacial effect is not statistically significant as measured in this study.</description><identifier>ISSN: 1938-5862</identifier><identifier>ISSN: 1938-6737</identifier><identifier>EISSN: 1938-6737</identifier><identifier>EISSN: 1938-5862</identifier><identifier>DOI: 10.1149/09208.0445ecst</identifier><language>eng</language><publisher>The Electrochemical Society, Inc</publisher><ispartof>ECS transactions, 2019-07, Vol.92 (8), p.445-454</ispartof><rights>2019 ECS - The Electrochemical Society</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c226t-d40c4a86c3b5289578c23cf9070c22b2e930ef38606eee797ab524ae0825b9673</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.1149/09208.0445ecst/pdf$$EPDF$$P50$$Giop$$H</linktopdf><link.rule.ids>314,776,780,27903,27904,53824,53871</link.rule.ids></links><search><creatorcontrib>Redmond, Erin L.</creatorcontrib><creatorcontrib>Hansen, Kentaro U.</creatorcontrib><creatorcontrib>Berg, David W.</creatorcontrib><title>Development of Water Vapor Transport Resistance Protocol and Analysis</title><title>ECS transactions</title><addtitle>ECS Trans</addtitle><description>Methodology for a robust water vapor transport protocol is discussed. Transport across the membrane was driven by a water activity gradient for a range of relative humidity conditions at 95°C. An Evaluating the Measurement Process study demonstrated the ability to detect a difference in total resistance greater than 0.003 ±0.0001 cm2-s/µmol, with 90% power and 95% confidence. Electrodes used in this study increased transport resistance when applied to ePTFE reinforced membranes 10 µm or less. The resistance of a series of cast films of varying thickness were measured under hydrogen and nitrogen to isolate the interfacial and gas-phase contributions to the total resistance. The interfacial effect is not statistically significant as measured in this study.</description><issn>1938-5862</issn><issn>1938-6737</issn><issn>1938-6737</issn><issn>1938-5862</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNp1kM1LAzEQxYMoWKtXzzkLu85ms_k4llo_oKBI1WPIprPQst0sSRT63xttPXqaB_PeMO9HyHUFZVVxfQuagSqB8wZdTCdkUulaFULW8vSoGyXYObmIcQsgckZOyOIOv7D34w6HRH1HP2zCQN_t6ANdBTvELBJ9xbiJyQ4O6UvwyTvfUzus6Wyw_T6vLslZZ_uIV8c5JW_3i9X8sVg-PzzNZ8vCMSZSsebguFXC1W3DlG6kcqx2nQYJ2dAy1DVgVysBAhGlljb7uEVQrGl1bjIl5eGuCz7GgJ0Zw2Znw95UYH4gmF8I5g9CDtwcAhs_mq3_DPnh-J_5G7QEXZg</recordid><startdate>20190703</startdate><enddate>20190703</enddate><creator>Redmond, Erin L.</creator><creator>Hansen, Kentaro U.</creator><creator>Berg, David W.</creator><general>The Electrochemical Society, Inc</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20190703</creationdate><title>Development of Water Vapor Transport Resistance Protocol and Analysis</title><author>Redmond, Erin L. ; Hansen, Kentaro U. ; Berg, David W.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c226t-d40c4a86c3b5289578c23cf9070c22b2e930ef38606eee797ab524ae0825b9673</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Redmond, Erin L.</creatorcontrib><creatorcontrib>Hansen, Kentaro U.</creatorcontrib><creatorcontrib>Berg, David W.</creatorcontrib><collection>CrossRef</collection><jtitle>ECS transactions</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Redmond, Erin L.</au><au>Hansen, Kentaro U.</au><au>Berg, David W.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Development of Water Vapor Transport Resistance Protocol and Analysis</atitle><jtitle>ECS transactions</jtitle><addtitle>ECS Trans</addtitle><date>2019-07-03</date><risdate>2019</risdate><volume>92</volume><issue>8</issue><spage>445</spage><epage>454</epage><pages>445-454</pages><issn>1938-5862</issn><issn>1938-6737</issn><eissn>1938-6737</eissn><eissn>1938-5862</eissn><abstract>Methodology for a robust water vapor transport protocol is discussed. Transport across the membrane was driven by a water activity gradient for a range of relative humidity conditions at 95°C. An Evaluating the Measurement Process study demonstrated the ability to detect a difference in total resistance greater than 0.003 ±0.0001 cm2-s/µmol, with 90% power and 95% confidence. Electrodes used in this study increased transport resistance when applied to ePTFE reinforced membranes 10 µm or less. The resistance of a series of cast films of varying thickness were measured under hydrogen and nitrogen to isolate the interfacial and gas-phase contributions to the total resistance. The interfacial effect is not statistically significant as measured in this study.</abstract><pub>The Electrochemical Society, Inc</pub><doi>10.1149/09208.0445ecst</doi><tpages>10</tpages></addata></record>
fulltext fulltext
identifier ISSN: 1938-5862
ispartof ECS transactions, 2019-07, Vol.92 (8), p.445-454
issn 1938-5862
1938-6737
1938-6737
1938-5862
language eng
recordid cdi_iop_journals_10_1149_09208_0445ecst
source HEAL-Link subscriptions: Institute of Physics (IOP) Journals; Institute of Physics Journals
title Development of Water Vapor Transport Resistance Protocol and Analysis
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-24T21%3A17%3A22IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-iop_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Development%20of%20Water%20Vapor%20Transport%20Resistance%20Protocol%20and%20Analysis&rft.jtitle=ECS%20transactions&rft.au=Redmond,%20Erin%20L.&rft.date=2019-07-03&rft.volume=92&rft.issue=8&rft.spage=445&rft.epage=454&rft.pages=445-454&rft.issn=1938-5862&rft.eissn=1938-6737&rft_id=info:doi/10.1149/09208.0445ecst&rft_dat=%3Ciop_cross%3E10.1149/09208.0445ecst%3C/iop_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true