Simple Aqueous Solution Route for Fabrication High Performance Oxide TFT
Metal oxide semiconductor attracts considerable attentions for driving circuit of next generation displays and energy devices owing to their simultaneous transparency and high electrical performance. We report fluorine doped zinc tin oxide (ZTO:F) and indium zinc oxide (IZO) thin-film transistors (T...
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creator | Bae, Byeong-Soo Hwang, Young Hwan Seo, Jin-Suk Choi, Gwang-Mun |
description | Metal oxide semiconductor attracts considerable attentions for driving circuit of next generation displays and energy devices owing to their simultaneous transparency and high electrical performance. We report fluorine doped zinc tin oxide (ZTO:F) and indium zinc oxide (IZO) thin-film transistors (TFT) via aqueous route. The aqueous route enables the fabrication of oxide TFT at low temperature with reasonable cost. The ZTO:F TFT exhibits good electrical performance and stability over electrical stress due to the effective removal of oxygen vacancy and generation of carrier by F doping. The IZO TFTs also shows good performance in terms of mobility and operation accuracy. Finally, the optimized IZO TFT is fabricated on plastic substrate with 250 ℃ annealing and the device exhibits sufficient performance for operation of various displays and basic circuitries. |
doi_str_mv | 10.1149/05008.0101ecst |
format | Conference Proceeding |
fullrecord | <record><control><sourceid>iop_cross</sourceid><recordid>TN_cdi_iop_journals_10_1149_05008_0101ecst</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10.1149/05008.0101ecst</sourcerecordid><originalsourceid>FETCH-LOGICAL-c274t-9a007627ec0406939c4744a7dd3523fe590a70b38caa1174dee5aa2dd2caada83</originalsourceid><addsrcrecordid>eNp1kEFLAzEQRoMoWKtXzzkLWyeb7Gb3WIp1hULF1vMyTWY1pW1qsgv677u29ehphsf3huFj7F7ASAhVPkIGUIxAgCAT2ws2EKUsklxLfXnesyJPr9lNjGuAvHf0gFULt91viI-_OvJd5Au_6Vrnd_zNdy3xxgc-xVVwBo-0ch-f_JVCz7e4M8Tn384SX06Xt-yqwU2ku_Mcsvfp03JSJbP588tkPEtMqlWblAig81STAQV5KUujtFKorZVZKhvKSkANK1kYRCG0skQZYmpt2gOLhRyy0emuCT7GQE29D26L4acWUP_2UB97qP966IWHk-D8vl77Luz69_4LHwCH7V6H</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Simple Aqueous Solution Route for Fabrication High Performance Oxide TFT</title><source>IOP Publishing Journals</source><source>Institute of Physics (IOP) Journals - HEAL-Link</source><creator>Bae, Byeong-Soo ; Hwang, Young Hwan ; Seo, Jin-Suk ; Choi, Gwang-Mun</creator><creatorcontrib>Bae, Byeong-Soo ; Hwang, Young Hwan ; Seo, Jin-Suk ; Choi, Gwang-Mun</creatorcontrib><description>Metal oxide semiconductor attracts considerable attentions for driving circuit of next generation displays and energy devices owing to their simultaneous transparency and high electrical performance. We report fluorine doped zinc tin oxide (ZTO:F) and indium zinc oxide (IZO) thin-film transistors (TFT) via aqueous route. The aqueous route enables the fabrication of oxide TFT at low temperature with reasonable cost. The ZTO:F TFT exhibits good electrical performance and stability over electrical stress due to the effective removal of oxygen vacancy and generation of carrier by F doping. The IZO TFTs also shows good performance in terms of mobility and operation accuracy. Finally, the optimized IZO TFT is fabricated on plastic substrate with 250 ℃ annealing and the device exhibits sufficient performance for operation of various displays and basic circuitries.</description><identifier>ISSN: 1938-5862</identifier><identifier>EISSN: 1938-6737</identifier><identifier>DOI: 10.1149/05008.0101ecst</identifier><language>eng</language><publisher>The Electrochemical Society, Inc</publisher><ispartof>ECS transactions, 2013, Vol.50 (8), p.101-106</ispartof><rights>2012 ECS - The Electrochemical Society</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c274t-9a007627ec0406939c4744a7dd3523fe590a70b38caa1174dee5aa2dd2caada83</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.1149/05008.0101ecst/pdf$$EPDF$$P50$$Giop$$H</linktopdf><link.rule.ids>314,776,780,27901,27902,53821,53868</link.rule.ids></links><search><creatorcontrib>Bae, Byeong-Soo</creatorcontrib><creatorcontrib>Hwang, Young Hwan</creatorcontrib><creatorcontrib>Seo, Jin-Suk</creatorcontrib><creatorcontrib>Choi, Gwang-Mun</creatorcontrib><title>Simple Aqueous Solution Route for Fabrication High Performance Oxide TFT</title><title>ECS transactions</title><addtitle>ECS Trans</addtitle><description>Metal oxide semiconductor attracts considerable attentions for driving circuit of next generation displays and energy devices owing to their simultaneous transparency and high electrical performance. We report fluorine doped zinc tin oxide (ZTO:F) and indium zinc oxide (IZO) thin-film transistors (TFT) via aqueous route. The aqueous route enables the fabrication of oxide TFT at low temperature with reasonable cost. The ZTO:F TFT exhibits good electrical performance and stability over electrical stress due to the effective removal of oxygen vacancy and generation of carrier by F doping. The IZO TFTs also shows good performance in terms of mobility and operation accuracy. Finally, the optimized IZO TFT is fabricated on plastic substrate with 250 ℃ annealing and the device exhibits sufficient performance for operation of various displays and basic circuitries.</description><issn>1938-5862</issn><issn>1938-6737</issn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2013</creationdate><recordtype>conference_proceeding</recordtype><recordid>eNp1kEFLAzEQRoMoWKtXzzkLWyeb7Gb3WIp1hULF1vMyTWY1pW1qsgv677u29ehphsf3huFj7F7ASAhVPkIGUIxAgCAT2ws2EKUsklxLfXnesyJPr9lNjGuAvHf0gFULt91viI-_OvJd5Au_6Vrnd_zNdy3xxgc-xVVwBo-0ch-f_JVCz7e4M8Tn384SX06Xt-yqwU2ku_Mcsvfp03JSJbP588tkPEtMqlWblAig81STAQV5KUujtFKorZVZKhvKSkANK1kYRCG0skQZYmpt2gOLhRyy0emuCT7GQE29D26L4acWUP_2UB97qP966IWHk-D8vl77Luz69_4LHwCH7V6H</recordid><startdate>20130315</startdate><enddate>20130315</enddate><creator>Bae, Byeong-Soo</creator><creator>Hwang, Young Hwan</creator><creator>Seo, Jin-Suk</creator><creator>Choi, Gwang-Mun</creator><general>The Electrochemical Society, Inc</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20130315</creationdate><title>Simple Aqueous Solution Route for Fabrication High Performance Oxide TFT</title><author>Bae, Byeong-Soo ; Hwang, Young Hwan ; Seo, Jin-Suk ; Choi, Gwang-Mun</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c274t-9a007627ec0406939c4744a7dd3523fe590a70b38caa1174dee5aa2dd2caada83</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2013</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Bae, Byeong-Soo</creatorcontrib><creatorcontrib>Hwang, Young Hwan</creatorcontrib><creatorcontrib>Seo, Jin-Suk</creatorcontrib><creatorcontrib>Choi, Gwang-Mun</creatorcontrib><collection>CrossRef</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Bae, Byeong-Soo</au><au>Hwang, Young Hwan</au><au>Seo, Jin-Suk</au><au>Choi, Gwang-Mun</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Simple Aqueous Solution Route for Fabrication High Performance Oxide TFT</atitle><btitle>ECS transactions</btitle><addtitle>ECS Trans</addtitle><date>2013-03-15</date><risdate>2013</risdate><volume>50</volume><issue>8</issue><spage>101</spage><epage>106</epage><pages>101-106</pages><issn>1938-5862</issn><eissn>1938-6737</eissn><abstract>Metal oxide semiconductor attracts considerable attentions for driving circuit of next generation displays and energy devices owing to their simultaneous transparency and high electrical performance. We report fluorine doped zinc tin oxide (ZTO:F) and indium zinc oxide (IZO) thin-film transistors (TFT) via aqueous route. The aqueous route enables the fabrication of oxide TFT at low temperature with reasonable cost. The ZTO:F TFT exhibits good electrical performance and stability over electrical stress due to the effective removal of oxygen vacancy and generation of carrier by F doping. The IZO TFTs also shows good performance in terms of mobility and operation accuracy. Finally, the optimized IZO TFT is fabricated on plastic substrate with 250 ℃ annealing and the device exhibits sufficient performance for operation of various displays and basic circuitries.</abstract><pub>The Electrochemical Society, Inc</pub><doi>10.1149/05008.0101ecst</doi><tpages>6</tpages></addata></record> |
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source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
title | Simple Aqueous Solution Route for Fabrication High Performance Oxide TFT |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-29T23%3A50%3A41IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-iop_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Simple%20Aqueous%20Solution%20Route%20for%20Fabrication%20High%20Performance%20Oxide%20TFT&rft.btitle=ECS%20transactions&rft.au=Bae,%20Byeong-Soo&rft.date=2013-03-15&rft.volume=50&rft.issue=8&rft.spage=101&rft.epage=106&rft.pages=101-106&rft.issn=1938-5862&rft.eissn=1938-6737&rft_id=info:doi/10.1149/05008.0101ecst&rft_dat=%3Ciop_cross%3E10.1149/05008.0101ecst%3C/iop_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |