Activation of two dopants, Bi and Er in δ-doped layer in Si crystal
Conventional doping processes are no longer viable for realizing extreme structures, such as a δ -doped layer with multiple elements, such as the heavy Bi, within the silicon crystal. Here, we demonstrate the formation of (Bi + Er)- δ -doped layer based on surface nanostructures, i.e. Bi nanolines,...
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Veröffentlicht in: | Nano futures 2021-12, Vol.5 (4), p.45005 |
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creator | Murata, Koichi Yagi, Shuhei Kanazawa, Takashi Tsubomatsu, Satoshi Kirkham, Christopher Nittoh, Koh-ichi Bowler, David R Miki, Kazushi |
description | Conventional doping processes are no longer viable for realizing extreme structures, such as a
δ
-doped layer with multiple elements, such as the heavy Bi, within the silicon crystal. Here, we demonstrate the formation of (Bi + Er)-
δ
-doped layer based on surface nanostructures, i.e. Bi nanolines, as the dopant source by molecular beam epitaxy. The concentration of both Er and Bi dopants is controlled by adjusting the amount of deposited Er atoms, the growth temperature during Si capping and surfactant techniques. Subsequent post-annealing processing is essential in this doping technique to obtain activated dopants in the
δ
-doped layer. Electric transport measurement and photoluminescence study revealed that both Bi and Er dopants were activated after post-annealing at moderate temperature. |
doi_str_mv | 10.1088/2399-1984/ac421d |
format | Article |
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δ
-doped layer with multiple elements, such as the heavy Bi, within the silicon crystal. Here, we demonstrate the formation of (Bi + Er)-
δ
-doped layer based on surface nanostructures, i.e. Bi nanolines, as the dopant source by molecular beam epitaxy. The concentration of both Er and Bi dopants is controlled by adjusting the amount of deposited Er atoms, the growth temperature during Si capping and surfactant techniques. Subsequent post-annealing processing is essential in this doping technique to obtain activated dopants in the
δ
-doped layer. Electric transport measurement and photoluminescence study revealed that both Bi and Er dopants were activated after post-annealing at moderate temperature.</description><identifier>ISSN: 2399-1984</identifier><identifier>EISSN: 2399-1984</identifier><identifier>DOI: 10.1088/2399-1984/ac421d</identifier><identifier>CODEN: NFAUB3</identifier><language>eng</language><publisher>IOP Publishing</publisher><subject>doping ; epitaxial growth ; MBE</subject><ispartof>Nano futures, 2021-12, Vol.5 (4), p.45005</ispartof><rights>2022 IOP Publishing Ltd</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c196t-b869ec435908346fa068ad0fe298b355cd51c92b5bd31e540ef84deaeb824c423</cites><orcidid>0000-0002-4655-7379 ; 0000-0003-1990-2621 ; 0000-0001-7853-1520</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.1088/2399-1984/ac421d/pdf$$EPDF$$P50$$Giop$$H</linktopdf><link.rule.ids>314,777,781,27905,27906,53827,53874</link.rule.ids></links><search><creatorcontrib>Murata, Koichi</creatorcontrib><creatorcontrib>Yagi, Shuhei</creatorcontrib><creatorcontrib>Kanazawa, Takashi</creatorcontrib><creatorcontrib>Tsubomatsu, Satoshi</creatorcontrib><creatorcontrib>Kirkham, Christopher</creatorcontrib><creatorcontrib>Nittoh, Koh-ichi</creatorcontrib><creatorcontrib>Bowler, David R</creatorcontrib><creatorcontrib>Miki, Kazushi</creatorcontrib><title>Activation of two dopants, Bi and Er in δ-doped layer in Si crystal</title><title>Nano futures</title><addtitle>NANOF</addtitle><addtitle>Nano Futures</addtitle><description>Conventional doping processes are no longer viable for realizing extreme structures, such as a
δ
-doped layer with multiple elements, such as the heavy Bi, within the silicon crystal. Here, we demonstrate the formation of (Bi + Er)-
δ
-doped layer based on surface nanostructures, i.e. Bi nanolines, as the dopant source by molecular beam epitaxy. The concentration of both Er and Bi dopants is controlled by adjusting the amount of deposited Er atoms, the growth temperature during Si capping and surfactant techniques. Subsequent post-annealing processing is essential in this doping technique to obtain activated dopants in the
δ
-doped layer. Electric transport measurement and photoluminescence study revealed that both Bi and Er dopants were activated after post-annealing at moderate temperature.</description><subject>doping</subject><subject>epitaxial growth</subject><subject>MBE</subject><issn>2399-1984</issn><issn>2399-1984</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><recordid>eNp9UE1LAzEUDKJgqb17zNFD175skiU51lqrUPCgnkM2H5BSkyVZlf4vf4e_ya0V8SCe3mPezGNmEDoncElAiFlNpayIFGymDauJPUKjH-j4136KJqVsAIAIDrxhI3Q9N3141X1IESeP-7eEbep07MsUXwWso8XLjEPEH-_VcHAWb_XOfSEPAZu8K73enqETr7fFTb7nGD3dLB8Xt9X6fnW3mK8rQ2TTV61opDOMcgmCssZraIS24F0tRUs5N5YTI-uWt5YSxxk4L5h12rWiZkMuOkZw-GtyKiU7r7ocnnXeKQJqX4TaJ1X7pOpQxCCZHiQhdWqTXnIcDP5Hv_iDHnVMXnHFFDAOwFVnPf0ENKpsOw</recordid><startdate>202112</startdate><enddate>202112</enddate><creator>Murata, Koichi</creator><creator>Yagi, Shuhei</creator><creator>Kanazawa, Takashi</creator><creator>Tsubomatsu, Satoshi</creator><creator>Kirkham, Christopher</creator><creator>Nittoh, Koh-ichi</creator><creator>Bowler, David R</creator><creator>Miki, Kazushi</creator><general>IOP Publishing</general><scope>AAYXX</scope><scope>CITATION</scope><orcidid>https://orcid.org/0000-0002-4655-7379</orcidid><orcidid>https://orcid.org/0000-0003-1990-2621</orcidid><orcidid>https://orcid.org/0000-0001-7853-1520</orcidid></search><sort><creationdate>202112</creationdate><title>Activation of two dopants, Bi and Er in δ-doped layer in Si crystal</title><author>Murata, Koichi ; Yagi, Shuhei ; Kanazawa, Takashi ; Tsubomatsu, Satoshi ; Kirkham, Christopher ; Nittoh, Koh-ichi ; Bowler, David R ; Miki, Kazushi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c196t-b869ec435908346fa068ad0fe298b355cd51c92b5bd31e540ef84deaeb824c423</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>doping</topic><topic>epitaxial growth</topic><topic>MBE</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Murata, Koichi</creatorcontrib><creatorcontrib>Yagi, Shuhei</creatorcontrib><creatorcontrib>Kanazawa, Takashi</creatorcontrib><creatorcontrib>Tsubomatsu, Satoshi</creatorcontrib><creatorcontrib>Kirkham, Christopher</creatorcontrib><creatorcontrib>Nittoh, Koh-ichi</creatorcontrib><creatorcontrib>Bowler, David R</creatorcontrib><creatorcontrib>Miki, Kazushi</creatorcontrib><collection>CrossRef</collection><jtitle>Nano futures</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Murata, Koichi</au><au>Yagi, Shuhei</au><au>Kanazawa, Takashi</au><au>Tsubomatsu, Satoshi</au><au>Kirkham, Christopher</au><au>Nittoh, Koh-ichi</au><au>Bowler, David R</au><au>Miki, Kazushi</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Activation of two dopants, Bi and Er in δ-doped layer in Si crystal</atitle><jtitle>Nano futures</jtitle><stitle>NANOF</stitle><addtitle>Nano Futures</addtitle><date>2021-12</date><risdate>2021</risdate><volume>5</volume><issue>4</issue><spage>45005</spage><pages>45005-</pages><issn>2399-1984</issn><eissn>2399-1984</eissn><coden>NFAUB3</coden><abstract>Conventional doping processes are no longer viable for realizing extreme structures, such as a
δ
-doped layer with multiple elements, such as the heavy Bi, within the silicon crystal. Here, we demonstrate the formation of (Bi + Er)-
δ
-doped layer based on surface nanostructures, i.e. Bi nanolines, as the dopant source by molecular beam epitaxy. The concentration of both Er and Bi dopants is controlled by adjusting the amount of deposited Er atoms, the growth temperature during Si capping and surfactant techniques. Subsequent post-annealing processing is essential in this doping technique to obtain activated dopants in the
δ
-doped layer. Electric transport measurement and photoluminescence study revealed that both Bi and Er dopants were activated after post-annealing at moderate temperature.</abstract><pub>IOP Publishing</pub><doi>10.1088/2399-1984/ac421d</doi><tpages>11</tpages><orcidid>https://orcid.org/0000-0002-4655-7379</orcidid><orcidid>https://orcid.org/0000-0003-1990-2621</orcidid><orcidid>https://orcid.org/0000-0001-7853-1520</orcidid></addata></record> |
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source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
subjects | doping epitaxial growth MBE |
title | Activation of two dopants, Bi and Er in δ-doped layer in Si crystal |
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