Picometer-precision few-tilt ptychotomography of 2D materials

From ripples to defects, edges and grain boundaries, the 3D atomic structure of 2D materials is critical to their properties. However the damage inflicted by conventional 3D analysis precludes its use with fragile 2D materials, particularly for the analysis of local defects. Here we dramatically inc...

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Veröffentlicht in:	2d materials 2023-07, Vol.10 (3), p.35029
Hauptverfasser:	Hofer, Christoph, Mustonen, Kimmo, Skákalová, Viera, Pennycook, Timothy J
Format:	Artikel
Sprache:	eng
Schlagworte:	2D materials 3D reconstruction ptychography scanning transmission electron microscopy
Online-Zugang:	Volltext
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