Determination of SiO2 and C layers on a monocrystalline silicon sphere by reference-free x-ray fluorescence analysis

The redefinition of the kilogram will be based on Planck's constant, which can be calculated from Avogadro's constant, and hence by 'counting' the silicon atoms in a monocrystalline 28Si sphere weighing one kilogram. To reduce the influence of the surface layers on the determined...

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Veröffentlicht in:	Metrologia 2017-06, Vol.54 (4), p.481-486
Hauptverfasser:	Hönicke, Philipp, Holfelder, Ina, Kolbe, Michael, Lubeck, Janin, Pollakowski-Herrmann, Beatrix, Unterumsberger, Rainer, Weser, Jan, Beckhoff, Burkhard
Format:	Artikel
Sprache:	eng
Schlagworte:	Avogadro constant physical traceability reference-free methodology silicon sphere x-ray spectrometry
Online-Zugang:	Volltext
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