Effect of post-annealing on the pinning properties of GdBa2Cu3O7-δ coated conductors prepared by RCE-DR
The pinning properties of GdBa2Cu3O7-δ (GdBCO) films fabricated by the reactive co-evaporation deposition and reaction (RCE-DR) process were very sensitive to the post-annealing temperature in a reduced oxygen atmosphere. For this study, as-grown GdBCO coated conductors (CCs) were post-annealed at t...
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description | The pinning properties of GdBa2Cu3O7-δ (GdBCO) films fabricated by the reactive co-evaporation deposition and reaction (RCE-DR) process were very sensitive to the post-annealing temperature in a reduced oxygen atmosphere. For this study, as-grown GdBCO coated conductors (CCs) were post-annealed at the temperatures ranging from 450 to 750 °C in the oxygen pressure (PO2) of 300 mTorr, and subsequently oxygenated at 500 °C for 1 h in pure oxygen gas atmosphere. Compared with the pristine sample, samples post-annealed at the temperature region of 450 °C-600 °C for 1 h possessed higher stacking fault (SF) density and also included the GdBa2Cu4O8 (Gd124) phase while samples post-annealed at 650 °C for 1 h and 750 °C for 5 min showed lower SF density. The HAADF-STEM analyses on the sample post-annealed at 500 °C revealed that the Gd124 phase mainly existed near the CuO phase. At the temperature region of 50-77 K, while the minimum in-field critical current densities (Jc,min) of as-grown GdBCO CC were enhanced in relatively higher fields after post-annealing at 750 °C due to reduced SF density, both Jcab and Jc,min values were increased after post-annealing at 500 °C in relatively lower fields due to both increased SF density and the formation of Gd124. |
doi_str_mv | 10.1088/1361-6668/ab9aa1 |
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For this study, as-grown GdBCO coated conductors (CCs) were post-annealed at the temperatures ranging from 450 to 750 °C in the oxygen pressure (PO2) of 300 mTorr, and subsequently oxygenated at 500 °C for 1 h in pure oxygen gas atmosphere. Compared with the pristine sample, samples post-annealed at the temperature region of 450 °C-600 °C for 1 h possessed higher stacking fault (SF) density and also included the GdBa2Cu4O8 (Gd124) phase while samples post-annealed at 650 °C for 1 h and 750 °C for 5 min showed lower SF density. The HAADF-STEM analyses on the sample post-annealed at 500 °C revealed that the Gd124 phase mainly existed near the CuO phase. At the temperature region of 50-77 K, while the minimum in-field critical current densities (Jc,min) of as-grown GdBCO CC were enhanced in relatively higher fields after post-annealing at 750 °C due to reduced SF density, both Jcab and Jc,min values were increased after post-annealing at 500 °C in relatively lower fields due to both increased SF density and the formation of Gd124.</description><identifier>ISSN: 0953-2048</identifier><identifier>EISSN: 1361-6668</identifier><identifier>DOI: 10.1088/1361-6668/ab9aa1</identifier><identifier>CODEN: SUSTEF</identifier><language>eng</language><publisher>IOP Publishing</publisher><subject>critical current density ; flux pinning ; GdBa ; GdBCO ; Post-annealing process ; Reactive Co-evaporation Deposition and Reaction (RCE-DR) ; stacking fault (SF)</subject><ispartof>Superconductor science & technology, 2020-08, Vol.33 (8)</ispartof><rights>2020 IOP Publishing Ltd</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><orcidid>0000-0002-6736-4672 ; 0000-0002-1567-5305</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.1088/1361-6668/ab9aa1/pdf$$EPDF$$P50$$Giop$$H</linktopdf><link.rule.ids>314,776,780,27903,27904,53824,53871</link.rule.ids></links><search><creatorcontrib>Oh, Won-Jae</creatorcontrib><creatorcontrib>Park, Insung</creatorcontrib><creatorcontrib>Chung, Kookchae</creatorcontrib><creatorcontrib>Lee, Jae-Hun</creatorcontrib><creatorcontrib>Moon, Seung-Hyun</creatorcontrib><creatorcontrib>Yoo, Sang-Im</creatorcontrib><title>Effect of post-annealing on the pinning properties of GdBa2Cu3O7-δ coated conductors prepared by RCE-DR</title><title>Superconductor science & technology</title><addtitle>SUST</addtitle><addtitle>Supercond. Sci. Technol</addtitle><description>The pinning properties of GdBa2Cu3O7-δ (GdBCO) films fabricated by the reactive co-evaporation deposition and reaction (RCE-DR) process were very sensitive to the post-annealing temperature in a reduced oxygen atmosphere. For this study, as-grown GdBCO coated conductors (CCs) were post-annealed at the temperatures ranging from 450 to 750 °C in the oxygen pressure (PO2) of 300 mTorr, and subsequently oxygenated at 500 °C for 1 h in pure oxygen gas atmosphere. Compared with the pristine sample, samples post-annealed at the temperature region of 450 °C-600 °C for 1 h possessed higher stacking fault (SF) density and also included the GdBa2Cu4O8 (Gd124) phase while samples post-annealed at 650 °C for 1 h and 750 °C for 5 min showed lower SF density. The HAADF-STEM analyses on the sample post-annealed at 500 °C revealed that the Gd124 phase mainly existed near the CuO phase. At the temperature region of 50-77 K, while the minimum in-field critical current densities (Jc,min) of as-grown GdBCO CC were enhanced in relatively higher fields after post-annealing at 750 °C due to reduced SF density, both Jcab and Jc,min values were increased after post-annealing at 500 °C in relatively lower fields due to both increased SF density and the formation of Gd124.</description><subject>critical current density</subject><subject>flux pinning</subject><subject>GdBa</subject><subject>GdBCO</subject><subject>Post-annealing process</subject><subject>Reactive Co-evaporation Deposition and Reaction (RCE-DR)</subject><subject>stacking fault (SF)</subject><issn>0953-2048</issn><issn>1361-6668</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid/><recordid>eNptkL1OwzAURi0EEqWwM2ZkwPTaThxnhFAKUqVKFcyW4x-aqrKj2Bl4L56DZ2qiIiamT_fT0b26B6FbAg8EhFgQxgnmnIuFaiqlyBma_VXnaAZVwTCFXFyiqxj3AIQIRmdot3TO6pQFl3UhJqy8t-rQ-s8s-CztbNa13k9j14fO9qm1cWJX5knRemCbEv98ZzqoZM0Y3gw6hT6OtO1UP3bNV7atl_h5e40unDpEe_Obc_TxsnyvX_F6s3qrH9e4pbRImOauqoQgioLWvBGqyhXlZWF1qW1lxgcKRwTRACxviBJgSlOC1U2ROy4axebo_rS3DZ3ch6H34zVJQE6W5KRETkrkydKI3_2DxyEmyZgUEkQBUMrOOHYEnjFpZw</recordid><startdate>20200801</startdate><enddate>20200801</enddate><creator>Oh, Won-Jae</creator><creator>Park, Insung</creator><creator>Chung, Kookchae</creator><creator>Lee, Jae-Hun</creator><creator>Moon, Seung-Hyun</creator><creator>Yoo, Sang-Im</creator><general>IOP Publishing</general><scope/><orcidid>https://orcid.org/0000-0002-6736-4672</orcidid><orcidid>https://orcid.org/0000-0002-1567-5305</orcidid></search><sort><creationdate>20200801</creationdate><title>Effect of post-annealing on the pinning properties of GdBa2Cu3O7-δ coated conductors prepared by RCE-DR</title><author>Oh, Won-Jae ; Park, Insung ; Chung, Kookchae ; Lee, Jae-Hun ; Moon, Seung-Hyun ; Yoo, Sang-Im</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i225t-24f99881a20cc6b8a94a2675ec7ce9d0485f181c0034b1a80d7d70ecb54f68ba3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>critical current density</topic><topic>flux pinning</topic><topic>GdBa</topic><topic>GdBCO</topic><topic>Post-annealing process</topic><topic>Reactive Co-evaporation Deposition and Reaction (RCE-DR)</topic><topic>stacking fault (SF)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Oh, Won-Jae</creatorcontrib><creatorcontrib>Park, Insung</creatorcontrib><creatorcontrib>Chung, Kookchae</creatorcontrib><creatorcontrib>Lee, Jae-Hun</creatorcontrib><creatorcontrib>Moon, Seung-Hyun</creatorcontrib><creatorcontrib>Yoo, Sang-Im</creatorcontrib><jtitle>Superconductor science & technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Oh, Won-Jae</au><au>Park, Insung</au><au>Chung, Kookchae</au><au>Lee, Jae-Hun</au><au>Moon, Seung-Hyun</au><au>Yoo, Sang-Im</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Effect of post-annealing on the pinning properties of GdBa2Cu3O7-δ coated conductors prepared by RCE-DR</atitle><jtitle>Superconductor science & technology</jtitle><stitle>SUST</stitle><addtitle>Supercond. Sci. Technol</addtitle><date>2020-08-01</date><risdate>2020</risdate><volume>33</volume><issue>8</issue><issn>0953-2048</issn><eissn>1361-6668</eissn><coden>SUSTEF</coden><abstract>The pinning properties of GdBa2Cu3O7-δ (GdBCO) films fabricated by the reactive co-evaporation deposition and reaction (RCE-DR) process were very sensitive to the post-annealing temperature in a reduced oxygen atmosphere. For this study, as-grown GdBCO coated conductors (CCs) were post-annealed at the temperatures ranging from 450 to 750 °C in the oxygen pressure (PO2) of 300 mTorr, and subsequently oxygenated at 500 °C for 1 h in pure oxygen gas atmosphere. Compared with the pristine sample, samples post-annealed at the temperature region of 450 °C-600 °C for 1 h possessed higher stacking fault (SF) density and also included the GdBa2Cu4O8 (Gd124) phase while samples post-annealed at 650 °C for 1 h and 750 °C for 5 min showed lower SF density. The HAADF-STEM analyses on the sample post-annealed at 500 °C revealed that the Gd124 phase mainly existed near the CuO phase. At the temperature region of 50-77 K, while the minimum in-field critical current densities (Jc,min) of as-grown GdBCO CC were enhanced in relatively higher fields after post-annealing at 750 °C due to reduced SF density, both Jcab and Jc,min values were increased after post-annealing at 500 °C in relatively lower fields due to both increased SF density and the formation of Gd124.</abstract><pub>IOP Publishing</pub><doi>10.1088/1361-6668/ab9aa1</doi><tpages>11</tpages><orcidid>https://orcid.org/0000-0002-6736-4672</orcidid><orcidid>https://orcid.org/0000-0002-1567-5305</orcidid></addata></record> |
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subjects | critical current density flux pinning GdBa GdBCO Post-annealing process Reactive Co-evaporation Deposition and Reaction (RCE-DR) stacking fault (SF) |
title | Effect of post-annealing on the pinning properties of GdBa2Cu3O7-δ coated conductors prepared by RCE-DR |
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