Deep levels in metamorphic InAs/InGaAs quantum dot structures with different composition of the embedding layers

Deep levels in metamorphic InAs/InxGa1−xAs quantum dot (QD) structures are studied with deep level thermally stimulated conductivity (TSC), photoconductivity (PC) and photoluminescence (PL) spectroscopy and compared with data from pseudomorphic InGaAs/GaAs QDs investigated previously by the same tec...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Semiconductor science and technology 2017-12, Vol.32 (12), p.125001
Hauptverfasser: Golovynskyi, S, Datsenko, O, Seravalli, L, Kozak, O, Trevisi, G, Frigeri, P, Babichuk, I S, Golovynska, I, Qu, Junle
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!