The effect of a source-contacted light shield on the electrical characteristics of an LTPS TFT
The electrical characteristics of a low-temperature polycrystalline silicon thin-film transistor (TFT) with a source-contacted light shield (SCLS) are observed and analyzed. Compared with that of a conventional TFT without a light shield (LS), the on-current of the TFT with an SCLS is lower because...
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Veröffentlicht in: | Semiconductor science and technology 2017-08, Vol.32 (8), p.85001 |
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description | The electrical characteristics of a low-temperature polycrystalline silicon thin-film transistor (TFT) with a source-contacted light shield (SCLS) are observed and analyzed. Compared with that of a conventional TFT without a light shield (LS), the on-current of the TFT with an SCLS is lower because the SCLS blocks the fringing electric field from the drain to the active layer. Furthermore, the gate-to-source capacitance (Cgs) of the TFT with an SCLS in the off and saturation regions is higher than that of a conventional TFT, which is due to the gate-to-LS capacitance (Cg-LS). The electrical characteristics of the TFT with an SCLS are thoroughly investigated by two-dimensional device simulations, and a semi-empirical Cg-LS model for SPICE simulation is proposed and verified. |
doi_str_mv | 10.1088/1361-6641/aa7477 |
format | Article |
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Compared with that of a conventional TFT without a light shield (LS), the on-current of the TFT with an SCLS is lower because the SCLS blocks the fringing electric field from the drain to the active layer. Furthermore, the gate-to-source capacitance (Cgs) of the TFT with an SCLS in the off and saturation regions is higher than that of a conventional TFT, which is due to the gate-to-LS capacitance (Cg-LS). The electrical characteristics of the TFT with an SCLS are thoroughly investigated by two-dimensional device simulations, and a semi-empirical Cg-LS model for SPICE simulation is proposed and verified.</description><identifier>ISSN: 0268-1242</identifier><identifier>EISSN: 1361-6641</identifier><identifier>DOI: 10.1088/1361-6641/aa7477</identifier><identifier>CODEN: SSTEET</identifier><language>eng</language><publisher>IOP Publishing</publisher><subject>light shield ; low-temperature polycrystalline silicon (LTPS) ; SPICE simulation ; thin-film transistor (TFT)</subject><ispartof>Semiconductor science and technology, 2017-08, Vol.32 (8), p.85001</ispartof><rights>2017 IOP Publishing Ltd</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c312t-dd50636a627ac82ad48a8c98ef321bafa1251dd564ad8f44600da3a897952c453</citedby><cites>FETCH-LOGICAL-c312t-dd50636a627ac82ad48a8c98ef321bafa1251dd564ad8f44600da3a897952c453</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.1088/1361-6641/aa7477/pdf$$EPDF$$P50$$Giop$$H</linktopdf><link.rule.ids>314,777,781,27905,27906,53827,53874</link.rule.ids></links><search><creatorcontrib>Kim, Miryeon</creatorcontrib><creatorcontrib>Sun, Wookyung</creatorcontrib><creatorcontrib>Kang, Jongseuk</creatorcontrib><creatorcontrib>Shin, Hyungsoon</creatorcontrib><title>The effect of a source-contacted light shield on the electrical characteristics of an LTPS TFT</title><title>Semiconductor science and technology</title><addtitle>SST</addtitle><addtitle>Semicond. Sci. Technol</addtitle><description>The electrical characteristics of a low-temperature polycrystalline silicon thin-film transistor (TFT) with a source-contacted light shield (SCLS) are observed and analyzed. Compared with that of a conventional TFT without a light shield (LS), the on-current of the TFT with an SCLS is lower because the SCLS blocks the fringing electric field from the drain to the active layer. Furthermore, the gate-to-source capacitance (Cgs) of the TFT with an SCLS in the off and saturation regions is higher than that of a conventional TFT, which is due to the gate-to-LS capacitance (Cg-LS). The electrical characteristics of the TFT with an SCLS are thoroughly investigated by two-dimensional device simulations, and a semi-empirical Cg-LS model for SPICE simulation is proposed and verified.</description><subject>light shield</subject><subject>low-temperature polycrystalline silicon (LTPS)</subject><subject>SPICE simulation</subject><subject>thin-film transistor (TFT)</subject><issn>0268-1242</issn><issn>1361-6641</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><recordid>eNp1kE1LAzEQhoMoWKt3j7l5cW2-NpsepVgVCgquV8OYDzdl3S1JPPjvzVrxpKeB4XlfZh6Ezim5okSpBeWSVlIKugBoRNMcoNnv6hDNCJOqokywY3SS0pYQShUnM_TSdg47753JePQYcBo_onGVGYcMJjuL-_DWZZy64HqLxwHnKdAXPgYDPTYdxAmMIeVg0nfJgDft4xNu1-0pOvLQJ3f2M-foeX3Tru6qzcPt_ep6UxlOWa6srYnkEiRrwCgGVihQZqmc54y-ggfKalogKcAqL4QkxAIHtWyWNTOi5nNE9r0mjilF5_UuhneIn5oSPfnRkww9ydB7PyVysY-Ecae35euhHKhTypozrTRRdZGkd9YX8vIP8t_iL2fBczU</recordid><startdate>20170801</startdate><enddate>20170801</enddate><creator>Kim, Miryeon</creator><creator>Sun, Wookyung</creator><creator>Kang, Jongseuk</creator><creator>Shin, Hyungsoon</creator><general>IOP Publishing</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20170801</creationdate><title>The effect of a source-contacted light shield on the electrical characteristics of an LTPS TFT</title><author>Kim, Miryeon ; Sun, Wookyung ; Kang, Jongseuk ; Shin, Hyungsoon</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c312t-dd50636a627ac82ad48a8c98ef321bafa1251dd564ad8f44600da3a897952c453</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>light shield</topic><topic>low-temperature polycrystalline silicon (LTPS)</topic><topic>SPICE simulation</topic><topic>thin-film transistor (TFT)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kim, Miryeon</creatorcontrib><creatorcontrib>Sun, Wookyung</creatorcontrib><creatorcontrib>Kang, Jongseuk</creatorcontrib><creatorcontrib>Shin, Hyungsoon</creatorcontrib><collection>CrossRef</collection><jtitle>Semiconductor science and technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kim, Miryeon</au><au>Sun, Wookyung</au><au>Kang, Jongseuk</au><au>Shin, Hyungsoon</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The effect of a source-contacted light shield on the electrical characteristics of an LTPS TFT</atitle><jtitle>Semiconductor science and technology</jtitle><stitle>SST</stitle><addtitle>Semicond. Sci. Technol</addtitle><date>2017-08-01</date><risdate>2017</risdate><volume>32</volume><issue>8</issue><spage>85001</spage><pages>85001-</pages><issn>0268-1242</issn><eissn>1361-6641</eissn><coden>SSTEET</coden><abstract>The electrical characteristics of a low-temperature polycrystalline silicon thin-film transistor (TFT) with a source-contacted light shield (SCLS) are observed and analyzed. Compared with that of a conventional TFT without a light shield (LS), the on-current of the TFT with an SCLS is lower because the SCLS blocks the fringing electric field from the drain to the active layer. Furthermore, the gate-to-source capacitance (Cgs) of the TFT with an SCLS in the off and saturation regions is higher than that of a conventional TFT, which is due to the gate-to-LS capacitance (Cg-LS). The electrical characteristics of the TFT with an SCLS are thoroughly investigated by two-dimensional device simulations, and a semi-empirical Cg-LS model for SPICE simulation is proposed and verified.</abstract><pub>IOP Publishing</pub><doi>10.1088/1361-6641/aa7477</doi><tpages>8</tpages></addata></record> |
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subjects | light shield low-temperature polycrystalline silicon (LTPS) SPICE simulation thin-film transistor (TFT) |
title | The effect of a source-contacted light shield on the electrical characteristics of an LTPS TFT |
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