Kinetic modeling of interfacial abruptness in axial nanowire heterostructures

Kinetic modeling of the formation of axial III–V nanowire heterostructures grown by the Au-catalyzed vapor–liquid–solid method is presented. The method is based on a combination of kinetic growth theory for different binaries at the liquid–solid interface and thermodynamics of ternary liquid and sol...

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Veröffentlicht in:Nanotechnology 2023-02, Vol.34 (6), p.65602
Hauptverfasser: Leshchenko, E D, Dubrovskii, V G
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Dubrovskii, V G
description Kinetic modeling of the formation of axial III–V nanowire heterostructures grown by the Au-catalyzed vapor–liquid–solid method is presented. The method is based on a combination of kinetic growth theory for different binaries at the liquid–solid interface and thermodynamics of ternary liquid and solid alloys. Non-stationary treatment of the compositional change obtained by swapping material fluxes allows us to compute the interfacial abruptness across nanowire heterostructures and leads to the following results. At high enough supersaturation in liquid, there is no segregation of dissimilar binaries in solid even for materials with strong interactions between III and V pairs, such as InGaAs. This leads to the suppression of the miscibility gaps by kinetic factors. Increasing the Au concentration widens the heterointerface at low Au content and narrows it at high Au content in a catalyst droplet. The model fits quite well the data on the compositional profiles across nanowire heterostructures based on both group III and group V interchange. Very sharp heterointerfaces in double of InAs/InP/InAs nanowire heterostructures is explained by a reduced reservoir effect due to low solubility of group V elements in liquid.
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subjects axial nanowire heterostructures
III–V nanowires
interfacial abruptness
modeling
title Kinetic modeling of interfacial abruptness in axial nanowire heterostructures
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