Direct-write formation of integrated bottom contacts to laser-induced graphene-like carbon
We report a simple, scalable two-step method for direct-write laser fabrication of 3D, porous graphene-like carbon electrodes from polyimide films with integrated contact plugs to underlying metal layers (Au or Ni). Irradiation at high average CO 2 laser power (30 W) and low scan speed (∼18 mm s) −1...
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Veröffentlicht in: | Nanotechnology 2022-10, Vol.33 (40), p.405204 |
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creator | Murray, Richard O’Neill, Orla Vaughan, Eoghan Iacopino, Daniela Blake, Alan Lyons, Colin O’Connell, Dan O’Brien, Joe Quinn, Aidan J |
description | We report a simple, scalable two-step method for direct-write laser fabrication of 3D, porous graphene-like carbon electrodes from polyimide films with integrated contact plugs to underlying metal layers (Au or Ni). Irradiation at high average CO
2
laser power (30 W) and low scan speed (∼18 mm s)
−1
leads to formation of ‘keyhole’ contact plugs through local ablation of polyimide (initial thickness 17
μ
m) and graphitization of the plug perimeter wall. Top-surface laser-induced graphene (LIG) electrodes are then formed and connected to the plug by raster patterning at lower laser power (3.7 W) and higher scan speed (200 mm s)
−1
. Sheet resistance data (71 ± 15 Ω sq.)
−1
indicates formation of high-quality surface LIG, consistent with Raman data which yield sharp first- and second-order peaks. We have also demonstrated that high-quality LIG requires a minimum initial polyimide thickness. Capacitance data measured between surface LIG electrodes and the buried metal film indicate a polyimide layer of thickness ∼7
μ
m remaining following laser processing. By contrast, laser graphitization of polyimide of initial thickness ∼8
μ
m yielded devices with large sheet resistance (>1 kΩ sq.)
−1
. Raman data also indicated significant disorder. Plug contact resistance values were calculated from analysis of transfer line measurement data for single- and multi-plug test structures. Contacts to buried nickel layers yielded lower plug resistances (1-plug: 158 ± 7 Ω , 4-plug: 31 ± 14 Ω) compared to contacts to buried gold (1-plug: 346 ± 37 Ω , 4-plug: 52 ± 3 Ω). Further reductions are expected for multi-plug structures with increased areal density. Proof-of-concept mm-scale LIG electrochemical devices with local contact plugs yielded rapid electron transfer kinetics (rate constant
k
0
∼ 0.017 cm s
−1
), comparable to values measured for exposed Au films (
k
0
∼0.023 cm s)
−1
. Our results highlight the potential for integration of LIG-based sensor electrodes with semiconductor or roll-to-roll manufacturing. |
doi_str_mv | 10.1088/1361-6528/ac7c7b |
format | Article |
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2
laser power (30 W) and low scan speed (∼18 mm s)
−1
leads to formation of ‘keyhole’ contact plugs through local ablation of polyimide (initial thickness 17
μ
m) and graphitization of the plug perimeter wall. Top-surface laser-induced graphene (LIG) electrodes are then formed and connected to the plug by raster patterning at lower laser power (3.7 W) and higher scan speed (200 mm s)
−1
. Sheet resistance data (71 ± 15 Ω sq.)
−1
indicates formation of high-quality surface LIG, consistent with Raman data which yield sharp first- and second-order peaks. We have also demonstrated that high-quality LIG requires a minimum initial polyimide thickness. Capacitance data measured between surface LIG electrodes and the buried metal film indicate a polyimide layer of thickness ∼7
μ
m remaining following laser processing. By contrast, laser graphitization of polyimide of initial thickness ∼8
μ
m yielded devices with large sheet resistance (>1 kΩ sq.)
−1
. Raman data also indicated significant disorder. Plug contact resistance values were calculated from analysis of transfer line measurement data for single- and multi-plug test structures. Contacts to buried nickel layers yielded lower plug resistances (1-plug: 158 ± 7 Ω , 4-plug: 31 ± 14 Ω) compared to contacts to buried gold (1-plug: 346 ± 37 Ω , 4-plug: 52 ± 3 Ω). Further reductions are expected for multi-plug structures with increased areal density. Proof-of-concept mm-scale LIG electrochemical devices with local contact plugs yielded rapid electron transfer kinetics (rate constant
k
0
∼ 0.017 cm s
−1
), comparable to values measured for exposed Au films (
k
0
∼0.023 cm s)
−1
. Our results highlight the potential for integration of LIG-based sensor electrodes with semiconductor or roll-to-roll manufacturing.</description><identifier>ISSN: 0957-4484</identifier><identifier>EISSN: 1361-6528</identifier><identifier>DOI: 10.1088/1361-6528/ac7c7b</identifier><identifier>CODEN: NNOTER</identifier><language>eng</language><publisher>IOP Publishing</publisher><subject>additive manufacture ; contact resistance ; electrochemistry ; laser-induced graphene</subject><ispartof>Nanotechnology, 2022-10, Vol.33 (40), p.405204</ispartof><rights>2022 The Author(s). Published by IOP Publishing Ltd</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c389t-22d0d072d2fead08e7d548d772026937fbb37f1a621303a6932afb5469c30e053</citedby><cites>FETCH-LOGICAL-c389t-22d0d072d2fead08e7d548d772026937fbb37f1a621303a6932afb5469c30e053</cites><orcidid>0000-0002-0300-4141 ; 0000-0003-1618-0176 ; 0000-0001-7961-4459 ; 0000-0002-9524-0204 ; 0000-0002-9382-6981 ; 0000-0003-4021-9990 ; 0000-0003-0676-5111 ; 0000-0003-2301-9401</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.1088/1361-6528/ac7c7b/pdf$$EPDF$$P50$$Giop$$Hfree_for_read</linktopdf><link.rule.ids>314,780,784,27924,27925,53846,53893</link.rule.ids></links><search><creatorcontrib>Murray, Richard</creatorcontrib><creatorcontrib>O’Neill, Orla</creatorcontrib><creatorcontrib>Vaughan, Eoghan</creatorcontrib><creatorcontrib>Iacopino, Daniela</creatorcontrib><creatorcontrib>Blake, Alan</creatorcontrib><creatorcontrib>Lyons, Colin</creatorcontrib><creatorcontrib>O’Connell, Dan</creatorcontrib><creatorcontrib>O’Brien, Joe</creatorcontrib><creatorcontrib>Quinn, Aidan J</creatorcontrib><title>Direct-write formation of integrated bottom contacts to laser-induced graphene-like carbon</title><title>Nanotechnology</title><addtitle>NANO</addtitle><addtitle>Nanotechnology</addtitle><description>We report a simple, scalable two-step method for direct-write laser fabrication of 3D, porous graphene-like carbon electrodes from polyimide films with integrated contact plugs to underlying metal layers (Au or Ni). Irradiation at high average CO
2
laser power (30 W) and low scan speed (∼18 mm s)
−1
leads to formation of ‘keyhole’ contact plugs through local ablation of polyimide (initial thickness 17
μ
m) and graphitization of the plug perimeter wall. Top-surface laser-induced graphene (LIG) electrodes are then formed and connected to the plug by raster patterning at lower laser power (3.7 W) and higher scan speed (200 mm s)
−1
. Sheet resistance data (71 ± 15 Ω sq.)
−1
indicates formation of high-quality surface LIG, consistent with Raman data which yield sharp first- and second-order peaks. We have also demonstrated that high-quality LIG requires a minimum initial polyimide thickness. Capacitance data measured between surface LIG electrodes and the buried metal film indicate a polyimide layer of thickness ∼7
μ
m remaining following laser processing. By contrast, laser graphitization of polyimide of initial thickness ∼8
μ
m yielded devices with large sheet resistance (>1 kΩ sq.)
−1
. Raman data also indicated significant disorder. Plug contact resistance values were calculated from analysis of transfer line measurement data for single- and multi-plug test structures. Contacts to buried nickel layers yielded lower plug resistances (1-plug: 158 ± 7 Ω , 4-plug: 31 ± 14 Ω) compared to contacts to buried gold (1-plug: 346 ± 37 Ω , 4-plug: 52 ± 3 Ω). Further reductions are expected for multi-plug structures with increased areal density. Proof-of-concept mm-scale LIG electrochemical devices with local contact plugs yielded rapid electron transfer kinetics (rate constant
k
0
∼ 0.017 cm s
−1
), comparable to values measured for exposed Au films (
k
0
∼0.023 cm s)
−1
. Our results highlight the potential for integration of LIG-based sensor electrodes with semiconductor or roll-to-roll manufacturing.</description><subject>additive manufacture</subject><subject>contact resistance</subject><subject>electrochemistry</subject><subject>laser-induced graphene</subject><issn>0957-4484</issn><issn>1361-6528</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><sourceid>O3W</sourceid><recordid>eNp9kMtLxDAQh4MouK7ePfaoYN1J0kd6lPUJC1704iWkeWjWNqlJivjf26XiSYRhBn58MzAfQqcYLjEwtsK0wnlVErYSspZ1u4cWv9E-WkBT1nlRsOIQHcW4BcCYEbxAL9c2aJnyz2CTzowPvUjWu8ybzLqkX4NIWmWtT8n3mfQuCZlilnzWiahDbp0a5QRM3PCmnc47-64zKULr3TE6MKKL-uRnLtHz7c3T-j7fPN49rK82uaSsSTkhChTURBGjhQKma1UWTNU1AVI1tDZtOzUsKoIpUDFFRJi2LKpGUtBQ0iU6m-8OwX-MOibe2yh11wmn_Rg5qRghZVMRmFCYURl8jEEbPgTbi_DFMfCdRr5zxnfO-KxxWrmYV6wf-NaPwU2__Ief_4E74TynlBcwVUmg4IMy9BuaTIJr</recordid><startdate>20221001</startdate><enddate>20221001</enddate><creator>Murray, Richard</creator><creator>O’Neill, Orla</creator><creator>Vaughan, Eoghan</creator><creator>Iacopino, Daniela</creator><creator>Blake, Alan</creator><creator>Lyons, Colin</creator><creator>O’Connell, Dan</creator><creator>O’Brien, Joe</creator><creator>Quinn, Aidan J</creator><general>IOP Publishing</general><scope>O3W</scope><scope>TSCCA</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><orcidid>https://orcid.org/0000-0002-0300-4141</orcidid><orcidid>https://orcid.org/0000-0003-1618-0176</orcidid><orcidid>https://orcid.org/0000-0001-7961-4459</orcidid><orcidid>https://orcid.org/0000-0002-9524-0204</orcidid><orcidid>https://orcid.org/0000-0002-9382-6981</orcidid><orcidid>https://orcid.org/0000-0003-4021-9990</orcidid><orcidid>https://orcid.org/0000-0003-0676-5111</orcidid><orcidid>https://orcid.org/0000-0003-2301-9401</orcidid></search><sort><creationdate>20221001</creationdate><title>Direct-write formation of integrated bottom contacts to laser-induced graphene-like carbon</title><author>Murray, Richard ; O’Neill, Orla ; Vaughan, Eoghan ; Iacopino, Daniela ; Blake, Alan ; Lyons, Colin ; O’Connell, Dan ; O’Brien, Joe ; Quinn, Aidan J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c389t-22d0d072d2fead08e7d548d772026937fbb37f1a621303a6932afb5469c30e053</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>additive manufacture</topic><topic>contact resistance</topic><topic>electrochemistry</topic><topic>laser-induced graphene</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Murray, Richard</creatorcontrib><creatorcontrib>O’Neill, Orla</creatorcontrib><creatorcontrib>Vaughan, Eoghan</creatorcontrib><creatorcontrib>Iacopino, Daniela</creatorcontrib><creatorcontrib>Blake, Alan</creatorcontrib><creatorcontrib>Lyons, Colin</creatorcontrib><creatorcontrib>O’Connell, Dan</creatorcontrib><creatorcontrib>O’Brien, Joe</creatorcontrib><creatorcontrib>Quinn, Aidan J</creatorcontrib><collection>IOP Publishing (Open access)</collection><collection>IOPscience (Open Access)</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Nanotechnology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Murray, Richard</au><au>O’Neill, Orla</au><au>Vaughan, Eoghan</au><au>Iacopino, Daniela</au><au>Blake, Alan</au><au>Lyons, Colin</au><au>O’Connell, Dan</au><au>O’Brien, Joe</au><au>Quinn, Aidan J</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Direct-write formation of integrated bottom contacts to laser-induced graphene-like carbon</atitle><jtitle>Nanotechnology</jtitle><stitle>NANO</stitle><addtitle>Nanotechnology</addtitle><date>2022-10-01</date><risdate>2022</risdate><volume>33</volume><issue>40</issue><spage>405204</spage><pages>405204-</pages><issn>0957-4484</issn><eissn>1361-6528</eissn><coden>NNOTER</coden><abstract>We report a simple, scalable two-step method for direct-write laser fabrication of 3D, porous graphene-like carbon electrodes from polyimide films with integrated contact plugs to underlying metal layers (Au or Ni). Irradiation at high average CO
2
laser power (30 W) and low scan speed (∼18 mm s)
−1
leads to formation of ‘keyhole’ contact plugs through local ablation of polyimide (initial thickness 17
μ
m) and graphitization of the plug perimeter wall. Top-surface laser-induced graphene (LIG) electrodes are then formed and connected to the plug by raster patterning at lower laser power (3.7 W) and higher scan speed (200 mm s)
−1
. Sheet resistance data (71 ± 15 Ω sq.)
−1
indicates formation of high-quality surface LIG, consistent with Raman data which yield sharp first- and second-order peaks. We have also demonstrated that high-quality LIG requires a minimum initial polyimide thickness. Capacitance data measured between surface LIG electrodes and the buried metal film indicate a polyimide layer of thickness ∼7
μ
m remaining following laser processing. By contrast, laser graphitization of polyimide of initial thickness ∼8
μ
m yielded devices with large sheet resistance (>1 kΩ sq.)
−1
. Raman data also indicated significant disorder. Plug contact resistance values were calculated from analysis of transfer line measurement data for single- and multi-plug test structures. Contacts to buried nickel layers yielded lower plug resistances (1-plug: 158 ± 7 Ω , 4-plug: 31 ± 14 Ω) compared to contacts to buried gold (1-plug: 346 ± 37 Ω , 4-plug: 52 ± 3 Ω). Further reductions are expected for multi-plug structures with increased areal density. Proof-of-concept mm-scale LIG electrochemical devices with local contact plugs yielded rapid electron transfer kinetics (rate constant
k
0
∼ 0.017 cm s
−1
), comparable to values measured for exposed Au films (
k
0
∼0.023 cm s)
−1
. Our results highlight the potential for integration of LIG-based sensor electrodes with semiconductor or roll-to-roll manufacturing.</abstract><pub>IOP Publishing</pub><doi>10.1088/1361-6528/ac7c7b</doi><tpages>12</tpages><orcidid>https://orcid.org/0000-0002-0300-4141</orcidid><orcidid>https://orcid.org/0000-0003-1618-0176</orcidid><orcidid>https://orcid.org/0000-0001-7961-4459</orcidid><orcidid>https://orcid.org/0000-0002-9524-0204</orcidid><orcidid>https://orcid.org/0000-0002-9382-6981</orcidid><orcidid>https://orcid.org/0000-0003-4021-9990</orcidid><orcidid>https://orcid.org/0000-0003-0676-5111</orcidid><orcidid>https://orcid.org/0000-0003-2301-9401</orcidid><oa>free_for_read</oa></addata></record> |
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source | Institute of Physics Journals |
subjects | additive manufacture contact resistance electrochemistry laser-induced graphene |
title | Direct-write formation of integrated bottom contacts to laser-induced graphene-like carbon |
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