Status and prospects of Ohmic contacts on two-dimensional semiconductors

In recent years, two-dimensional materials have received more and more attention in the development of semiconductor devices, and their practical applications in optoelectronic devices have also developed rapidly. However, there are still some factors that limit the performance of two-dimensional se...

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Veröffentlicht in:Nanotechnology 2022-02, Vol.33 (6), p.62005
Hauptverfasser: Ni, Junhao, Fu, Quangui, Ostrikov, Kostya (Ken), Gu, Xiaofeng, Nan, Haiyan, Xiao, Shaoqing
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container_end_page
container_issue 6
container_start_page 62005
container_title Nanotechnology
container_volume 33
creator Ni, Junhao
Fu, Quangui
Ostrikov, Kostya (Ken)
Gu, Xiaofeng
Nan, Haiyan
Xiao, Shaoqing
description In recent years, two-dimensional materials have received more and more attention in the development of semiconductor devices, and their practical applications in optoelectronic devices have also developed rapidly. However, there are still some factors that limit the performance of two-dimensional semiconductor material devices, and one of the most important is Ohmic contact. Here, we elaborate on a variety of approaches to achieve Ohmic contacts on two-dimensional materials and reveal their physical mechanisms. For the work function mismatch problem, we summarize the comparison of barrier heights between different metals and 2D semiconductors. We also examine different methods to solve the problem of Fermi level pinning. For the novel 2D metal-semiconductor contact methods, we analyse their effects on reducing contact resistance from two different perspectives: homojunction and heterojunction. Finally, the challenges of 2D semiconductors in achieving Ohmic contacts are outlined.
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subjects 2D metal-semiconductor contact
Fermi level pinning
Ohmic contact
Schottky barrier
transferring electrode
two-dimensional materials
work function
title Status and prospects of Ohmic contacts on two-dimensional semiconductors
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