Impact of local electrostatic field rearrangement on field ionization

Field ion microscopy allows for direct imaging of surfaces with true atomic resolution. The high charge density distribution on the surface generates an intense electric field that can induce ionization of gas atoms. We investigate the dynamic nature of the charge and the consequent electrostatic fi...

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Veröffentlicht in:	Journal of physics. D, Applied physics Applied physics, 2018-03, Vol.51 (10), p.105601
Hauptverfasser:	Katnagallu, Shyam, Dagan, Michal, Parviainen, Stefan, Nematollahi, Ali, Grabowski, Blazej, Bagot, Paul A J, Rolland, Nicolas, Neugebauer, Jörg, Raabe, Dierk, Vurpillot, François, Moody, Michael P, Gault, Baptiste
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed Matter electrostatic field field evaporation field ion microscope field ionization Materials Science microscopy molecular dynamics Physics
Online-Zugang:	Volltext
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