A new model for electrical ageing and breakdown in dielectrics

We derive a simple but generally applicable model for multi-factor ageing in which thermally-induced bond scission is a universal underlying physical process which determines ageing. The final destruction of the dielectric is assumed to occur by a Griffith-crack treeing process and this will have a...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Lewis, T.J, Llewellyn, J.P, van der Sluijs, M.J, Freestone, J, Hampton, R.N
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Dielectric breakdown and discharges Dielectric breakdown and space-charge effects
Online-Zugang:	Volltext
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