A new model for electrical ageing and breakdown in dielectrics

A new model for electrical ageing and breakdown in dielectrics

We derive a simple but generally applicable model for multi-factor ageing in which thermally-induced bond scission is a universal underlying physical process which determines ageing. The final destruction of the dielectric is assumed to occur by a Griffith-crack treeing process and this will have a...

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Hauptverfasser: Lewis, T.J, Llewellyn, J.P, van der Sluijs, M.J, Freestone, J, Hampton, R.N
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Sprache:eng
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Dielectric breakdown and discharges
Dielectric breakdown and space-charge effects
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creator Lewis, T.J
Llewellyn, J.P
van der Sluijs, M.J
Freestone, J
Hampton, R.N
description We derive a simple but generally applicable model for multi-factor ageing in which thermally-induced bond scission is a universal underlying physical process which determines ageing. The final destruction of the dielectric is assumed to occur by a Griffith-crack treeing process and this will have a formative time which will be part of the overall ageing time. Whether it will be a significant part will depend on tc and therefore on the field E.
doi_str_mv 10.1049/cp:19961026
format Conference Proceeding
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identifier ISBN: 0852966709
ispartof Seventh International Conference on Dielectric Materials, Measurements and Applications, 1996, p.220-224
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subjects Dielectric breakdown and discharges
Dielectric breakdown and space-charge effects
title A new model for electrical ageing and breakdown in dielectrics
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