Study of Negative Ion Beamlets Produced in SPIDER by Beam Emission Spectroscopy
Among the beam diagnostics routinely employed in source for production of ion of deuterium (SPIDER), beam emission spectroscopy (BES) provides valuable information for beam characterization, thus driving source optimization methods. In particular, this technique is used to measure beam divergence an...
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Veröffentlicht in: | IEEE transactions on plasma science 2022-11, Vol.50 (11), p.3865-3870 |
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creator | Agnello, Riccardo Barbisan, M. Casati, G. Pasqualotto, R. Serianni, G. Zaniol, B. |
description | Among the beam diagnostics routinely employed in source for production of ion of deuterium (SPIDER), beam emission spectroscopy (BES) provides valuable information for beam characterization, thus driving source optimization methods. In particular, this technique is used to measure beam divergence and uniformity, which are crucial parameters to be optimized for application in International Experimental Thermonuclear Reactor (ITER). In this contribution, we focus on the characterization of H−/D− beamlets extracted during the first SPIDER Cs campaigns. In particular, we show parametric scans and preliminary broad component estimates on single beamlets. |
doi_str_mv | 10.1109/TPS.2022.3180169 |
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In particular, we show parametric scans and preliminary broad component estimates on single beamlets.</description><subject>Apertures</subject><subject>Deuterium</subject><subject>Emission analysis</subject><subject>Emission spectroscopy</subject><subject>Ion beams</subject><subject>Ions</subject><subject>Negative ions</subject><subject>Optics</subject><subject>Optimization</subject><subject>Particle beams</subject><subject>Photonics</subject><subject>plasma sources</subject><subject>Plasmas</subject><subject>Radio frequency</subject><issn>0093-3813</issn><issn>1939-9375</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kM9LwzAUx4MoOKd3wUvAc2eSlx_NUefUwXDD7h7aNJGOba1JO-h_b-eGp3d4n-_3PT4I3VMyoZTop_UqmzDC2ARoSqjUF2hENehEgxKXaESIhgRSCtfoJsYNIZQLwkZombVd2ePa40_3nbfVweF5vccvLt9tXRvxKtRlZ12Jqz3OVvPX2Rcu-r81nu2qGKsBzhpn21BHWzf9Lbry-Ta6u_Mco_XbbD39SBbL9_n0eZFYAGgT4KkCqwvBCg9Cq1JawT2V3CtZ-AIclZZ75iVNSyF9DipXxKUDqbVVJYzR46m2CfVP52JrNnUX9sNFwxRninBF-UCRE2WH72Jw3jSh2uWhN5SYozUzWDNHa-ZsbYg8nCKVc-4f1ykwQST8AhyHZvI</recordid><startdate>20221101</startdate><enddate>20221101</enddate><creator>Agnello, Riccardo</creator><creator>Barbisan, M.</creator><creator>Casati, G.</creator><creator>Pasqualotto, R.</creator><creator>Serianni, G.</creator><creator>Zaniol, B.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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subjects | Apertures Deuterium Emission analysis Emission spectroscopy Ion beams Ions Negative ions Optics Optimization Particle beams Photonics plasma sources Plasmas Radio frequency |
title | Study of Negative Ion Beamlets Produced in SPIDER by Beam Emission Spectroscopy |
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