2001 Nuclear and Space Radiation Effects Conference (NSREC 2001)

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on nuclear science 2001-12, Vol.48 (6), p.1753-1754
1. Verfasser: Oldham, Timothy R.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 1754
container_issue 6
container_start_page 1753
container_title IEEE transactions on nuclear science
container_volume 48
creator Oldham, Timothy R.
description
doi_str_mv 10.1109/TNS.2001.983122
format Article
fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_ieee_primary_983122</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>983122</ieee_id><sourcerecordid>2633168891</sourcerecordid><originalsourceid>FETCH-LOGICAL-c1326-82a6faebf76c1bd587cb55cb30c314575b048bae7ac76daa3d52e32897c1795a3</originalsourceid><addsrcrecordid>eNo9kM1LAzEQxYMoWKtnwdPiSQ_b5qPZJDdlqR9QKrT1HGazE9hSd2vSHvzvm2WLp2F47zfzeITcMzphjJrpZrmecErZxGjBOL8gIyalzplU-pKMkqBzMzPmmtzEuE3rTFI5Ii89ki2PbocQMmjrbL0Hh9kK6gYOTddmc-_RHWJWdq3HgG0Sn5br1bzMevT5llx52EW8O88x-X6bb8qPfPH1_lm-LnLHBC9yzaHwgJVXhWNVLbVylZSuEtSJFEXJis50BajAqaIGELXkKLg2yjFlJIgxeRzu7kP3e8R4sNvuGNr00hqjaWGELJJpOphc6GIM6O0-ND8Q_iyjtm_JppZsn9sOLSXiYSAaRPx3n8UTSNNfFQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>998069356</pqid></control><display><type>article</type><title>2001 Nuclear and Space Radiation Effects Conference (NSREC 2001)</title><source>IEEE Electronic Library (IEL)</source><creator>Oldham, Timothy R.</creator><creatorcontrib>Oldham, Timothy R.</creatorcontrib><identifier>ISSN: 0018-9499</identifier><identifier>EISSN: 1558-1578</identifier><identifier>DOI: 10.1109/TNS.2001.983122</identifier><identifier>CODEN: IETNAE</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Dosimetry ; Integrated circuit reliability ; Integrated optics ; Radiation effects ; Radiation hardening ; Space vehicle electronics</subject><ispartof>IEEE transactions on nuclear science, 2001-12, Vol.48 (6), p.1753-1754</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2001</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c1326-82a6faebf76c1bd587cb55cb30c314575b048bae7ac76daa3d52e32897c1795a3</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/983122$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/983122$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Oldham, Timothy R.</creatorcontrib><title>2001 Nuclear and Space Radiation Effects Conference (NSREC 2001)</title><title>IEEE transactions on nuclear science</title><addtitle>TNS</addtitle><subject>Dosimetry</subject><subject>Integrated circuit reliability</subject><subject>Integrated optics</subject><subject>Radiation effects</subject><subject>Radiation hardening</subject><subject>Space vehicle electronics</subject><issn>0018-9499</issn><issn>1558-1578</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2001</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kM1LAzEQxYMoWKtnwdPiSQ_b5qPZJDdlqR9QKrT1HGazE9hSd2vSHvzvm2WLp2F47zfzeITcMzphjJrpZrmecErZxGjBOL8gIyalzplU-pKMkqBzMzPmmtzEuE3rTFI5Ii89ki2PbocQMmjrbL0Hh9kK6gYOTddmc-_RHWJWdq3HgG0Sn5br1bzMevT5llx52EW8O88x-X6bb8qPfPH1_lm-LnLHBC9yzaHwgJVXhWNVLbVylZSuEtSJFEXJis50BajAqaIGELXkKLg2yjFlJIgxeRzu7kP3e8R4sNvuGNr00hqjaWGELJJpOphc6GIM6O0-ND8Q_iyjtm_JppZsn9sOLSXiYSAaRPx3n8UTSNNfFQ</recordid><startdate>200112</startdate><enddate>200112</enddate><creator>Oldham, Timothy R.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QF</scope><scope>7QL</scope><scope>7QQ</scope><scope>7SC</scope><scope>7SE</scope><scope>7SP</scope><scope>7SR</scope><scope>7T7</scope><scope>7TA</scope><scope>7TB</scope><scope>7U5</scope><scope>7U9</scope><scope>8BQ</scope><scope>8FD</scope><scope>C1K</scope><scope>F28</scope><scope>FR3</scope><scope>H8D</scope><scope>H94</scope><scope>JG9</scope><scope>JQ2</scope><scope>KR7</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>M7N</scope><scope>P64</scope></search><sort><creationdate>200112</creationdate><title>2001 Nuclear and Space Radiation Effects Conference (NSREC 2001)</title><author>Oldham, Timothy R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1326-82a6faebf76c1bd587cb55cb30c314575b048bae7ac76daa3d52e32897c1795a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2001</creationdate><topic>Dosimetry</topic><topic>Integrated circuit reliability</topic><topic>Integrated optics</topic><topic>Radiation effects</topic><topic>Radiation hardening</topic><topic>Space vehicle electronics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Oldham, Timothy R.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Aluminium Industry Abstracts</collection><collection>Bacteriology Abstracts (Microbiology B)</collection><collection>Ceramic Abstracts</collection><collection>Computer and Information Systems Abstracts</collection><collection>Corrosion Abstracts</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Industrial and Applied Microbiology Abstracts (Microbiology A)</collection><collection>Materials Business File</collection><collection>Mechanical &amp; Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Virology and AIDS Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Environmental Sciences and Pollution Management</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><collection>Aerospace Database</collection><collection>AIDS and Cancer Research Abstracts</collection><collection>Materials Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts – Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>Algology Mycology and Protozoology Abstracts (Microbiology C)</collection><collection>Biotechnology and BioEngineering Abstracts</collection><jtitle>IEEE transactions on nuclear science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Oldham, Timothy R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>2001 Nuclear and Space Radiation Effects Conference (NSREC 2001)</atitle><jtitle>IEEE transactions on nuclear science</jtitle><stitle>TNS</stitle><date>2001-12</date><risdate>2001</risdate><volume>48</volume><issue>6</issue><spage>1753</spage><epage>1754</epage><pages>1753-1754</pages><issn>0018-9499</issn><eissn>1558-1578</eissn><coden>IETNAE</coden><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TNS.2001.983122</doi><tpages>2</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0018-9499
ispartof IEEE transactions on nuclear science, 2001-12, Vol.48 (6), p.1753-1754
issn 0018-9499
1558-1578
language eng
recordid cdi_ieee_primary_983122
source IEEE Electronic Library (IEL)
subjects Dosimetry
Integrated circuit reliability
Integrated optics
Radiation effects
Radiation hardening
Space vehicle electronics
title 2001 Nuclear and Space Radiation Effects Conference (NSREC 2001)
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-08T18%3A29%3A25IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=2001%20Nuclear%20and%20Space%20Radiation%20Effects%20Conference%20(NSREC%202001)&rft.jtitle=IEEE%20transactions%20on%20nuclear%20science&rft.au=Oldham,%20Timothy%20R.&rft.date=2001-12&rft.volume=48&rft.issue=6&rft.spage=1753&rft.epage=1754&rft.pages=1753-1754&rft.issn=0018-9499&rft.eissn=1558-1578&rft.coden=IETNAE&rft_id=info:doi/10.1109/TNS.2001.983122&rft_dat=%3Cproquest_RIE%3E2633168891%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=998069356&rft_id=info:pmid/&rft_ieee_id=983122&rfr_iscdi=true