2001 Nuclear and Space Radiation Effects Conference (NSREC 2001)
Gespeichert in:
Veröffentlicht in: | IEEE transactions on nuclear science 2001-12, Vol.48 (6), p.1753-1754 |
---|---|
1. Verfasser: | |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 1754 |
---|---|
container_issue | 6 |
container_start_page | 1753 |
container_title | IEEE transactions on nuclear science |
container_volume | 48 |
creator | Oldham, Timothy R. |
description | |
doi_str_mv | 10.1109/TNS.2001.983122 |
format | Article |
fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_ieee_primary_983122</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>983122</ieee_id><sourcerecordid>2633168891</sourcerecordid><originalsourceid>FETCH-LOGICAL-c1326-82a6faebf76c1bd587cb55cb30c314575b048bae7ac76daa3d52e32897c1795a3</originalsourceid><addsrcrecordid>eNo9kM1LAzEQxYMoWKtnwdPiSQ_b5qPZJDdlqR9QKrT1HGazE9hSd2vSHvzvm2WLp2F47zfzeITcMzphjJrpZrmecErZxGjBOL8gIyalzplU-pKMkqBzMzPmmtzEuE3rTFI5Ii89ki2PbocQMmjrbL0Hh9kK6gYOTddmc-_RHWJWdq3HgG0Sn5br1bzMevT5llx52EW8O88x-X6bb8qPfPH1_lm-LnLHBC9yzaHwgJVXhWNVLbVylZSuEtSJFEXJis50BajAqaIGELXkKLg2yjFlJIgxeRzu7kP3e8R4sNvuGNr00hqjaWGELJJpOphc6GIM6O0-ND8Q_iyjtm_JppZsn9sOLSXiYSAaRPx3n8UTSNNfFQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>998069356</pqid></control><display><type>article</type><title>2001 Nuclear and Space Radiation Effects Conference (NSREC 2001)</title><source>IEEE Electronic Library (IEL)</source><creator>Oldham, Timothy R.</creator><creatorcontrib>Oldham, Timothy R.</creatorcontrib><identifier>ISSN: 0018-9499</identifier><identifier>EISSN: 1558-1578</identifier><identifier>DOI: 10.1109/TNS.2001.983122</identifier><identifier>CODEN: IETNAE</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Dosimetry ; Integrated circuit reliability ; Integrated optics ; Radiation effects ; Radiation hardening ; Space vehicle electronics</subject><ispartof>IEEE transactions on nuclear science, 2001-12, Vol.48 (6), p.1753-1754</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2001</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c1326-82a6faebf76c1bd587cb55cb30c314575b048bae7ac76daa3d52e32897c1795a3</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/983122$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/983122$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Oldham, Timothy R.</creatorcontrib><title>2001 Nuclear and Space Radiation Effects Conference (NSREC 2001)</title><title>IEEE transactions on nuclear science</title><addtitle>TNS</addtitle><subject>Dosimetry</subject><subject>Integrated circuit reliability</subject><subject>Integrated optics</subject><subject>Radiation effects</subject><subject>Radiation hardening</subject><subject>Space vehicle electronics</subject><issn>0018-9499</issn><issn>1558-1578</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2001</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kM1LAzEQxYMoWKtnwdPiSQ_b5qPZJDdlqR9QKrT1HGazE9hSd2vSHvzvm2WLp2F47zfzeITcMzphjJrpZrmecErZxGjBOL8gIyalzplU-pKMkqBzMzPmmtzEuE3rTFI5Ii89ki2PbocQMmjrbL0Hh9kK6gYOTddmc-_RHWJWdq3HgG0Sn5br1bzMevT5llx52EW8O88x-X6bb8qPfPH1_lm-LnLHBC9yzaHwgJVXhWNVLbVylZSuEtSJFEXJis50BajAqaIGELXkKLg2yjFlJIgxeRzu7kP3e8R4sNvuGNr00hqjaWGELJJpOphc6GIM6O0-ND8Q_iyjtm_JppZsn9sOLSXiYSAaRPx3n8UTSNNfFQ</recordid><startdate>200112</startdate><enddate>200112</enddate><creator>Oldham, Timothy R.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QF</scope><scope>7QL</scope><scope>7QQ</scope><scope>7SC</scope><scope>7SE</scope><scope>7SP</scope><scope>7SR</scope><scope>7T7</scope><scope>7TA</scope><scope>7TB</scope><scope>7U5</scope><scope>7U9</scope><scope>8BQ</scope><scope>8FD</scope><scope>C1K</scope><scope>F28</scope><scope>FR3</scope><scope>H8D</scope><scope>H94</scope><scope>JG9</scope><scope>JQ2</scope><scope>KR7</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>M7N</scope><scope>P64</scope></search><sort><creationdate>200112</creationdate><title>2001 Nuclear and Space Radiation Effects Conference (NSREC 2001)</title><author>Oldham, Timothy R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1326-82a6faebf76c1bd587cb55cb30c314575b048bae7ac76daa3d52e32897c1795a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2001</creationdate><topic>Dosimetry</topic><topic>Integrated circuit reliability</topic><topic>Integrated optics</topic><topic>Radiation effects</topic><topic>Radiation hardening</topic><topic>Space vehicle electronics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Oldham, Timothy R.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Aluminium Industry Abstracts</collection><collection>Bacteriology Abstracts (Microbiology B)</collection><collection>Ceramic Abstracts</collection><collection>Computer and Information Systems Abstracts</collection><collection>Corrosion Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Industrial and Applied Microbiology Abstracts (Microbiology A)</collection><collection>Materials Business File</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Virology and AIDS Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Environmental Sciences and Pollution Management</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Aerospace Database</collection><collection>AIDS and Cancer Research Abstracts</collection><collection>Materials Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>Algology Mycology and Protozoology Abstracts (Microbiology C)</collection><collection>Biotechnology and BioEngineering Abstracts</collection><jtitle>IEEE transactions on nuclear science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Oldham, Timothy R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>2001 Nuclear and Space Radiation Effects Conference (NSREC 2001)</atitle><jtitle>IEEE transactions on nuclear science</jtitle><stitle>TNS</stitle><date>2001-12</date><risdate>2001</risdate><volume>48</volume><issue>6</issue><spage>1753</spage><epage>1754</epage><pages>1753-1754</pages><issn>0018-9499</issn><eissn>1558-1578</eissn><coden>IETNAE</coden><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TNS.2001.983122</doi><tpages>2</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 0018-9499 |
ispartof | IEEE transactions on nuclear science, 2001-12, Vol.48 (6), p.1753-1754 |
issn | 0018-9499 1558-1578 |
language | eng |
recordid | cdi_ieee_primary_983122 |
source | IEEE Electronic Library (IEL) |
subjects | Dosimetry Integrated circuit reliability Integrated optics Radiation effects Radiation hardening Space vehicle electronics |
title | 2001 Nuclear and Space Radiation Effects Conference (NSREC 2001) |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-08T18%3A29%3A25IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=2001%20Nuclear%20and%20Space%20Radiation%20Effects%20Conference%20(NSREC%202001)&rft.jtitle=IEEE%20transactions%20on%20nuclear%20science&rft.au=Oldham,%20Timothy%20R.&rft.date=2001-12&rft.volume=48&rft.issue=6&rft.spage=1753&rft.epage=1754&rft.pages=1753-1754&rft.issn=0018-9499&rft.eissn=1558-1578&rft.coden=IETNAE&rft_id=info:doi/10.1109/TNS.2001.983122&rft_dat=%3Cproquest_RIE%3E2633168891%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=998069356&rft_id=info:pmid/&rft_ieee_id=983122&rfr_iscdi=true |