Transient Electrical Behaviour of the TF Superconducting Coils of Divertor Tokamak Test Facility During a Fast Discharge

The paper is focused on the electromagnetic analysis of the Toroidal Field (TF) superconducting coils of the Divertor Tokamak Test facility (DTT) when electrical transients occur in the TF coils system: for example, during the operations of the Fast Discharge Units (FDUs) and considering also, the s...

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Veröffentlicht in:IEEE transactions on applied superconductivity 2022-10, Vol.32 (7), p.1-1
Hauptverfasser: Messina, G., Lopes, C. R., Zito, P., Zenobio, A. Di, Fiamozzi Zignani, C., Lampasi, A., Morici, L., Ramogida, G., Tomassetti, G., Ala, G., Zizzo, G.
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Sprache:eng
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Zusammenfassung:The paper is focused on the electromagnetic analysis of the Toroidal Field (TF) superconducting coils of the Divertor Tokamak Test facility (DTT) when electrical transients occur in the TF coils system: for example, during the operations of the Fast Discharge Units (FDUs) and considering also, the simultaneous occurrence of a fault condition. During the FDU intervention, a transient voltage excitation lasting few microseconds occurs at the TF coil terminals and it electrically stresses the insulations of TF coils itsef. To investigate the voltage distribution across, inside and between different Double Pancakes (DPs) of each TF coil, a lumped parameters circuital model has been developed and implemented in Ansys Simplorer simulation environment. This model includes both the detailed sub-model of each TF coil and FDU. The transient analyses have been carried out for two different scenarios: a reference one and a failure scenario, considering three different fault resistance values and also two different values of the resistance connecting the TF case to ground. In order to verify the correct sizing of the coil insulation and the TF case-to-ground resistance value inserted in the circuit of each TF coil, the voltages of each TF coil (terminal-to-terminal, terminal-to-ground, across of adjacent DPs and so) were computed in the time domain (in the range of milliseconds) for both scenarios. An overview of calculations and simulation results is presented and discussed, pointing out a high sensitivity of fault conditions and of overvoltage values and addressing mitigation strategies.
ISSN:1051-8223
1558-2515
DOI:10.1109/TASC.2022.3179873