Electromagnetic Characterization of Thin Films by Using Non-Contacting Waveguides

Surface impedance represents a crucial parameter for the characterization of thin films. Indeed, materials with a sheet impedance varying as a function of their elongation could be used in radio frequency piezoresistive sensors. To estimate this quantity while having the possibility of stretching th...

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Veröffentlicht in:	IEEE transactions on antennas and propagation 2022-09, Vol.70 (9), p.8452-8460
Hauptverfasser:	Rodini, Sandra, Genovesi, Simone, Manara, Giuliano, Costa, Filippo
Format:	Artikel
Sprache:	eng
Schlagworte:	Circuits Contact Electromagnetic band gap (EBG) Electromagnetic fields Electromagnetic properties Electromagnetic waveguides Elongation Flanges Impedance Measurement methods piezoresistive sensors Reliability analysis S parameters Sensors sheet resistance stretchable materials Surface impedance surface impedance measurement Surface resistance Surface waves Thin films thin sheets Waveguides wireless sensors
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