An inverse algorithm to calculate the refractive index profiles of periodically segmented waveguides from the measured near-field intensities
In this paper, the refractive index profiles of the periodically segmented waveguides (PSWs), which are fabricated in soda-lime glasses by the K/sup +/-Na/sup +/ ion-exchanged technique, are reconstructed from the measured transmitted near-field (NF) intensity combined with an inverse method. Throug...
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Veröffentlicht in: | Journal of lightwave technology 2002-01, Vol.20 (1), p.58-64 |
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description | In this paper, the refractive index profiles of the periodically segmented waveguides (PSWs), which are fabricated in soda-lime glasses by the K/sup +/-Na/sup +/ ion-exchanged technique, are reconstructed from the measured transmitted near-field (NF) intensity combined with an inverse method. Through the proposed inverse method, the model /spl Delta/n'=/spl eta//spl Delta/n, which characterizes the behavior of the PSWs, is also verified. In the numerical process, a finite-difference method is used to discretize the governing equation, and then a linear inverse model is constructed to identify the unknown refractive index profiles. The approach used is to rearrange the matrix form of the governing differential equation and estimate the unknown index profiles of the waveguides. Then, the linear least-squares error method is adopted to find the solutions. The results show that the accuracy of index determination can be accessed even when the measured noise is considered. In contrast to the traditional approach, the advantages of this method are that no prior information is needed on the functional form of the unknown index profiles, no initial guesses are required, no iterations in the calculating process are necessary, no intensity smoothing is required in advance, and the inverse problem can be solved in a linear domain. Furthermore, the existence and uniqueness of the solutions can easily be identified. |
doi_str_mv | 10.1109/50.974818 |
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Through the proposed inverse method, the model /spl Delta/n'=/spl eta//spl Delta/n, which characterizes the behavior of the PSWs, is also verified. In the numerical process, a finite-difference method is used to discretize the governing equation, and then a linear inverse model is constructed to identify the unknown refractive index profiles. The approach used is to rearrange the matrix form of the governing differential equation and estimate the unknown index profiles of the waveguides. Then, the linear least-squares error method is adopted to find the solutions. The results show that the accuracy of index determination can be accessed even when the measured noise is considered. In contrast to the traditional approach, the advantages of this method are that no prior information is needed on the functional form of the unknown index profiles, no initial guesses are required, no iterations in the calculating process are necessary, no intensity smoothing is required in advance, and the inverse problem can be solved in a linear domain. Furthermore, the existence and uniqueness of the solutions can easily be identified.</description><identifier>ISSN: 0733-8724</identifier><identifier>EISSN: 1558-2213</identifier><identifier>DOI: 10.1109/50.974818</identifier><identifier>CODEN: JLTEDG</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Algorithms ; Applied sciences ; Circuit properties ; Electric, optical and optoelectronic circuits ; Electronics ; Exact sciences and technology ; Integrated optics. Optical fibers and wave guides ; Inverse ; Inverse method ; Inverse problems ; Mathematical analysis ; Mathematical models ; Noise measurement ; Optical and optoelectronic circuits ; Optical interferometry ; Optical materials ; Optical refraction ; Optical variables control ; Optical waveguides ; Particle beam optics ; Refractive index ; Refractivity ; Smoothing methods ; Studies ; Waveguides</subject><ispartof>Journal of lightwave technology, 2002-01, Vol.20 (1), p.58-64</ispartof><rights>2002 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2002</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c431t-b32846164058eabfd88cd09167016923a5a9d377805e115dadfff28d34080fac3</citedby><cites>FETCH-LOGICAL-c431t-b32846164058eabfd88cd09167016923a5a9d377805e115dadfff28d34080fac3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/974818$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,4010,27900,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/974818$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=13424098$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>LIN, Jiin-Hong</creatorcontrib><creatorcontrib>CHEN, Cha'O-Kuang</creatorcontrib><title>An inverse algorithm to calculate the refractive index profiles of periodically segmented waveguides from the measured near-field intensities</title><title>Journal of lightwave technology</title><addtitle>JLT</addtitle><description>In this paper, the refractive index profiles of the periodically segmented waveguides (PSWs), which are fabricated in soda-lime glasses by the K/sup +/-Na/sup +/ ion-exchanged technique, are reconstructed from the measured transmitted near-field (NF) intensity combined with an inverse method. Through the proposed inverse method, the model /spl Delta/n'=/spl eta//spl Delta/n, which characterizes the behavior of the PSWs, is also verified. In the numerical process, a finite-difference method is used to discretize the governing equation, and then a linear inverse model is constructed to identify the unknown refractive index profiles. The approach used is to rearrange the matrix form of the governing differential equation and estimate the unknown index profiles of the waveguides. Then, the linear least-squares error method is adopted to find the solutions. The results show that the accuracy of index determination can be accessed even when the measured noise is considered. In contrast to the traditional approach, the advantages of this method are that no prior information is needed on the functional form of the unknown index profiles, no initial guesses are required, no iterations in the calculating process are necessary, no intensity smoothing is required in advance, and the inverse problem can be solved in a linear domain. Furthermore, the existence and uniqueness of the solutions can easily be identified.</description><subject>Algorithms</subject><subject>Applied sciences</subject><subject>Circuit properties</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Integrated optics. Optical fibers and wave guides</subject><subject>Inverse</subject><subject>Inverse method</subject><subject>Inverse problems</subject><subject>Mathematical analysis</subject><subject>Mathematical models</subject><subject>Noise measurement</subject><subject>Optical and optoelectronic circuits</subject><subject>Optical interferometry</subject><subject>Optical materials</subject><subject>Optical refraction</subject><subject>Optical variables control</subject><subject>Optical waveguides</subject><subject>Particle beam optics</subject><subject>Refractive index</subject><subject>Refractivity</subject><subject>Smoothing methods</subject><subject>Studies</subject><subject>Waveguides</subject><issn>0733-8724</issn><issn>1558-2213</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2002</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqF0j1vFDEQBuAVAokjUNBSWUigUGzw59pbRhGESJHShHrl2OOLI-_uYXsv5EfkPzPHnUCiIJWLeeaVx-OmecvoCWO0_6zoSa-lYeZZs2JKmZZzJp43K6qFaI3m8mXzqpQ7SpmURq-ax9OJxGkLuQCxaT3nWG9HUmfibHJLshVIvQWSIWTratwCag8_ySbPISYoZA5kAznOPmJHeiAF1iNMFTy5t1tYL9EjCnkef-eMYMuSsTiBzW2IkDwGVphKrBHK6-ZFsKnAm8N51Hz_-uX67Ft7eXV-cXZ62TopWG1vBDeyY52kyoC9Cd4Y52nPOk1Z13Nhle290NpQBYwpb30IgRsvJDU0WCeOmo_7XBzjxwKlDmMsDlKyE8xLGXbxXFL6NNQd5VT3CI__C_FujPfMKPk0pZwbpIYhff8PvZuXPOHTDMZIqXFYjujTHrk8l4KbGjY5jjY_YNKw-xSDosP-U6D9cAi0BfeFS51cLH8bhMSx-517t3cRAP6UDyG_ABL9v2k</recordid><startdate>200201</startdate><enddate>200201</enddate><creator>LIN, Jiin-Hong</creator><creator>CHEN, Cha'O-Kuang</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>200201</creationdate><title>An inverse algorithm to calculate the refractive index profiles of periodically segmented waveguides from the measured near-field intensities</title><author>LIN, Jiin-Hong ; CHEN, Cha'O-Kuang</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c431t-b32846164058eabfd88cd09167016923a5a9d377805e115dadfff28d34080fac3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2002</creationdate><topic>Algorithms</topic><topic>Applied sciences</topic><topic>Circuit properties</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Integrated optics. Optical fibers and wave guides</topic><topic>Inverse</topic><topic>Inverse method</topic><topic>Inverse problems</topic><topic>Mathematical analysis</topic><topic>Mathematical models</topic><topic>Noise measurement</topic><topic>Optical and optoelectronic circuits</topic><topic>Optical interferometry</topic><topic>Optical materials</topic><topic>Optical refraction</topic><topic>Optical variables control</topic><topic>Optical waveguides</topic><topic>Particle beam optics</topic><topic>Refractive index</topic><topic>Refractivity</topic><topic>Smoothing methods</topic><topic>Studies</topic><topic>Waveguides</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>LIN, Jiin-Hong</creatorcontrib><creatorcontrib>CHEN, Cha'O-Kuang</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of lightwave technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LIN, Jiin-Hong</au><au>CHEN, Cha'O-Kuang</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>An inverse algorithm to calculate the refractive index profiles of periodically segmented waveguides from the measured near-field intensities</atitle><jtitle>Journal of lightwave technology</jtitle><stitle>JLT</stitle><date>2002-01</date><risdate>2002</risdate><volume>20</volume><issue>1</issue><spage>58</spage><epage>64</epage><pages>58-64</pages><issn>0733-8724</issn><eissn>1558-2213</eissn><coden>JLTEDG</coden><abstract>In this paper, the refractive index profiles of the periodically segmented waveguides (PSWs), which are fabricated in soda-lime glasses by the K/sup +/-Na/sup +/ ion-exchanged technique, are reconstructed from the measured transmitted near-field (NF) intensity combined with an inverse method. Through the proposed inverse method, the model /spl Delta/n'=/spl eta//spl Delta/n, which characterizes the behavior of the PSWs, is also verified. In the numerical process, a finite-difference method is used to discretize the governing equation, and then a linear inverse model is constructed to identify the unknown refractive index profiles. The approach used is to rearrange the matrix form of the governing differential equation and estimate the unknown index profiles of the waveguides. Then, the linear least-squares error method is adopted to find the solutions. The results show that the accuracy of index determination can be accessed even when the measured noise is considered. In contrast to the traditional approach, the advantages of this method are that no prior information is needed on the functional form of the unknown index profiles, no initial guesses are required, no iterations in the calculating process are necessary, no intensity smoothing is required in advance, and the inverse problem can be solved in a linear domain. Furthermore, the existence and uniqueness of the solutions can easily be identified.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/50.974818</doi><tpages>7</tpages></addata></record> |
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subjects | Algorithms Applied sciences Circuit properties Electric, optical and optoelectronic circuits Electronics Exact sciences and technology Integrated optics. Optical fibers and wave guides Inverse Inverse method Inverse problems Mathematical analysis Mathematical models Noise measurement Optical and optoelectronic circuits Optical interferometry Optical materials Optical refraction Optical variables control Optical waveguides Particle beam optics Refractive index Refractivity Smoothing methods Studies Waveguides |
title | An inverse algorithm to calculate the refractive index profiles of periodically segmented waveguides from the measured near-field intensities |
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