Abnormal Two-Stage Degradation on P-Type Low-Temperature Polycrystalline-Silicon Thin-Film Transistor Under Hot Carrier Conditions

In this study, an abnormal two-stage degradation of low-temperature polycrystalline-silicon (LTPS) thin-film transistors (TFTs) on a polyimide flexible substrate after hot carrier stress was investigated. The degradation mechanism was divided into two stages. In the first stage, the increases in cap...

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