Analysis of the Photoneutron Field Near the THz Dump of the CLEAR Accelerator at CERN With SEU Measurements and Simulations
We study the radiation environment near the terahertz (THz) dump of the CERN Linear Electron Accelerator for Research (CLEAR) electron accelerator at CERN, using FLUktuierende KAskade in German (FLUKA) simulations and single-event upset (SEU) measurements taken with 32-Mbit Integrated Silicon Soluti...
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| Veröffentlicht in: | IEEE transactions on nuclear science 2022-07, Vol.69 (7), p.1541-1548 |
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| creator | Lerner, Giuseppe Coronetti, Andrea Kempf, Jean Mael Alia, Ruben Garcia Cerutti, Francesco Prelipcean, Daniel Cecchetto, Matteo Gilardi, Antonio Farabolini, Wilfrid Corsini, Roberto |
| description | We study the radiation environment near the terahertz (THz) dump of the CERN Linear Electron Accelerator for Research (CLEAR) electron accelerator at CERN, using FLUktuierende KAskade in German (FLUKA) simulations and single-event upset (SEU) measurements taken with 32-Mbit Integrated Silicon Solution Inc. (ISSI) static random access memories (SRAMs). The main focus is on the characterization of the neutron field to evaluate its suitability for radiation tests of electronics in comparison with other irradiation facilities. Neutrons at CLEAR are produced via photonuclear reactions, mostly initiated by photons from the electromagnetic cascades that occur when the beam is absorbed by the dump structure. Good agreement is generally found between the measured single-event upset (SEU) rates and the expected values obtained from FLUKA simulations and the known SEU response of the ISSI SRAMs to neutrons, while one position is found to be potentially affected by photon-driven SEUs. |
| doi_str_mv | 10.1109/TNS.2022.3157404 |
| format | Article |
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(ISSI) static random access memories (SRAMs). The main focus is on the characterization of the neutron field to evaluate its suitability for radiation tests of electronics in comparison with other irradiation facilities. Neutrons at CLEAR are produced via photonuclear reactions, mostly initiated by photons from the electromagnetic cascades that occur when the beam is absorbed by the dump structure. Good agreement is generally found between the measured single-event upset (SEU) rates and the expected values obtained from FLUKA simulations and the known SEU response of the ISSI SRAMs to neutrons, while one position is found to be potentially affected by photon-driven SEUs.</description><identifier>ISSN: 0018-9499</identifier><identifier>EISSN: 1558-1578</identifier><identifier>DOI: 10.1109/TNS.2022.3157404</identifier><identifier>CODEN: IETNAE</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Accelerator ; CERN ; CERN Linear Electron Accelerator for Research (CLEAR) ; Electron beams ; electrons ; Iron ; Irradiation ; Neutrons ; Particle beam measurements ; Photonics ; Photons ; Photonuclear reactions ; Production ; Radiation ; radiation effects to electronics (R2E) ; radiation testing ; Radiation tests ; Simulation ; Single event upsets ; single-event upsets (SEUs) ; static random access memories (SRAMs) ; Static random access memory</subject><ispartof>IEEE transactions on nuclear science, 2022-07, Vol.69 (7), p.1541-1548</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. 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Coronetti, Andrea ; Kempf, Jean Mael ; Alia, Ruben Garcia ; Cerutti, Francesco ; Prelipcean, Daniel ; Cecchetto, Matteo ; Gilardi, Antonio ; Farabolini, Wilfrid ; Corsini, Roberto</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c369t-20b451b85c065871e27ad666fa879f98df3776afcd73132a279bb11ac8c5c07b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>Accelerator</topic><topic>CERN</topic><topic>CERN Linear Electron Accelerator for Research (CLEAR)</topic><topic>Electron beams</topic><topic>electrons</topic><topic>Iron</topic><topic>Irradiation</topic><topic>Neutrons</topic><topic>Particle beam measurements</topic><topic>Photonics</topic><topic>Photons</topic><topic>Photonuclear reactions</topic><topic>Production</topic><topic>Radiation</topic><topic>radiation effects to electronics (R2E)</topic><topic>radiation testing</topic><topic>Radiation tests</topic><topic>Simulation</topic><topic>Single event upsets</topic><topic>single-event upsets (SEUs)</topic><topic>static random access memories (SRAMs)</topic><topic>Static random access memory</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lerner, Giuseppe</creatorcontrib><creatorcontrib>Coronetti, Andrea</creatorcontrib><creatorcontrib>Kempf, Jean Mael</creatorcontrib><creatorcontrib>Alia, Ruben Garcia</creatorcontrib><creatorcontrib>Cerutti, Francesco</creatorcontrib><creatorcontrib>Prelipcean, Daniel</creatorcontrib><creatorcontrib>Cecchetto, Matteo</creatorcontrib><creatorcontrib>Gilardi, Antonio</creatorcontrib><creatorcontrib>Farabolini, Wilfrid</creatorcontrib><creatorcontrib>Corsini, Roberto</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE Open Access Journals</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Aluminium Industry Abstracts</collection><collection>Bacteriology Abstracts (Microbiology B)</collection><collection>Ceramic Abstracts</collection><collection>Computer and Information Systems Abstracts</collection><collection>Corrosion Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Industrial and Applied Microbiology Abstracts (Microbiology A)</collection><collection>Materials Business File</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Virology and AIDS Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Environmental Sciences and Pollution Management</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Aerospace Database</collection><collection>AIDS and Cancer Research Abstracts</collection><collection>Materials Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>Algology Mycology and Protozoology Abstracts (Microbiology C)</collection><collection>Biotechnology and BioEngineering Abstracts</collection><jtitle>IEEE transactions on nuclear science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Lerner, Giuseppe</au><au>Coronetti, Andrea</au><au>Kempf, Jean Mael</au><au>Alia, Ruben Garcia</au><au>Cerutti, Francesco</au><au>Prelipcean, Daniel</au><au>Cecchetto, Matteo</au><au>Gilardi, Antonio</au><au>Farabolini, Wilfrid</au><au>Corsini, Roberto</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Analysis of the Photoneutron Field Near the THz Dump of the CLEAR Accelerator at CERN With SEU Measurements and Simulations</atitle><jtitle>IEEE transactions on nuclear science</jtitle><stitle>TNS</stitle><date>2022-07-01</date><risdate>2022</risdate><volume>69</volume><issue>7</issue><spage>1541</spage><epage>1548</epage><pages>1541-1548</pages><issn>0018-9499</issn><eissn>1558-1578</eissn><coden>IETNAE</coden><abstract>We study the radiation environment near the terahertz (THz) dump of the CERN Linear Electron Accelerator for Research (CLEAR) electron accelerator at CERN, using FLUktuierende KAskade in German (FLUKA) simulations and single-event upset (SEU) measurements taken with 32-Mbit Integrated Silicon Solution Inc. 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| subjects | Accelerator CERN CERN Linear Electron Accelerator for Research (CLEAR) Electron beams electrons Iron Irradiation Neutrons Particle beam measurements Photonics Photons Photonuclear reactions Production Radiation radiation effects to electronics (R2E) radiation testing Radiation tests Simulation Single event upsets single-event upsets (SEUs) static random access memories (SRAMs) Static random access memory |
| title | Analysis of the Photoneutron Field Near the THz Dump of the CLEAR Accelerator at CERN With SEU Measurements and Simulations |
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