IEEE Std 4 "High voltage testing techniques" past, present and future IEEE/PES/PSIM High Voltage Testing Techniques Subcommittee Report

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Hauptverfasser: Larzelere, B., Loving, K., Daharsh, R., Kise, J., McComb, T., Hanique, E., Britton, J., Molden, A., Holst, B., Coffeen, L., McQuin, N., Nichols, D., Dufield, D., Newnam, R., Schneider, H., Fitzpatrick, G., Schneider, G., Sebo, S., Hildreth, J., Schweickart, D., Train, D., Kremer, R., Smith, M., Wagenaar, L., Kuffel, J., So, E., Ward, B., McBride, J., Tuli, S., Yicheng Wang, Yixin Zhang, Hugh Zhu, Rickmann, J.
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creator Larzelere, B.
Loving, K.
Daharsh, R.
Kise, J.
McComb, T.
Hanique, E.
Britton, J.
Molden, A.
Holst, B.
Coffeen, L.
McQuin, N.
Nichols, D.
Dufield, D.
Newnam, R.
Schneider, H.
Fitzpatrick, G.
Schneider, G.
Sebo, S.
Hildreth, J.
Schweickart, D.
Train, D.
Kremer, R.
Smith, M.
Wagenaar, L.
Kuffel, J.
So, E.
Ward, B.
McBride, J.
Tuli, S.
Yicheng Wang
Yixin Zhang
Hugh Zhu
Rickmann, J.
description
doi_str_mv 10.1109/TDC.2001.971399
format Conference Proceeding
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ispartof 2001 IEEE/PES Transmission and Distribution Conference and Exposition. Developing New Perspectives (Cat. No.01CH37294), 2001, Vol.2, p.1064-1069
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language eng
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source IEEE Electronic Library (IEL) Conference Proceedings
subjects Atmospheric measurements
Contamination
Dielectric loss measurement
Dielectric losses
Dielectric measurements
IEC standards
Measurement standards
Pollution measurement
Testing
Voltage measurement
title IEEE Std 4 "High voltage testing techniques" past, present and future IEEE/PES/PSIM High Voltage Testing Techniques Subcommittee Report
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