IEEE Std 4 "High voltage testing techniques" past, present and future IEEE/PES/PSIM High Voltage Testing Techniques Subcommittee Report
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creator | Larzelere, B. Loving, K. Daharsh, R. Kise, J. McComb, T. Hanique, E. Britton, J. Molden, A. Holst, B. Coffeen, L. McQuin, N. Nichols, D. Dufield, D. Newnam, R. Schneider, H. Fitzpatrick, G. Schneider, G. Sebo, S. Hildreth, J. Schweickart, D. Train, D. Kremer, R. Smith, M. Wagenaar, L. Kuffel, J. So, E. Ward, B. McBride, J. Tuli, S. Yicheng Wang Yixin Zhang Hugh Zhu Rickmann, J. |
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doi_str_mv | 10.1109/TDC.2001.971399 |
format | Conference Proceeding |
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language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Atmospheric measurements Contamination Dielectric loss measurement Dielectric losses Dielectric measurements IEC standards Measurement standards Pollution measurement Testing Voltage measurement |
title | IEEE Std 4 "High voltage testing techniques" past, present and future IEEE/PES/PSIM High Voltage Testing Techniques Subcommittee Report |
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