Prediction of OLED Luminance Using Impedance Measurements
Luminance is the main feature indicating organic light-emitting diode (OLED) degradation; however, this requires delicate photometric measurements that are difficult and costly to realize in situ . In this article, an original luminance decay prediction method not requiring optical measurements will...
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Veröffentlicht in: | IEEE transactions on industry applications 2022-01, Vol.58 (1), p.996-1004 |
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creator | Al Haddad, Andrea Picot, Antoine Canale, Laurent Dupuis, Pascal Zissis, Georges Maussion, Pascal |
description | Luminance is the main feature indicating organic light-emitting diode (OLED) degradation; however, this requires delicate photometric measurements that are difficult and costly to realize in situ . In this article, an original luminance decay prediction method not requiring optical measurements will be presented. Analysis of the impedance revealed a strong correlation between the luminance and the time constant of the equivalent circuit. As a result, the time constant is chosen as the main feature to track OLED degradation, the evolution of which is linearly modeled over time at different stress levels using the design of experiments methodology. Simultaneously, a linear relationship between luminance degradation and the evolution of time constants, in terms of the thermal stress applied, enables prediction of the luminance degradation over time. This method is an accurate novel solution for luminance tracking in particular for data taken inside the experimental plan limits. |
doi_str_mv | 10.1109/TIA.2021.3123096 |
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In this article, an original luminance decay prediction method not requiring optical measurements will be presented. Analysis of the impedance revealed a strong correlation between the luminance and the time constant of the equivalent circuit. As a result, the time constant is chosen as the main feature to track OLED degradation, the evolution of which is linearly modeled over time at different stress levels using the design of experiments methodology. Simultaneously, a linear relationship between luminance degradation and the evolution of time constants, in terms of the thermal stress applied, enables prediction of the luminance degradation over time. 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(IEEE) 2022</rights><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c325t-dee1d11aaa43e892c4750ca9fe164d483633f6b190158fe4875d5fa0dbffd2873</citedby><cites>FETCH-LOGICAL-c325t-dee1d11aaa43e892c4750ca9fe164d483633f6b190158fe4875d5fa0dbffd2873</cites><orcidid>0000-0002-5068-4055 ; 0000-0003-1097-889X ; 0000-0003-0856-0953 ; 0000-0003-2919-8447 ; 0000-0002-7582-5686 ; 0000-0002-2966-9424</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/9591423$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>230,314,776,780,792,881,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/9591423$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttps://hal.science/hal-03437855$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Al Haddad, Andrea</creatorcontrib><creatorcontrib>Picot, Antoine</creatorcontrib><creatorcontrib>Canale, Laurent</creatorcontrib><creatorcontrib>Dupuis, Pascal</creatorcontrib><creatorcontrib>Zissis, Georges</creatorcontrib><creatorcontrib>Maussion, Pascal</creatorcontrib><title>Prediction of OLED Luminance Using Impedance Measurements</title><title>IEEE transactions on industry applications</title><addtitle>TIA</addtitle><description>Luminance is the main feature indicating organic light-emitting diode (OLED) degradation; however, this requires delicate photometric measurements that are difficult and costly to realize in situ . In this article, an original luminance decay prediction method not requiring optical measurements will be presented. Analysis of the impedance revealed a strong correlation between the luminance and the time constant of the equivalent circuit. As a result, the time constant is chosen as the main feature to track OLED degradation, the evolution of which is linearly modeled over time at different stress levels using the design of experiments methodology. Simultaneously, a linear relationship between luminance degradation and the evolution of time constants, in terms of the thermal stress applied, enables prediction of the luminance degradation over time. This method is an accurate novel solution for luminance tracking in particular for data taken inside the experimental plan limits.</description><subject>Degradation</subject><subject>design of experiment (DoE)</subject><subject>Design of experiments</subject><subject>Electronics</subject><subject>Engineering Sciences</subject><subject>Equivalent circuits</subject><subject>Evolution</subject><subject>Impedance</subject><subject>Integrated circuit modeling</subject><subject>luminance</subject><subject>Optical measurement</subject><subject>Optics</subject><subject>organic light emitting diode (OLED)</subject><subject>Organic light emitting diodes</subject><subject>Photodegradation</subject><subject>Photonic</subject><subject>prediction</subject><subject>Stress</subject><subject>Temperature</subject><subject>Temperature measurement</subject><subject>Thermal stress</subject><subject>Time constant</subject><issn>0093-9994</issn><issn>1939-9367</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kE1Lw0AQhhdRsFbvgpeAJw-pO_uRZI-lVluI1EN7XrbZWU1pkrqbCP57U1N6GmZ43pfhIeQe6ASAquf1cjphlMGEA-NUJRdkBIqrWPEkvSQjShWPlVLimtyEsKMUhAQxIurDoy2LtmzqqHHRKp-_RHlXlbWpC4w2oaw_o2V1QPu_v6MJnccK6zbckitn9gHvTnNMNq_z9WwR56u35WyaxwVnso0tIlgAY4zgmClWiFTSwiiHkAgrMp5w7pItKAoycyiyVFrpDLVb5yzLUj4mT0Pvl9nrgy8r4391Y0q9mOb6eKNc8DST8gd69nFgD7757jC0etd0vu7f0yxhQJOUSdFTdKAK34Tg0Z1rgeqjTN3L1EeZ-iSzjzwMkRIRz7iSCgTj_A8pdm29</recordid><startdate>20220101</startdate><enddate>20220101</enddate><creator>Al Haddad, Andrea</creator><creator>Picot, Antoine</creator><creator>Canale, Laurent</creator><creator>Dupuis, Pascal</creator><creator>Zissis, Georges</creator><creator>Maussion, Pascal</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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subjects | Degradation design of experiment (DoE) Design of experiments Electronics Engineering Sciences Equivalent circuits Evolution Impedance Integrated circuit modeling luminance Optical measurement Optics organic light emitting diode (OLED) Organic light emitting diodes Photodegradation Photonic prediction Stress Temperature Temperature measurement Thermal stress Time constant |
title | Prediction of OLED Luminance Using Impedance Measurements |
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