Study and analysis of wounded integrated L-C passive components
The aim of the paper is to present simple and effective methods to study and to analyse wounded integrated L-C components using finite element analysis considering coupled electro-magnetic and electro-static modelling and discrete models. Once the FEA modelling technique is presented, it is applied...
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| creator | Crebier, J.-C. Chevalier, T. Laouamri, K. Ferrieux, J.-P. |
| description | The aim of the paper is to present simple and effective methods to study and to analyse wounded integrated L-C components using finite element analysis considering coupled electro-magnetic and electro-static modelling and discrete models. Once the FEA modelling technique is presented, it is applied to simple winding structures creating a series L-C function. Simulation results are provided and validated with respect to experiments. Then, analysis is performed to understand the behaviour of the component with respect to coupled phenomena. Empirical L-C circuit design formula are validated. A new discrete model is derived from this analysis. It is validated on a regular L-C integrated circuit design. Measurements of the different L-C functions using impedance analyser characterisation are provided. |
| doi_str_mv | 10.1109/PESC.2001.954436 |
| format | Conference Proceeding |
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Once the FEA modelling technique is presented, it is applied to simple winding structures creating a series L-C function. Simulation results are provided and validated with respect to experiments. Then, analysis is performed to understand the behaviour of the component with respect to coupled phenomena. Empirical L-C circuit design formula are validated. A new discrete model is derived from this analysis. It is validated on a regular L-C integrated circuit design. Measurements of the different L-C functions using impedance analyser characterisation are provided.</description><identifier>ISSN: 0275-9306</identifier><identifier>ISBN: 0780370678</identifier><identifier>ISBN: 9780780370678</identifier><identifier>EISSN: 2377-6617</identifier><identifier>DOI: 10.1109/PESC.2001.954436</identifier><language>eng</language><publisher>IEEE</publisher><subject>Capacitors ; Circuit simulation ; Copper ; Coupled mode analysis ; Coupling circuits ; Finite element methods ; Impedance ; Inductors ; Magnetic analysis ; Magnetic cores</subject><ispartof>2001 IEEE 32nd Annual Power Electronics Specialists Conference (IEEE Cat. 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Measurements of the different L-C functions using impedance analyser characterisation are provided.</description><subject>Capacitors</subject><subject>Circuit simulation</subject><subject>Copper</subject><subject>Coupled mode analysis</subject><subject>Coupling circuits</subject><subject>Finite element methods</subject><subject>Impedance</subject><subject>Inductors</subject><subject>Magnetic analysis</subject><subject>Magnetic cores</subject><issn>0275-9306</issn><issn>2377-6617</issn><isbn>0780370678</isbn><isbn>9780780370678</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2001</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj0tLxDAUhYMPsDO6F1f9A6k3SZObrETK-ICCwuh6SJtbqcy0peko_fcWxsXhfGfzwWHsVkAmBLj79822yCSAyJzOc2XOWCIVIjdG4DlbAVpQCAbtBUtAouZOgbliqxi_AbQSoBP2sJ2OYU59F5b4_RzbmPZN-tsfu0AhbbuJvkY_LVjyIh18jO0PpXV_GPqOuiles8vG7yPd_PeafT5tPooXXr49vxaPJW8FyokHG1ST2zondNpAHTCYZVsSyjXeUFPJqs4rRHDBGukIhfVkApD21tlcrdndydsS0W4Y24Mf593pt_oDdx9KRQ</recordid><startdate>2001</startdate><enddate>2001</enddate><creator>Crebier, J.-C.</creator><creator>Chevalier, T.</creator><creator>Laouamri, K.</creator><creator>Ferrieux, J.-P.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>2001</creationdate><title>Study and analysis of wounded integrated L-C passive components</title><author>Crebier, J.-C. ; Chevalier, T. ; Laouamri, K. ; Ferrieux, J.-P.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i172t-d8d3f48c4e79560cd7d6f488e139fa6efb2bc4b7709d8629e718ae6d0e5a89843</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2001</creationdate><topic>Capacitors</topic><topic>Circuit simulation</topic><topic>Copper</topic><topic>Coupled mode analysis</topic><topic>Coupling circuits</topic><topic>Finite element methods</topic><topic>Impedance</topic><topic>Inductors</topic><topic>Magnetic analysis</topic><topic>Magnetic cores</topic><toplevel>online_resources</toplevel><creatorcontrib>Crebier, J.-C.</creatorcontrib><creatorcontrib>Chevalier, T.</creatorcontrib><creatorcontrib>Laouamri, K.</creatorcontrib><creatorcontrib>Ferrieux, J.-P.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Crebier, J.-C.</au><au>Chevalier, T.</au><au>Laouamri, K.</au><au>Ferrieux, J.-P.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Study and analysis of wounded integrated L-C passive components</atitle><btitle>2001 IEEE 32nd Annual Power Electronics Specialists Conference (IEEE Cat. No.01CH37230)</btitle><stitle>PESC</stitle><date>2001</date><risdate>2001</risdate><volume>4</volume><spage>2137</spage><epage>2142 vol. 4</epage><pages>2137-2142 vol. 4</pages><issn>0275-9306</issn><eissn>2377-6617</eissn><isbn>0780370678</isbn><isbn>9780780370678</isbn><abstract>The aim of the paper is to present simple and effective methods to study and to analyse wounded integrated L-C components using finite element analysis considering coupled electro-magnetic and electro-static modelling and discrete models. Once the FEA modelling technique is presented, it is applied to simple winding structures creating a series L-C function. Simulation results are provided and validated with respect to experiments. Then, analysis is performed to understand the behaviour of the component with respect to coupled phenomena. Empirical L-C circuit design formula are validated. A new discrete model is derived from this analysis. It is validated on a regular L-C integrated circuit design. Measurements of the different L-C functions using impedance analyser characterisation are provided.</abstract><pub>IEEE</pub><doi>10.1109/PESC.2001.954436</doi></addata></record> |
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| identifier | ISSN: 0275-9306 |
| ispartof | 2001 IEEE 32nd Annual Power Electronics Specialists Conference (IEEE Cat. No.01CH37230), 2001, Vol.4, p.2137-2142 vol. 4 |
| issn | 0275-9306 2377-6617 |
| language | eng |
| recordid | cdi_ieee_primary_954436 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Capacitors Circuit simulation Copper Coupled mode analysis Coupling circuits Finite element methods Impedance Inductors Magnetic analysis Magnetic cores |
| title | Study and analysis of wounded integrated L-C passive components |
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