A 98.6 dB SNDR SAR ADC With a Mismatch Error Shaping Technique Implemented With Double Sampling
A novel mismatch error shaping (MES) method is proposed in noise-shaping (NS) SAR ADCs to break the SNDR limitation caused by DAC mismatch induced non-linearity. Through sampling the signal twice for one conversion, the input range of the ADC is increased to 2V _{ref} . After the first sampling, onl...
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| Veröffentlicht in: | IEEE transactions on circuits and systems. II, Express briefs Express briefs, 2022-03, Vol.69 (3), p.774-778 |
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| container_title | IEEE transactions on circuits and systems. II, Express briefs |
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| creator | Yang, Chuanshi Qiu, Lei Tang, Kai Zheng, Yuanjin |
| description | A novel mismatch error shaping (MES) method is proposed in noise-shaping (NS) SAR ADCs to break the SNDR limitation caused by DAC mismatch induced non-linearity. Through sampling the signal twice for one conversion, the input range of the ADC is increased to 2V _{ref} . After the first sampling, only the MSB is resolved and the results feed back to the opposite side of the DAC. After the second sampling, the MSB result is reversed and a +\text{V}_{ref} /2 reference is generated at the side of the DAC which has low input while a - \text{V}_{ref} /2 reference is generated at the other side. Through this method, the dynamic range deduction caused by the MES technique is solved. The proposed SAR ADC is implemented in TSMC 65nm CMOS technology. The simulation results show that the new MES method improves the SFDR from 54 dB to 104.5 dB. The SNDR in 20kHz bandwidth is 98.6dB while power consumption is 513.2~ {\mu }\text{W} under a 1 V power supply at 20MS/s sampling rate. |
| doi_str_mv | 10.1109/TCSII.2021.3112501 |
| format | Article |
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Through sampling the signal twice for one conversion, the input range of the ADC is increased to 2V<inline-formula> <tex-math notation="LaTeX">_{ref} </tex-math></inline-formula>. After the first sampling, only the MSB is resolved and the results feed back to the opposite side of the DAC. After the second sampling, the MSB result is reversed and a <inline-formula> <tex-math notation="LaTeX">+\text{V}_{ref} </tex-math></inline-formula>/2 reference is generated at the side of the DAC which has low input while a -<inline-formula> <tex-math notation="LaTeX">\text{V}_{ref} </tex-math></inline-formula>/2 reference is generated at the other side. Through this method, the dynamic range deduction caused by the MES technique is solved. The proposed SAR ADC is implemented in TSMC 65nm CMOS technology. The simulation results show that the new MES method improves the SFDR from 54 dB to 104.5 dB. The SNDR in 20kHz bandwidth is 98.6dB while power consumption is <inline-formula> <tex-math notation="LaTeX">513.2~ {\mu }\text{W} </tex-math></inline-formula> under a 1 V power supply at 20MS/s sampling rate.]]></description><identifier>ISSN: 1549-7747</identifier><identifier>EISSN: 1558-3791</identifier><identifier>DOI: 10.1109/TCSII.2021.3112501</identifier><identifier>CODEN: ITCSFK</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Capacitors ; Circuits and systems ; Deduction ; Dynamic range ; high linearity ; High resolution ; Image edge detection ; Linearity ; mismatch error shaping ; noise shaping ; Power consumption ; Sampling ; SAR ADC ; Signal resolution ; Timing</subject><ispartof>IEEE transactions on circuits and systems. II, Express briefs, 2022-03, Vol.69 (3), p.774-778</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2022</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c225t-e7790f3b9bb88c23b201bf53d7c11b98aac2a7a4d7b5640ab9d796ade442f2aa3</citedby><cites>FETCH-LOGICAL-c225t-e7790f3b9bb88c23b201bf53d7c11b98aac2a7a4d7b5640ab9d796ade442f2aa3</cites><orcidid>0000-0002-5688-7486 ; 0000-0001-5985-3671 ; 0000-0001-8512-3701 ; 0000-0002-5768-367X</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/9536950$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,777,781,793,27905,27906,54739</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/9536950$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Yang, Chuanshi</creatorcontrib><creatorcontrib>Qiu, Lei</creatorcontrib><creatorcontrib>Tang, Kai</creatorcontrib><creatorcontrib>Zheng, Yuanjin</creatorcontrib><title>A 98.6 dB SNDR SAR ADC With a Mismatch Error Shaping Technique Implemented With Double Sampling</title><title>IEEE transactions on circuits and systems. II, Express briefs</title><addtitle>TCSII</addtitle><description><![CDATA[A novel mismatch error shaping (MES) method is proposed in noise-shaping (NS) SAR ADCs to break the SNDR limitation caused by DAC mismatch induced non-linearity. Through sampling the signal twice for one conversion, the input range of the ADC is increased to 2V<inline-formula> <tex-math notation="LaTeX">_{ref} </tex-math></inline-formula>. After the first sampling, only the MSB is resolved and the results feed back to the opposite side of the DAC. After the second sampling, the MSB result is reversed and a <inline-formula> <tex-math notation="LaTeX">+\text{V}_{ref} </tex-math></inline-formula>/2 reference is generated at the side of the DAC which has low input while a -<inline-formula> <tex-math notation="LaTeX">\text{V}_{ref} </tex-math></inline-formula>/2 reference is generated at the other side. Through this method, the dynamic range deduction caused by the MES technique is solved. The proposed SAR ADC is implemented in TSMC 65nm CMOS technology. The simulation results show that the new MES method improves the SFDR from 54 dB to 104.5 dB. The SNDR in 20kHz bandwidth is 98.6dB while power consumption is <inline-formula> <tex-math notation="LaTeX">513.2~ {\mu }\text{W} </tex-math></inline-formula> under a 1 V power supply at 20MS/s sampling rate.]]></description><subject>Capacitors</subject><subject>Circuits and systems</subject><subject>Deduction</subject><subject>Dynamic range</subject><subject>high linearity</subject><subject>High resolution</subject><subject>Image edge detection</subject><subject>Linearity</subject><subject>mismatch error shaping</subject><subject>noise shaping</subject><subject>Power consumption</subject><subject>Sampling</subject><subject>SAR ADC</subject><subject>Signal resolution</subject><subject>Timing</subject><issn>1549-7747</issn><issn>1558-3791</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kFFPgzAQxxujiXP6BfSlic9ge6WUPiKbSjI1GTM-Ni0UYdkAC3vw28tk8ekuuf_v7vJD6JYSn1IiHzZJlqY-EKA-oxQ4oWdoRjmPPCYkPT_2gfSECMQluur7LSEgCYMZUjGWkR_i4hFnb4s1zuI1jhcJ_qyHCmv8Wvd7PeQVXjrXOpxVuqubL7yxedXU3weL0323s3vbDLaYmEV7MDuLMz0Oxug1uij1rrc3pzpHH0_LTfLird6f0yReeTkAHzwrhCQlM9KYKMqBGSDUlJwVIqfUyEjrHLTQQSEMDwOijSyEDHVhgwBK0JrN0f20t3Pt-Fc_qG17cM14UkHIpGQQhnxMwZTKXdv3zpaqc_Veux9FiTqKVH8i1VGkOokcobsJqq21_4DkLJScsF-j4Wyw</recordid><startdate>20220301</startdate><enddate>20220301</enddate><creator>Yang, Chuanshi</creator><creator>Qiu, Lei</creator><creator>Tang, Kai</creator><creator>Zheng, Yuanjin</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-5688-7486</orcidid><orcidid>https://orcid.org/0000-0001-5985-3671</orcidid><orcidid>https://orcid.org/0000-0001-8512-3701</orcidid><orcidid>https://orcid.org/0000-0002-5768-367X</orcidid></search><sort><creationdate>20220301</creationdate><title>A 98.6 dB SNDR SAR ADC With a Mismatch Error Shaping Technique Implemented With Double Sampling</title><author>Yang, Chuanshi ; Qiu, Lei ; Tang, Kai ; Zheng, Yuanjin</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c225t-e7790f3b9bb88c23b201bf53d7c11b98aac2a7a4d7b5640ab9d796ade442f2aa3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>Capacitors</topic><topic>Circuits and systems</topic><topic>Deduction</topic><topic>Dynamic range</topic><topic>high linearity</topic><topic>High resolution</topic><topic>Image edge detection</topic><topic>Linearity</topic><topic>mismatch error shaping</topic><topic>noise shaping</topic><topic>Power consumption</topic><topic>Sampling</topic><topic>SAR ADC</topic><topic>Signal resolution</topic><topic>Timing</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yang, Chuanshi</creatorcontrib><creatorcontrib>Qiu, Lei</creatorcontrib><creatorcontrib>Tang, Kai</creatorcontrib><creatorcontrib>Zheng, Yuanjin</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998–Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on circuits and systems. II, Express briefs</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Yang, Chuanshi</au><au>Qiu, Lei</au><au>Tang, Kai</au><au>Zheng, Yuanjin</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A 98.6 dB SNDR SAR ADC With a Mismatch Error Shaping Technique Implemented With Double Sampling</atitle><jtitle>IEEE transactions on circuits and systems. II, Express briefs</jtitle><stitle>TCSII</stitle><date>2022-03-01</date><risdate>2022</risdate><volume>69</volume><issue>3</issue><spage>774</spage><epage>778</epage><pages>774-778</pages><issn>1549-7747</issn><eissn>1558-3791</eissn><coden>ITCSFK</coden><abstract><![CDATA[A novel mismatch error shaping (MES) method is proposed in noise-shaping (NS) SAR ADCs to break the SNDR limitation caused by DAC mismatch induced non-linearity. Through sampling the signal twice for one conversion, the input range of the ADC is increased to 2V<inline-formula> <tex-math notation="LaTeX">_{ref} </tex-math></inline-formula>. After the first sampling, only the MSB is resolved and the results feed back to the opposite side of the DAC. After the second sampling, the MSB result is reversed and a <inline-formula> <tex-math notation="LaTeX">+\text{V}_{ref} </tex-math></inline-formula>/2 reference is generated at the side of the DAC which has low input while a -<inline-formula> <tex-math notation="LaTeX">\text{V}_{ref} </tex-math></inline-formula>/2 reference is generated at the other side. Through this method, the dynamic range deduction caused by the MES technique is solved. The proposed SAR ADC is implemented in TSMC 65nm CMOS technology. The simulation results show that the new MES method improves the SFDR from 54 dB to 104.5 dB. The SNDR in 20kHz bandwidth is 98.6dB while power consumption is <inline-formula> <tex-math notation="LaTeX">513.2~ {\mu }\text{W} </tex-math></inline-formula> under a 1 V power supply at 20MS/s sampling rate.]]></abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TCSII.2021.3112501</doi><tpages>5</tpages><orcidid>https://orcid.org/0000-0002-5688-7486</orcidid><orcidid>https://orcid.org/0000-0001-5985-3671</orcidid><orcidid>https://orcid.org/0000-0001-8512-3701</orcidid><orcidid>https://orcid.org/0000-0002-5768-367X</orcidid></addata></record> |
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| subjects | Capacitors Circuits and systems Deduction Dynamic range high linearity High resolution Image edge detection Linearity mismatch error shaping noise shaping Power consumption Sampling SAR ADC Signal resolution Timing |
| title | A 98.6 dB SNDR SAR ADC With a Mismatch Error Shaping Technique Implemented With Double Sampling |
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