A process variation compensated comparator for FSK demodulators
An inverter based comparator design is presented. The comparator has inherently process variation compensated structure which makes the threshold voltage of the comparator independent of the process variation. The compensation structure consists of one additional inverter and four triode region oper...
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| container_end_page | 942 vol.2 |
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| creator | Hong-Sun Kim Seoung-Jae Yoo Ismail, M. Olsson, H. |
| description | An inverter based comparator design is presented. The comparator has inherently process variation compensated structure which makes the threshold voltage of the comparator independent of the process variation. The compensation structure consists of one additional inverter and four triode region operating transistors. The comparator is designed for FSK demodulation applications and simulated with 0.35 /spl mu/m CMOS technology. |
| doi_str_mv | 10.1109/MWSCAS.2000.952908 |
| format | Conference Proceeding |
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The comparator has inherently process variation compensated structure which makes the threshold voltage of the comparator independent of the process variation. The compensation structure consists of one additional inverter and four triode region operating transistors. The comparator is designed for FSK demodulation applications and simulated with 0.35 /spl mu/m CMOS technology.</description><identifier>ISBN: 9780780364752</identifier><identifier>ISBN: 0780364759</identifier><identifier>DOI: 10.1109/MWSCAS.2000.952908</identifier><language>eng</language><publisher>IEEE</publisher><subject>Circuits ; CMOS process ; CMOS technology ; Demodulation ; Energy consumption ; Frequency shift keying ; Inverters ; MOSFETs ; Robustness ; Threshold voltage</subject><ispartof>Proceedings of the 43rd IEEE Midwest Symposium on Circuits and Systems (Cat.No.CH37144), 2000, Vol.2, p.940-942 vol.2</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/952908$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2056,4048,4049,27923,54918</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/952908$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Hong-Sun Kim</creatorcontrib><creatorcontrib>Seoung-Jae Yoo</creatorcontrib><creatorcontrib>Ismail, M.</creatorcontrib><creatorcontrib>Olsson, H.</creatorcontrib><title>A process variation compensated comparator for FSK demodulators</title><title>Proceedings of the 43rd IEEE Midwest Symposium on Circuits and Systems (Cat.No.CH37144)</title><addtitle>MWSCAS</addtitle><description>An inverter based comparator design is presented. The comparator has inherently process variation compensated structure which makes the threshold voltage of the comparator independent of the process variation. The compensation structure consists of one additional inverter and four triode region operating transistors. The comparator is designed for FSK demodulation applications and simulated with 0.35 /spl mu/m CMOS technology.</description><subject>Circuits</subject><subject>CMOS process</subject><subject>CMOS technology</subject><subject>Demodulation</subject><subject>Energy consumption</subject><subject>Frequency shift keying</subject><subject>Inverters</subject><subject>MOSFETs</subject><subject>Robustness</subject><subject>Threshold voltage</subject><isbn>9780780364752</isbn><isbn>0780364759</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2000</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotT11LxDAQDIignP0D99Q_0LrZJG3yJKV4Kp74UMXHI-YDKtdLSargvzfnHczuzO7AwBCyplBTCur25WPou6FGAKiVQAXyghSqlZDBGt4KvCJFSl_ZBy5407TX5K4r5xiMS6n80XHUyxgOpQnT7A5JL87-ax31EmLp82yG59K6Kdjv_fGXbsil1_vkijOvyPvm_q1_rLavD099t61G2uJSGQvcUmOkkIAIEj1jn6ZxStC8EKVnJpNtBHIhGQK24OnxcJz77K7I-pQ7Oud2cxwnHX93p5bsD0UtRyQ</recordid><startdate>2000</startdate><enddate>2000</enddate><creator>Hong-Sun Kim</creator><creator>Seoung-Jae Yoo</creator><creator>Ismail, M.</creator><creator>Olsson, H.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>2000</creationdate><title>A process variation compensated comparator for FSK demodulators</title><author>Hong-Sun Kim ; Seoung-Jae Yoo ; Ismail, M. ; Olsson, H.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i172t-cd04d1cc858022082f33bc6e9516e9228f3c922d652458320270f15245e44f8f3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2000</creationdate><topic>Circuits</topic><topic>CMOS process</topic><topic>CMOS technology</topic><topic>Demodulation</topic><topic>Energy consumption</topic><topic>Frequency shift keying</topic><topic>Inverters</topic><topic>MOSFETs</topic><topic>Robustness</topic><topic>Threshold voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Hong-Sun Kim</creatorcontrib><creatorcontrib>Seoung-Jae Yoo</creatorcontrib><creatorcontrib>Ismail, M.</creatorcontrib><creatorcontrib>Olsson, H.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Hong-Sun Kim</au><au>Seoung-Jae Yoo</au><au>Ismail, M.</au><au>Olsson, H.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>A process variation compensated comparator for FSK demodulators</atitle><btitle>Proceedings of the 43rd IEEE Midwest Symposium on Circuits and Systems (Cat.No.CH37144)</btitle><stitle>MWSCAS</stitle><date>2000</date><risdate>2000</risdate><volume>2</volume><spage>940</spage><epage>942 vol.2</epage><pages>940-942 vol.2</pages><isbn>9780780364752</isbn><isbn>0780364759</isbn><abstract>An inverter based comparator design is presented. The comparator has inherently process variation compensated structure which makes the threshold voltage of the comparator independent of the process variation. The compensation structure consists of one additional inverter and four triode region operating transistors. The comparator is designed for FSK demodulation applications and simulated with 0.35 /spl mu/m CMOS technology.</abstract><pub>IEEE</pub><doi>10.1109/MWSCAS.2000.952908</doi></addata></record> |
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| identifier | ISBN: 9780780364752 |
| ispartof | Proceedings of the 43rd IEEE Midwest Symposium on Circuits and Systems (Cat.No.CH37144), 2000, Vol.2, p.940-942 vol.2 |
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| language | eng |
| recordid | cdi_ieee_primary_952908 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Circuits CMOS process CMOS technology Demodulation Energy consumption Frequency shift keying Inverters MOSFETs Robustness Threshold voltage |
| title | A process variation compensated comparator for FSK demodulators |
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