Self-testing of user-programmed FPGAs based on the concept of linear segments

A method for the development of a test plan for BIST-based exhaustive testing of a circuit implemented with an in-system reconfigurable FPGA is presented. A test plan for application-dependent testing of an FPGA is based on the concept of logic cones and linear segments. Linear segments that satisfy...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Tomaszewicz, P., Rawski, M.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Automatic testing Built-in self-test Circuit testing Field programmable gate arrays Logic circuits Logic devices Logic programming Logic testing Registers System testing
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