Method to Measure the Dielectric Parameters of Powders in Subterahertz and Terahertz Ranges
On the base of the high quality Fabry-Perot resonator a method for measuring dielectric parameters, namely, the refractive index ( n ) and tanδ values of powder materials, which does not require the measurement of the poured layer thickness, has been developed. The results of measuring the Al 2 O 3...
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| Veröffentlicht in: | IEEE transactions on terahertz science and technology 2021-07, Vol.11 (4), p.375-380 |
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| container_title | IEEE transactions on terahertz science and technology |
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| creator | Parshin, Vladimir V. Serov, Evgeny A. Vodopyanov, Alexander V. Mansfeld, Dmitry A. |
| description | On the base of the high quality Fabry-Perot resonator a method for measuring dielectric parameters, namely, the refractive index ( n ) and tanδ values of powder materials, which does not require the measurement of the poured layer thickness, has been developed. The results of measuring the Al 2 O 3 , TiO 2 , ZnO, SnO, and WO 3 metal oxide powders in the frequency range 160-253 GHz and in the temperature range 20−360 °C are presented. The method was developed and tested for a detailed understanding of the processes of powders heating and evaporation under the radiation influence of high-power terahertz (submillimeter) gyrotrons with subsequent condensation in the form of highly pure nanopowders. |
| doi_str_mv | 10.1109/TTHZ.2021.3076698 |
| format | Article |
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The results of measuring the Al 2 O 3 , TiO 2 , ZnO, SnO, and WO 3 metal oxide powders in the frequency range 160-253 GHz and in the temperature range 20−360 °C are presented. The method was developed and tested for a detailed understanding of the processes of powders heating and evaporation under the radiation influence of high-power terahertz (submillimeter) gyrotrons with subsequent condensation in the form of highly pure nanopowders.</description><identifier>ISSN: 2156-342X</identifier><identifier>EISSN: 2156-3446</identifier><identifier>DOI: 10.1109/TTHZ.2021.3076698</identifier><identifier>CODEN: ITTSBX</identifier><language>eng</language><publisher>Piscataway: IEEE</publisher><subject>Aluminum oxide ; Cyclotron resonance devices ; Dielectrics ; Fabry–perot resonator ; Frequency measurement ; Frequency ranges ; gyrotrons ; high-power thz radiation ; Measurement methods ; metal oxide powders ; Metal oxides ; microwave absorption ; Optical resonators ; Parameters ; Powders ; Refractive index ; Refractivity ; Resonant frequency ; Terahertz frequencies ; Thickness ; Thickness measurement ; Titanium dioxide ; Zinc oxide</subject><ispartof>IEEE transactions on terahertz science and technology, 2021-07, Vol.11 (4), p.375-380</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2021</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c245t-65c18bc3a6b90f99ca6b0b04fc83ba7f6398ba929c8e3817852ba1f8f2953e243</cites><orcidid>0000-0002-9662-4277 ; 0000-0003-0623-8995 ; 0000-0001-6136-659X</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/9419774$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/9419774$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Parshin, Vladimir V.</creatorcontrib><creatorcontrib>Serov, Evgeny A.</creatorcontrib><creatorcontrib>Vodopyanov, Alexander V.</creatorcontrib><creatorcontrib>Mansfeld, Dmitry A.</creatorcontrib><title>Method to Measure the Dielectric Parameters of Powders in Subterahertz and Terahertz Ranges</title><title>IEEE transactions on terahertz science and technology</title><addtitle>TTHZ</addtitle><description>On the base of the high quality Fabry-Perot resonator a method for measuring dielectric parameters, namely, the refractive index ( n ) and tanδ values of powder materials, which does not require the measurement of the poured layer thickness, has been developed. The results of measuring the Al 2 O 3 , TiO 2 , ZnO, SnO, and WO 3 metal oxide powders in the frequency range 160-253 GHz and in the temperature range 20−360 °C are presented. The method was developed and tested for a detailed understanding of the processes of powders heating and evaporation under the radiation influence of high-power terahertz (submillimeter) gyrotrons with subsequent condensation in the form of highly pure nanopowders.</description><subject>Aluminum oxide</subject><subject>Cyclotron resonance devices</subject><subject>Dielectrics</subject><subject>Fabry–perot resonator</subject><subject>Frequency measurement</subject><subject>Frequency ranges</subject><subject>gyrotrons</subject><subject>high-power thz radiation</subject><subject>Measurement methods</subject><subject>metal oxide powders</subject><subject>Metal oxides</subject><subject>microwave absorption</subject><subject>Optical resonators</subject><subject>Parameters</subject><subject>Powders</subject><subject>Refractive index</subject><subject>Refractivity</subject><subject>Resonant frequency</subject><subject>Terahertz frequencies</subject><subject>Thickness</subject><subject>Thickness measurement</subject><subject>Titanium dioxide</subject><subject>Zinc oxide</subject><issn>2156-342X</issn><issn>2156-3446</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kFtLAzEQhYMoWGp_gPgS8HlrbptNHqVeKrRYdAXRh5BNZ-2WdrcmWUR_vbu0dF7mzHDODHwIXVIyppTomzyffowZYXTMSSalVidowGgqEy6EPD1q9n6ORiGsSVep5CoTA_Q5h7hqljg2eA42tB5wXAG-q2ADLvrK4YX1dgsRfMBNiRfNz7KXVY1f26Lb2hX4-IdtvcT5cXqx9ReEC3RW2k2A0aEP0dvDfT6ZJrPnx6fJ7SxxTKQxkamjqnDcykKTUmvXCVIQUTrFC5uVkmtVWM20U8AVzVTKCktLVTKdcmCCD9H1_u7ON98thGjWTevr7qVhqcikkEqxzkX3LuebEDyUZuerrfW_hhLTYzQ9RtNjNAeMXeZqn6kA4OjXguosE_wfycdufg</recordid><startdate>20210701</startdate><enddate>20210701</enddate><creator>Parshin, Vladimir V.</creator><creator>Serov, Evgeny A.</creator><creator>Vodopyanov, Alexander V.</creator><creator>Mansfeld, Dmitry A.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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| ispartof | IEEE transactions on terahertz science and technology, 2021-07, Vol.11 (4), p.375-380 |
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| source | IEEE Electronic Library (IEL) |
| subjects | Aluminum oxide Cyclotron resonance devices Dielectrics Fabry–perot resonator Frequency measurement Frequency ranges gyrotrons high-power thz radiation Measurement methods metal oxide powders Metal oxides microwave absorption Optical resonators Parameters Powders Refractive index Refractivity Resonant frequency Terahertz frequencies Thickness Thickness measurement Titanium dioxide Zinc oxide |
| title | Method to Measure the Dielectric Parameters of Powders in Subterahertz and Terahertz Ranges |
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