Pressure dependence of secondary NIR scintillation in Ar and Ar/CF/sub 4

Pressure dependence of secondary NIR scintillation in Ar and Ar/CF/sub 4

The variation with charge gain of the total number of photons emitted per electron, in the visible and near-infrared (NIR) regions (400

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Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on nuclear science 2001-06, Vol.48 (3), p.330-335
Hauptverfasser: Fraga, M.M.R., Bueno, C.C., Goncalves, J.A.C., Fraga, F.A.F., Ferreira Marques, R., Policarpo, A.J.P.L.
Format: Artikel
Sprache:eng
Schlagworte:
Argon
Atomic measurements
Charge coupled devices
Charge measurement
Current measurement
Electron emission
Gain measurement
Instruments
Physics
Solid scintillation detectors
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Zusammenfassung:The variation with charge gain of the total number of photons emitted per electron, in the visible and near-infrared (NIR) regions (400
ISSN:0018-9499
1558-1578
DOI:10.1109/23.940075