Research on micro-CL geometric errors
Computed laminography (CL) is a nondestructive testing technique for planar objects. It has been applied in applications like printed circuit board inspection and paleontological fossils research. However, the CL system calibration is a challenging task for complex mechanical structure and many degr...
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| Veröffentlicht in: | IEEE access 2022, p.1-1 |
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| creator | Zhang, Jiajun Shi, Liu Wei, Cunfeng Liu, Baodong Wei, Biao |
| description | Computed laminography (CL) is a nondestructive testing technique for planar objects. It has been applied in applications like printed circuit board inspection and paleontological fossils research. However, the CL system calibration is a challenging task for complex mechanical structure and many degrees of freedom. To evaluated the influence of geometric errors, a new-type microscopic CL (micro-CL) with different kinds of geometric errors was simulated. The results can guide the installation and calibration of a micro-CL scanner. |
| doi_str_mv | 10.1109/ACCESS.2021.3058149 |
| format | Article |
| fullrecord | <record><control><sourceid>crossref_ieee_</sourceid><recordid>TN_cdi_ieee_primary_9350617</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>9350617</ieee_id><sourcerecordid>10_1109_ACCESS_2021_3058149</sourcerecordid><originalsourceid>FETCH-LOGICAL-c2299-c6483b409e66e5dab35b0923f4a845c56703488bc21bc1c715c3462d25aa44943</originalsourceid><addsrcrecordid>eNpNj01LxDAQhoMouOzuL9hLLx5bM5kkTY5LWD-gILjrOaTZqVaslcSL_94uXcS5zDDwvLwPYxvgFQC3t1vndvt9JbiACrkyIO0FWwjQtkSF-vLffc3WOb_zacz0UvWC3TxTppDiWzF-FkMf01i6pnilcaDv1MeCUhpTXrGrLnxkWp_3kr3c7Q7uoWye7h_dtimjENaWUUuDreSWtCZ1DC2qlluBnQxGqqh0zVEa00YBbYRYg4ootTgKFYKUVuKS4Zw79cg5Uee_Uj-E9OOB-5Osn2X9SdafZSdqM1M9Ef0RFhXXUOMv7s9OFA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Research on micro-CL geometric errors</title><source>IEEE Open Access Journals</source><source>DOAJ Directory of Open Access Journals</source><source>EZB-FREE-00999 freely available EZB journals</source><creator>Zhang, Jiajun ; Shi, Liu ; Wei, Cunfeng ; Liu, Baodong ; Wei, Biao</creator><creatorcontrib>Zhang, Jiajun ; Shi, Liu ; Wei, Cunfeng ; Liu, Baodong ; Wei, Biao</creatorcontrib><description>Computed laminography (CL) is a nondestructive testing technique for planar objects. It has been applied in applications like printed circuit board inspection and paleontological fossils research. However, the CL system calibration is a challenging task for complex mechanical structure and many degrees of freedom. To evaluated the influence of geometric errors, a new-type microscopic CL (micro-CL) with different kinds of geometric errors was simulated. The results can guide the installation and calibration of a micro-CL scanner.</description><identifier>ISSN: 2169-3536</identifier><identifier>EISSN: 2169-3536</identifier><identifier>DOI: 10.1109/ACCESS.2021.3058149</identifier><identifier>CODEN: IAECCG</identifier><language>eng</language><publisher>IEEE</publisher><subject>Calibration ; Computed laminography ; Detectors ; Error analysis ; geometric errors analysis ; Image reconstruction ; Lamination ; Simulation ; Trajectory</subject><ispartof>IEEE access, 2022, p.1-1</ispartof><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c2299-c6483b409e66e5dab35b0923f4a845c56703488bc21bc1c715c3462d25aa44943</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/9350617$$EHTML$$P50$$Gieee$$Hfree_for_read</linktohtml><link.rule.ids>314,780,784,864,4024,27633,27923,27924,27925,54933</link.rule.ids></links><search><creatorcontrib>Zhang, Jiajun</creatorcontrib><creatorcontrib>Shi, Liu</creatorcontrib><creatorcontrib>Wei, Cunfeng</creatorcontrib><creatorcontrib>Liu, Baodong</creatorcontrib><creatorcontrib>Wei, Biao</creatorcontrib><title>Research on micro-CL geometric errors</title><title>IEEE access</title><addtitle>Access</addtitle><description>Computed laminography (CL) is a nondestructive testing technique for planar objects. It has been applied in applications like printed circuit board inspection and paleontological fossils research. However, the CL system calibration is a challenging task for complex mechanical structure and many degrees of freedom. To evaluated the influence of geometric errors, a new-type microscopic CL (micro-CL) with different kinds of geometric errors was simulated. The results can guide the installation and calibration of a micro-CL scanner.</description><subject>Calibration</subject><subject>Computed laminography</subject><subject>Detectors</subject><subject>Error analysis</subject><subject>geometric errors analysis</subject><subject>Image reconstruction</subject><subject>Lamination</subject><subject>Simulation</subject><subject>Trajectory</subject><issn>2169-3536</issn><issn>2169-3536</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><sourceid>ESBDL</sourceid><sourceid>RIE</sourceid><recordid>eNpNj01LxDAQhoMouOzuL9hLLx5bM5kkTY5LWD-gILjrOaTZqVaslcSL_94uXcS5zDDwvLwPYxvgFQC3t1vndvt9JbiACrkyIO0FWwjQtkSF-vLffc3WOb_zacz0UvWC3TxTppDiWzF-FkMf01i6pnilcaDv1MeCUhpTXrGrLnxkWp_3kr3c7Q7uoWye7h_dtimjENaWUUuDreSWtCZ1DC2qlluBnQxGqqh0zVEa00YBbYRYg4ootTgKFYKUVuKS4Zw79cg5Uee_Uj-E9OOB-5Osn2X9SdafZSdqM1M9Ef0RFhXXUOMv7s9OFA</recordid><startdate>2022</startdate><enddate>2022</enddate><creator>Zhang, Jiajun</creator><creator>Shi, Liu</creator><creator>Wei, Cunfeng</creator><creator>Liu, Baodong</creator><creator>Wei, Biao</creator><general>IEEE</general><scope>97E</scope><scope>ESBDL</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>2022</creationdate><title>Research on micro-CL geometric errors</title><author>Zhang, Jiajun ; Shi, Liu ; Wei, Cunfeng ; Liu, Baodong ; Wei, Biao</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2299-c6483b409e66e5dab35b0923f4a845c56703488bc21bc1c715c3462d25aa44943</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>Calibration</topic><topic>Computed laminography</topic><topic>Detectors</topic><topic>Error analysis</topic><topic>geometric errors analysis</topic><topic>Image reconstruction</topic><topic>Lamination</topic><topic>Simulation</topic><topic>Trajectory</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zhang, Jiajun</creatorcontrib><creatorcontrib>Shi, Liu</creatorcontrib><creatorcontrib>Wei, Cunfeng</creatorcontrib><creatorcontrib>Liu, Baodong</creatorcontrib><creatorcontrib>Wei, Biao</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE Open Access Journals</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><jtitle>IEEE access</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zhang, Jiajun</au><au>Shi, Liu</au><au>Wei, Cunfeng</au><au>Liu, Baodong</au><au>Wei, Biao</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Research on micro-CL geometric errors</atitle><jtitle>IEEE access</jtitle><stitle>Access</stitle><date>2022</date><risdate>2022</risdate><spage>1</spage><epage>1</epage><pages>1-1</pages><issn>2169-3536</issn><eissn>2169-3536</eissn><coden>IAECCG</coden><abstract>Computed laminography (CL) is a nondestructive testing technique for planar objects. It has been applied in applications like printed circuit board inspection and paleontological fossils research. However, the CL system calibration is a challenging task for complex mechanical structure and many degrees of freedom. To evaluated the influence of geometric errors, a new-type microscopic CL (micro-CL) with different kinds of geometric errors was simulated. The results can guide the installation and calibration of a micro-CL scanner.</abstract><pub>IEEE</pub><doi>10.1109/ACCESS.2021.3058149</doi><tpages>1</tpages><oa>free_for_read</oa></addata></record> |
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| source | IEEE Open Access Journals; DOAJ Directory of Open Access Journals; EZB-FREE-00999 freely available EZB journals |
| subjects | Calibration Computed laminography Detectors Error analysis geometric errors analysis Image reconstruction Lamination Simulation Trajectory |
| title | Research on micro-CL geometric errors |
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