Bloch Surface Wave Assisted Structured Illumination Microscopy for Sub-100 nm Resolution

Structured illumination microscopy (SIM) is one of the most powerful and versatile super-resolution methods due to its live-cell imaging ability of subcellular structures with high speed. In this paper, we propose an alternative SIM assisted by Bloch surface wave (BSW). Through replacing the convent...

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Veröffentlicht in:	IEEE photonics journal 2021-02, Vol.13 (1), p.1-9
Hauptverfasser:	Kong, Weijie, Wang, Changtao, Pu, Mingbo, Ma, Xiaoliang, Li, Xiong, Luo, Xiangang
Format:	Artikel
Sprache:	eng
Schlagworte:	Field of view Fluorescence Fluorescence microscopy Fluoroscopic imaging Illumination Image resolution Imaging Imaging techniques Interference fringes Lighting Microscopes Microscopy Optical imaging Optical microscopy Optical surface waves Photonic crystals Spatial resolution Subwavelength structures Surface waves Wave diffraction
Online-Zugang:	Volltext
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