Characterization of a Reference Test Setup for the Development of HPEM Standards

Given that intentional interference with electronic devices is not bound by legal parameter limitations, formulating standard procedures to adequately probe device immunity poses a challenge. In order to foster such developments, we further characterize a compact reference test setup conceived earli...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	IEEE journal on electromagnetic compatibility practice and applications 2021-03, Vol.3 (1), p.3-6
Hauptverfasser:	Pusch, Thorsten R., Suhrke, Michael, Jorres, Benjamin
Format:	Artikel
Sprache:	eng
Schlagworte:	Couplings Electronic devices Frequency measurement High power electromagnetics Immunity Immunity testing Incidence angle intentional electromagnetic interference Measurement uncertainty Monitoring Narrowband Parameters Probes reference test setup standard development Waveguides
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Schreiben Sie den ersten Kommentar!