Luximos: A 768×64 900-fps Tileable Pipelined X-Ray CMOS Image Sensor for Dental Imaging With 2.6 LSB/nGy Sensitivity
In this letter, a stitched array of 768\times 64 pixels for X-ray dental imaging is presented. The sensor architecture allows to increase the frame rate up to 900 fps thanks to a pipeline approach that minimizes the deadtime between consecutive frames. A column-based ADC converts pixel values in d...
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| Veröffentlicht in: | IEEE solid-state circuits letters 2020, Vol.3, p.406-409 |
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| creator | Massari, Nicola Xu, Hesong Tarolli, Alessandro Parmesan, Luca Perenzoni, Daniele Colpo, Sabrina Fronza, Nicola Stoppa, David Perenzoni, Matteo Maglione, Alfredo |
| description | In this letter, a stitched array of 768\times 64 pixels for X-ray dental imaging is presented. The sensor architecture allows to increase the frame rate up to 900 fps thanks to a pipeline approach that minimizes the deadtime between consecutive frames. A column-based ADC converts pixel values in digital form while an external FPGA performs the operation of time-delay integration accumulation, thus increasing the signal-to-noise ratio. Internal programmable gain allows to achieve a maximum sensitivity of 2.6 LSB/nGy and, at the same time, to extend the dynamic range of the sensor in case of high intensity. The final system consists of two sensors each one having a size of 74.5\times 9 mm, assembled in a PCB and coupled with a high sensitive columnar thallium-doped cesium iodide (CsI(Tl)) scintillator for X-ray conversion. The sensor, fabricated in a standard CMOS 0.15- \mu \text{m} technology with a stitching approach, shows a pixel size of 97 \mu \text{m} . |
| doi_str_mv | 10.1109/LSSC.2020.3023333 |
| format | Article |
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The sensor architecture allows to increase the frame rate up to 900 fps thanks to a pipeline approach that minimizes the deadtime between consecutive frames. A column-based ADC converts pixel values in digital form while an external FPGA performs the operation of time-delay integration accumulation, thus increasing the signal-to-noise ratio. Internal programmable gain allows to achieve a maximum sensitivity of 2.6 LSB/nGy and, at the same time, to extend the dynamic range of the sensor in case of high intensity. The final system consists of two sensors each one having a size of <inline-formula> <tex-math notation="LaTeX">74.5\times 9 </tex-math></inline-formula> mm, assembled in a PCB and coupled with a high sensitive columnar thallium-doped cesium iodide (CsI(Tl)) scintillator for X-ray conversion. The sensor, fabricated in a standard CMOS 0.15-<inline-formula> <tex-math notation="LaTeX">\mu \text{m} </tex-math></inline-formula> technology with a stitching approach, shows a pixel size of 97 <inline-formula> <tex-math notation="LaTeX">\mu \text{m} </tex-math></inline-formula>.]]></description><identifier>ISSN: 2573-9603</identifier><identifier>EISSN: 2573-9603</identifier><identifier>DOI: 10.1109/LSSC.2020.3023333</identifier><identifier>CODEN: ISCLCN</identifier><language>eng</language><publisher>Piscataway: IEEE</publisher><subject>Cesium iodides ; CMOS ; CMOS sensors ; Dentistry ; Detectors ; image sensor ; Imaging ; Pixels ; Scintillation counters ; Scintillators ; Sensitivity ; Sensors ; Signal to noise ratio ; Stitching ; Thallium ; time-delay integration (TDI) ; X ray imagery ; X-ray ; X-ray imaging</subject><ispartof>IEEE solid-state circuits letters, 2020, Vol.3, p.406-409</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2020</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c160t-a9957f9dec421d943ca08af9a94ea43b524d39a8cc825b833beb9aff53e280583</cites><orcidid>0000-0003-1937-4363 ; 0000-0002-1863-4859 ; 0000-0003-0669-5037 ; 0000-0002-0665-115X ; 0000-0001-8777-1593</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/9194762$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,4010,27900,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/9194762$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Massari, Nicola</creatorcontrib><creatorcontrib>Xu, Hesong</creatorcontrib><creatorcontrib>Tarolli, Alessandro</creatorcontrib><creatorcontrib>Parmesan, Luca</creatorcontrib><creatorcontrib>Perenzoni, Daniele</creatorcontrib><creatorcontrib>Colpo, Sabrina</creatorcontrib><creatorcontrib>Fronza, Nicola</creatorcontrib><creatorcontrib>Stoppa, David</creatorcontrib><creatorcontrib>Perenzoni, Matteo</creatorcontrib><creatorcontrib>Maglione, Alfredo</creatorcontrib><title>Luximos: A 768×64 900-fps Tileable Pipelined X-Ray CMOS Image Sensor for Dental Imaging With 2.6 LSB/nGy Sensitivity</title><title>IEEE solid-state circuits letters</title><addtitle>LSSC</addtitle><description><![CDATA[In this letter, a stitched array of <inline-formula> <tex-math notation="LaTeX">768\times 64 </tex-math></inline-formula> pixels for X-ray dental imaging is presented. The sensor architecture allows to increase the frame rate up to 900 fps thanks to a pipeline approach that minimizes the deadtime between consecutive frames. A column-based ADC converts pixel values in digital form while an external FPGA performs the operation of time-delay integration accumulation, thus increasing the signal-to-noise ratio. Internal programmable gain allows to achieve a maximum sensitivity of 2.6 LSB/nGy and, at the same time, to extend the dynamic range of the sensor in case of high intensity. The final system consists of two sensors each one having a size of <inline-formula> <tex-math notation="LaTeX">74.5\times 9 </tex-math></inline-formula> mm, assembled in a PCB and coupled with a high sensitive columnar thallium-doped cesium iodide (CsI(Tl)) scintillator for X-ray conversion. The sensor, fabricated in a standard CMOS 0.15-<inline-formula> <tex-math notation="LaTeX">\mu \text{m} </tex-math></inline-formula> technology with a stitching approach, shows a pixel size of 97 <inline-formula> <tex-math notation="LaTeX">\mu \text{m} </tex-math></inline-formula>.]]></description><subject>Cesium iodides</subject><subject>CMOS</subject><subject>CMOS sensors</subject><subject>Dentistry</subject><subject>Detectors</subject><subject>image sensor</subject><subject>Imaging</subject><subject>Pixels</subject><subject>Scintillation counters</subject><subject>Scintillators</subject><subject>Sensitivity</subject><subject>Sensors</subject><subject>Signal to noise ratio</subject><subject>Stitching</subject><subject>Thallium</subject><subject>time-delay integration (TDI)</subject><subject>X ray imagery</subject><subject>X-ray</subject><subject>X-ray imaging</subject><issn>2573-9603</issn><issn>2573-9603</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpNkNtKw0AQhoMoWLQPIN4seJ10DzmtdzVqLUQqpqJ3yyaZrVvSJGYTMU_iA_lipgfEgWGG4fv_gd-yLgh2CMF8EidJ5FBMscMwZUMdWSPqBczmPmbH__ZTa2zMGmNMOPEZDkdWF3dfelOZazRFgR_-fPsu4hjbqjZoqQuQaQHoSddQ6BJy9GY_yx5Fj4sEzTdyBSiB0lQNUkPfQtnKYnfX5Qq96vYdUcdHcXIzKWf9DtWt_tRtf26dKFkYGB_mmfVyf7eMHux4MZtH09jOiI9bW3LuBYrnkLmU5NxlmcShVFxyF6TLUo-6OeMyzLKQemnIWAopl0p5DGiIvZCdWVd737qpPjowrVhXXVMOLwV1PUIGS48MFNlTWVMZ04ASdaM3sukFwWIbsNgGLLYBi0PAg-Zyr9EA8MfzwTHwKfsFyCZ0AQ</recordid><startdate>2020</startdate><enddate>2020</enddate><creator>Massari, Nicola</creator><creator>Xu, Hesong</creator><creator>Tarolli, Alessandro</creator><creator>Parmesan, Luca</creator><creator>Perenzoni, Daniele</creator><creator>Colpo, Sabrina</creator><creator>Fronza, Nicola</creator><creator>Stoppa, David</creator><creator>Perenzoni, Matteo</creator><creator>Maglione, Alfredo</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0003-1937-4363</orcidid><orcidid>https://orcid.org/0000-0002-1863-4859</orcidid><orcidid>https://orcid.org/0000-0003-0669-5037</orcidid><orcidid>https://orcid.org/0000-0002-0665-115X</orcidid><orcidid>https://orcid.org/0000-0001-8777-1593</orcidid></search><sort><creationdate>2020</creationdate><title>Luximos: A 768×64 900-fps Tileable Pipelined X-Ray CMOS Image Sensor for Dental Imaging With 2.6 LSB/nGy Sensitivity</title><author>Massari, Nicola ; Xu, Hesong ; Tarolli, Alessandro ; Parmesan, Luca ; Perenzoni, Daniele ; Colpo, Sabrina ; Fronza, Nicola ; Stoppa, David ; Perenzoni, Matteo ; Maglione, Alfredo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c160t-a9957f9dec421d943ca08af9a94ea43b524d39a8cc825b833beb9aff53e280583</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Cesium iodides</topic><topic>CMOS</topic><topic>CMOS sensors</topic><topic>Dentistry</topic><topic>Detectors</topic><topic>image sensor</topic><topic>Imaging</topic><topic>Pixels</topic><topic>Scintillation counters</topic><topic>Scintillators</topic><topic>Sensitivity</topic><topic>Sensors</topic><topic>Signal to noise ratio</topic><topic>Stitching</topic><topic>Thallium</topic><topic>time-delay integration (TDI)</topic><topic>X ray imagery</topic><topic>X-ray</topic><topic>X-ray imaging</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Massari, Nicola</creatorcontrib><creatorcontrib>Xu, Hesong</creatorcontrib><creatorcontrib>Tarolli, Alessandro</creatorcontrib><creatorcontrib>Parmesan, Luca</creatorcontrib><creatorcontrib>Perenzoni, Daniele</creatorcontrib><creatorcontrib>Colpo, Sabrina</creatorcontrib><creatorcontrib>Fronza, Nicola</creatorcontrib><creatorcontrib>Stoppa, David</creatorcontrib><creatorcontrib>Perenzoni, Matteo</creatorcontrib><creatorcontrib>Maglione, Alfredo</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE solid-state circuits letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Massari, Nicola</au><au>Xu, Hesong</au><au>Tarolli, Alessandro</au><au>Parmesan, Luca</au><au>Perenzoni, Daniele</au><au>Colpo, Sabrina</au><au>Fronza, Nicola</au><au>Stoppa, David</au><au>Perenzoni, Matteo</au><au>Maglione, Alfredo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Luximos: A 768×64 900-fps Tileable Pipelined X-Ray CMOS Image Sensor for Dental Imaging With 2.6 LSB/nGy Sensitivity</atitle><jtitle>IEEE solid-state circuits letters</jtitle><stitle>LSSC</stitle><date>2020</date><risdate>2020</risdate><volume>3</volume><spage>406</spage><epage>409</epage><pages>406-409</pages><issn>2573-9603</issn><eissn>2573-9603</eissn><coden>ISCLCN</coden><abstract><![CDATA[In this letter, a stitched array of <inline-formula> <tex-math notation="LaTeX">768\times 64 </tex-math></inline-formula> pixels for X-ray dental imaging is presented. The sensor architecture allows to increase the frame rate up to 900 fps thanks to a pipeline approach that minimizes the deadtime between consecutive frames. A column-based ADC converts pixel values in digital form while an external FPGA performs the operation of time-delay integration accumulation, thus increasing the signal-to-noise ratio. Internal programmable gain allows to achieve a maximum sensitivity of 2.6 LSB/nGy and, at the same time, to extend the dynamic range of the sensor in case of high intensity. The final system consists of two sensors each one having a size of <inline-formula> <tex-math notation="LaTeX">74.5\times 9 </tex-math></inline-formula> mm, assembled in a PCB and coupled with a high sensitive columnar thallium-doped cesium iodide (CsI(Tl)) scintillator for X-ray conversion. The sensor, fabricated in a standard CMOS 0.15-<inline-formula> <tex-math notation="LaTeX">\mu \text{m} </tex-math></inline-formula> technology with a stitching approach, shows a pixel size of 97 <inline-formula> <tex-math notation="LaTeX">\mu \text{m} </tex-math></inline-formula>.]]></abstract><cop>Piscataway</cop><pub>IEEE</pub><doi>10.1109/LSSC.2020.3023333</doi><tpages>4</tpages><orcidid>https://orcid.org/0000-0003-1937-4363</orcidid><orcidid>https://orcid.org/0000-0002-1863-4859</orcidid><orcidid>https://orcid.org/0000-0003-0669-5037</orcidid><orcidid>https://orcid.org/0000-0002-0665-115X</orcidid><orcidid>https://orcid.org/0000-0001-8777-1593</orcidid></addata></record> |
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| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Cesium iodides CMOS CMOS sensors Dentistry Detectors image sensor Imaging Pixels Scintillation counters Scintillators Sensitivity Sensors Signal to noise ratio Stitching Thallium time-delay integration (TDI) X ray imagery X-ray X-ray imaging |
| title | Luximos: A 768×64 900-fps Tileable Pipelined X-Ray CMOS Image Sensor for Dental Imaging With 2.6 LSB/nGy Sensitivity |
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