Joint Modeling of Degradation and Lifetime Data for RUL Prediction of Deteriorating Products
Degradation is one of the major root causes of system failure. In some applications, the degradation levels are different upon failure, in which the fixed failure threshold assumption commonly adopted in the degradation literature may not hold. This article tackles the difficulty by jointly analyzin...
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Veröffentlicht in: | IEEE transactions on industrial informatics 2021-07, Vol.17 (7), p.4521-4531 |
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Format: | Artikel |
Sprache: | eng |
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