"Polychromator"-a Method for Studying the Selective Integral Photosensitivity of Semiconductor Materials and Devices

A new technique is proposed, verified, and described for measuring photosensitivity spectra of semiconductor materials and devices in the wavelength range of 200-4100 nm utilizing an innovative setup termed "Polychromator" with a system of cut-off optical filters that provide a sharp edge...

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Veröffentlicht in:	IEEE transactions on instrumentation and measurement 2021, Vol.70, p.1-6
Hauptverfasser:	Jibuti, Zurab, Sakharova, Tatiana, Khuchua, Nina, Tigishvili, Marina, Melkadze, Revaz, Dolidze, Nugzar, Jibuti, Lado, Heuken, Michael
Format:	Artikel
Sprache:	eng
Schlagworte:	Aluminum gallium nitride Aluminum gallium nitrides Heterostructures Indium gallium arsenides Infrared radiation Integrals Materials selection Optical filters P-i-n diodes Photodiodes Photosensitivity Selective integrated photosensitivity spectra Semiconductor device measurement Semiconductor materials semiconductor photodiodes system of optical filters Wavelength measurement Wide band gap semiconductors “polychromator” as a method of optical measurements
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