A Retrospective and Prospective View of Approximate Computing [Point of View

Computing systems are conventionally designed to operate as accurately as possible. However, this trend faces severe technology challenges, such as power consumption, circuit reliability, and high performance. For nearly half a century, performance and power consumption of computing systems have bee...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Proceedings of the IEEE 2020-03, Vol.108 (3), p.394-399
Hauptverfasser: Liu, Weiqiang, Lombardi, Fabrizio, Shulte, Michael
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 399
container_issue 3
container_start_page 394
container_title Proceedings of the IEEE
container_volume 108
creator Liu, Weiqiang
Lombardi, Fabrizio
Shulte, Michael
description Computing systems are conventionally designed to operate as accurately as possible. However, this trend faces severe technology challenges, such as power consumption, circuit reliability, and high performance. For nearly half a century, performance and power consumption of computing systems have been consistently improved by relying mostly on technology scaling. As per Dennard's scaling, the size of a transistor has been considerably shrunk and the supply voltage has been reduced over the years, such that circuits operate at higher frequencies but nearly at the same power dissipation level. However, as Dennard's scaling tends toward an end, it is difficult to further improve performance under the same power constraints. Power consumption has been a major concern, and it is now an industry-wide problem of critical importance. In addition to power, reliability deteriorates when the feature size of complementary metal-oxide-semiconductor (CMOS) technology is reduced below 7 nm, because parameter variations and faults at advanced nanoscales become difficult to control and prevent. Thus, to ensure the complete accuracy of signals, logic values, devices, and interconnects, manufacturing and verification costs will increase significantly.
doi_str_mv 10.1109/JPROC.2020.2975695
format Article
fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_ieee_primary_9024190</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>9024190</ieee_id><sourcerecordid>2374685487</sourcerecordid><originalsourceid>FETCH-LOGICAL-c405t-dd919f27cf55760cc4ba8be5a35d647ab4a4ff7ba451d1caccf1f95abf43e1673</originalsourceid><addsrcrecordid>eNpNkMtOwzAQRS0EEqXwA7CxxDrBr7HjZRXxVKVWFbBhYTmOjVLRJCQuj78noRViNRrNvTN3DkLnlKSUEn31sFwt8pQRRlKmFUgNB2hCAbKEMZCHaEIIzRLNqD5GJ32_JoRwkHyC5jO88rFr-ta7WH14bOsSL__1z5X_xE3As7btmq9qY6PHebNpt7GqX_HLsqnqOM5H3Sk6Cvat92f7OkVPN9eP-V0yX9ze57N54gSBmJSlpjow5QKAksQ5Udis8GA5lFIoWwgrQlCFFUBL6qxzgQYNtgiCeyoVn6LL3d4h0vvW99Gsm21XDycN40rIDEQ2qthO5YZ3-s4H03ZD_u7bUGJGauaXmhmpmT21wXSxM1Xe-z-DJkxQTfgPtN1pwg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2374685487</pqid></control><display><type>article</type><title>A Retrospective and Prospective View of Approximate Computing [Point of View</title><source>IEEE Electronic Library (IEL)</source><creator>Liu, Weiqiang ; Lombardi, Fabrizio ; Shulte, Michael</creator><creatorcontrib>Liu, Weiqiang ; Lombardi, Fabrizio ; Shulte, Michael</creatorcontrib><description>Computing systems are conventionally designed to operate as accurately as possible. However, this trend faces severe technology challenges, such as power consumption, circuit reliability, and high performance. For nearly half a century, performance and power consumption of computing systems have been consistently improved by relying mostly on technology scaling. As per Dennard's scaling, the size of a transistor has been considerably shrunk and the supply voltage has been reduced over the years, such that circuits operate at higher frequencies but nearly at the same power dissipation level. However, as Dennard's scaling tends toward an end, it is difficult to further improve performance under the same power constraints. Power consumption has been a major concern, and it is now an industry-wide problem of critical importance. In addition to power, reliability deteriorates when the feature size of complementary metal-oxide-semiconductor (CMOS) technology is reduced below 7 nm, because parameter variations and faults at advanced nanoscales become difficult to control and prevent. Thus, to ensure the complete accuracy of signals, logic values, devices, and interconnects, manufacturing and verification costs will increase significantly.</description><identifier>ISSN: 0018-9219</identifier><identifier>EISSN: 1558-2256</identifier><identifier>DOI: 10.1109/JPROC.2020.2975695</identifier><identifier>CODEN: IEEPAD</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Circuit reliability ; CMOS ; CMOS technology ; Computation ; Energy consumption ; Integrated circuit reliability ; Performance enhancement ; Power consumption ; Power demand ; Power dissipation ; Power management ; Power system reliability ; Scaling ; Transistors</subject><ispartof>Proceedings of the IEEE, 2020-03, Vol.108 (3), p.394-399</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2020</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c405t-dd919f27cf55760cc4ba8be5a35d647ab4a4ff7ba451d1caccf1f95abf43e1673</citedby><cites>FETCH-LOGICAL-c405t-dd919f27cf55760cc4ba8be5a35d647ab4a4ff7ba451d1caccf1f95abf43e1673</cites><orcidid>0000-0001-8398-8648</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/9024190$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27923,27924,54757</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/9024190$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Liu, Weiqiang</creatorcontrib><creatorcontrib>Lombardi, Fabrizio</creatorcontrib><creatorcontrib>Shulte, Michael</creatorcontrib><title>A Retrospective and Prospective View of Approximate Computing [Point of View</title><title>Proceedings of the IEEE</title><addtitle>JPROC</addtitle><description>Computing systems are conventionally designed to operate as accurately as possible. However, this trend faces severe technology challenges, such as power consumption, circuit reliability, and high performance. For nearly half a century, performance and power consumption of computing systems have been consistently improved by relying mostly on technology scaling. As per Dennard's scaling, the size of a transistor has been considerably shrunk and the supply voltage has been reduced over the years, such that circuits operate at higher frequencies but nearly at the same power dissipation level. However, as Dennard's scaling tends toward an end, it is difficult to further improve performance under the same power constraints. Power consumption has been a major concern, and it is now an industry-wide problem of critical importance. In addition to power, reliability deteriorates when the feature size of complementary metal-oxide-semiconductor (CMOS) technology is reduced below 7 nm, because parameter variations and faults at advanced nanoscales become difficult to control and prevent. Thus, to ensure the complete accuracy of signals, logic values, devices, and interconnects, manufacturing and verification costs will increase significantly.</description><subject>Circuit reliability</subject><subject>CMOS</subject><subject>CMOS technology</subject><subject>Computation</subject><subject>Energy consumption</subject><subject>Integrated circuit reliability</subject><subject>Performance enhancement</subject><subject>Power consumption</subject><subject>Power demand</subject><subject>Power dissipation</subject><subject>Power management</subject><subject>Power system reliability</subject><subject>Scaling</subject><subject>Transistors</subject><issn>0018-9219</issn><issn>1558-2256</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpNkMtOwzAQRS0EEqXwA7CxxDrBr7HjZRXxVKVWFbBhYTmOjVLRJCQuj78noRViNRrNvTN3DkLnlKSUEn31sFwt8pQRRlKmFUgNB2hCAbKEMZCHaEIIzRLNqD5GJ32_JoRwkHyC5jO88rFr-ta7WH14bOsSL__1z5X_xE3As7btmq9qY6PHebNpt7GqX_HLsqnqOM5H3Sk6Cvat92f7OkVPN9eP-V0yX9ze57N54gSBmJSlpjow5QKAksQ5Udis8GA5lFIoWwgrQlCFFUBL6qxzgQYNtgiCeyoVn6LL3d4h0vvW99Gsm21XDycN40rIDEQ2qthO5YZ3-s4H03ZD_u7bUGJGauaXmhmpmT21wXSxM1Xe-z-DJkxQTfgPtN1pwg</recordid><startdate>20200301</startdate><enddate>20200301</enddate><creator>Liu, Weiqiang</creator><creator>Lombardi, Fabrizio</creator><creator>Shulte, Michael</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0001-8398-8648</orcidid></search><sort><creationdate>20200301</creationdate><title>A Retrospective and Prospective View of Approximate Computing [Point of View</title><author>Liu, Weiqiang ; Lombardi, Fabrizio ; Shulte, Michael</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c405t-dd919f27cf55760cc4ba8be5a35d647ab4a4ff7ba451d1caccf1f95abf43e1673</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Circuit reliability</topic><topic>CMOS</topic><topic>CMOS technology</topic><topic>Computation</topic><topic>Energy consumption</topic><topic>Integrated circuit reliability</topic><topic>Performance enhancement</topic><topic>Power consumption</topic><topic>Power demand</topic><topic>Power dissipation</topic><topic>Power management</topic><topic>Power system reliability</topic><topic>Scaling</topic><topic>Transistors</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Liu, Weiqiang</creatorcontrib><creatorcontrib>Lombardi, Fabrizio</creatorcontrib><creatorcontrib>Shulte, Michael</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Proceedings of the IEEE</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Liu, Weiqiang</au><au>Lombardi, Fabrizio</au><au>Shulte, Michael</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A Retrospective and Prospective View of Approximate Computing [Point of View</atitle><jtitle>Proceedings of the IEEE</jtitle><stitle>JPROC</stitle><date>2020-03-01</date><risdate>2020</risdate><volume>108</volume><issue>3</issue><spage>394</spage><epage>399</epage><pages>394-399</pages><issn>0018-9219</issn><eissn>1558-2256</eissn><coden>IEEPAD</coden><abstract>Computing systems are conventionally designed to operate as accurately as possible. However, this trend faces severe technology challenges, such as power consumption, circuit reliability, and high performance. For nearly half a century, performance and power consumption of computing systems have been consistently improved by relying mostly on technology scaling. As per Dennard's scaling, the size of a transistor has been considerably shrunk and the supply voltage has been reduced over the years, such that circuits operate at higher frequencies but nearly at the same power dissipation level. However, as Dennard's scaling tends toward an end, it is difficult to further improve performance under the same power constraints. Power consumption has been a major concern, and it is now an industry-wide problem of critical importance. In addition to power, reliability deteriorates when the feature size of complementary metal-oxide-semiconductor (CMOS) technology is reduced below 7 nm, because parameter variations and faults at advanced nanoscales become difficult to control and prevent. Thus, to ensure the complete accuracy of signals, logic values, devices, and interconnects, manufacturing and verification costs will increase significantly.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/JPROC.2020.2975695</doi><tpages>6</tpages><orcidid>https://orcid.org/0000-0001-8398-8648</orcidid><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0018-9219
ispartof Proceedings of the IEEE, 2020-03, Vol.108 (3), p.394-399
issn 0018-9219
1558-2256
language eng
recordid cdi_ieee_primary_9024190
source IEEE Electronic Library (IEL)
subjects Circuit reliability
CMOS
CMOS technology
Computation
Energy consumption
Integrated circuit reliability
Performance enhancement
Power consumption
Power demand
Power dissipation
Power management
Power system reliability
Scaling
Transistors
title A Retrospective and Prospective View of Approximate Computing [Point of View
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-09T04%3A57%3A09IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%20Retrospective%20and%20Prospective%20View%20of%20Approximate%20Computing%20%5BPoint%20of%20View&rft.jtitle=Proceedings%20of%20the%20IEEE&rft.au=Liu,%20Weiqiang&rft.date=2020-03-01&rft.volume=108&rft.issue=3&rft.spage=394&rft.epage=399&rft.pages=394-399&rft.issn=0018-9219&rft.eissn=1558-2256&rft.coden=IEEPAD&rft_id=info:doi/10.1109/JPROC.2020.2975695&rft_dat=%3Cproquest_RIE%3E2374685487%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2374685487&rft_id=info:pmid/&rft_ieee_id=9024190&rfr_iscdi=true