Modification of the Extended Advanced IEM for Scattering From Randomly Rough Surfaces
In this letter, we modify the extended advanced integral equation model (EAIEM) for electromagnetic backscattering and bistatic scattering from rough surfaces with small to moderate heights. We extend the first-order approximation of the error function as introduced in the EAIEM model to the second...
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| Veröffentlicht in: | IEEE geoscience and remote sensing letters 2021-02, Vol.18 (2), p.236-240 |
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| creator | Yang, Jingsong Li, Yongxing Shi, J. C. Du, Yang |
| description | In this letter, we modify the extended advanced integral equation model (EAIEM) for electromagnetic backscattering and bistatic scattering from rough surfaces with small to moderate heights. We extend the first-order approximation of the error function as introduced in the EAIEM model to the second order, in a hope to be more suitable for large roughness and high frequency. In addition, a new transition model for the reflection coefficient is proposed to make the dependences explicit on the mean surface curvature, frequency, and dielectric constant, whereas making no use of the complementary term, the effect of inadequate evaluation of this term is mitigated. Comparison with POLARSCAT data for backscattering and with European Microwave Signature Laboratory (EMSL) measurements for bistatic scattering demonstrates the validity of the updated model. |
| doi_str_mv | 10.1109/LGRS.2020.2971532 |
| format | Article |
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Comparison with POLARSCAT data for backscattering and with European Microwave Signature Laboratory (EMSL) measurements for bistatic scattering demonstrates the validity of the updated model.</description><identifier>ISSN: 1545-598X</identifier><identifier>EISSN: 1558-0571</identifier><identifier>DOI: 10.1109/LGRS.2020.2971532</identifier><identifier>CODEN: IGRSBY</identifier><language>eng</language><publisher>Piscataway: IEEE</publisher><subject>Approximation ; Backscatter ; Backscattering ; Bistatic scattering ; Dielectric constant ; error function ; Error functions ; Green's function methods ; High frequency ; integral equation method (IEM) ; Integral equations ; Mathematical analysis ; Mathematical model ; Microwave signatures ; Reflectance ; rough surface ; Rough surfaces ; Roughness ; Scattering ; Surface roughness ; Surface waves ; transition model</subject><ispartof>IEEE geoscience and remote sensing letters, 2021-02, Vol.18 (2), p.236-240</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. 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Comparison with POLARSCAT data for backscattering and with European Microwave Signature Laboratory (EMSL) measurements for bistatic scattering demonstrates the validity of the updated model.</description><subject>Approximation</subject><subject>Backscatter</subject><subject>Backscattering</subject><subject>Bistatic scattering</subject><subject>Dielectric constant</subject><subject>error function</subject><subject>Error functions</subject><subject>Green's function methods</subject><subject>High frequency</subject><subject>integral equation method (IEM)</subject><subject>Integral equations</subject><subject>Mathematical analysis</subject><subject>Mathematical model</subject><subject>Microwave signatures</subject><subject>Reflectance</subject><subject>rough surface</subject><subject>Rough surfaces</subject><subject>Roughness</subject><subject>Scattering</subject><subject>Surface roughness</subject><subject>Surface waves</subject><subject>transition model</subject><issn>1545-598X</issn><issn>1558-0571</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kNFqwjAUhsPYYM7tAcZuAruuO0kTk1yKqBOUgU7YXUibRCvauLQd8-3Xouzq_HC-_xz4EHomMCAE1NtitloPKFAYUCUIT-kN6hHOZQJckNsuM55wJb_u0UNV7QEok1L00GYZbOGL3NRFKHHwuN45PPmtXWmdxSP7Y8q8DfPJEvsQ8boFaxeLcounMRzxypQ2HA9nvArNdofXTfQmd9UjuvPmULmn6-yjzXTyOX5PFh-z-Xi0SHLKeJ1IC4wQ5jOXgRNgUsU4pJJSJ41iTlIJ1uWpymS7IKkUQiiVWZNnRsDQ-7SPXi93TzF8N66q9T40sWxfasqEklISxVuKXKg8hqqKzutTLI4mnjUB3dnTnT3d2dNXe23n5dIpnHP_vAIYynb7B9BUanE</recordid><startdate>20210201</startdate><enddate>20210201</enddate><creator>Yang, Jingsong</creator><creator>Li, Yongxing</creator><creator>Shi, J. 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| subjects | Approximation Backscatter Backscattering Bistatic scattering Dielectric constant error function Error functions Green's function methods High frequency integral equation method (IEM) Integral equations Mathematical analysis Mathematical model Microwave signatures Reflectance rough surface Rough surfaces Roughness Scattering Surface roughness Surface waves transition model |
| title | Modification of the Extended Advanced IEM for Scattering From Randomly Rough Surfaces |
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