Short-wavelength InGaAlP visible laser diodes

Results achieved on the operation of short-wavelength InGaAlP visible-light laser diodes are described. It is found that there is a strong correlation between operation temperature and oscillation wavelength. The deterioration of favorable temperature characteristics in the short-wavelength region i...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE journal of quantum electronics 1991-06, Vol.27 (6), p.1476-1482
Hauptverfasser: Hatakoshi, G., Itaya, K., Ishikawa, M., Okajima, M., Uematsu, Y.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 1482
container_issue 6
container_start_page 1476
container_title IEEE journal of quantum electronics
container_volume 27
creator Hatakoshi, G.
Itaya, K.
Ishikawa, M.
Okajima, M.
Uematsu, Y.
description Results achieved on the operation of short-wavelength InGaAlP visible-light laser diodes are described. It is found that there is a strong correlation between operation temperature and oscillation wavelength. The deterioration of favorable temperature characteristics in the short-wavelength region is attributed to an increase in the leakage current, which originates in a small conduction-band discontinuity inherent in the InGaAlP material system. The introduction of a highly doped p-cladding layer improves these temperature characteristics. Short-wavelength oscillation at 630-nm-band wavelength was achieved for transverse-mode stabilized InGaAlP lasers.< >
doi_str_mv 10.1109/3.89966
format Article
fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_ieee_primary_89966</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>89966</ieee_id><sourcerecordid>28574721</sourcerecordid><originalsourceid>FETCH-LOGICAL-c301t-f02e6bde5e46f4b950e3ebf111130c8a2e7e3ae2b2fefe63f30629d7413e5d8e3</originalsourceid><addsrcrecordid>eNo9kM9LwzAYhoMoOKd49taD6CkzP9vkOMacg4GCeg5p-8VFsnYm3cT_3mrH3svHy_fwHF6ErimZUEr0A58orfP8BI2olArTgvJTNCKEKqypLs7RRUqffRVCkRHCr-s2dvjb7iFA89Gts2WzsNPwku198mWALNgEMat9W0O6RGfOhgRXhztG74_zt9kTXj0vlrPpClec0A47wiAva5AgcidKLQlwKB3tw0mlLIMCuAVWMgcOcu44yZmuC0E5yFoBH6O7wbuN7dcOUmc2PlUQgm2g3SXDlCxEwWgP3g9gFduUIjizjX5j44-hxPzNYbj5n6Mnbw9KmyobXLRN5dMRF1r2StFjNwPmAeD4HRS_5Ztl3A</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>28574721</pqid></control><display><type>article</type><title>Short-wavelength InGaAlP visible laser diodes</title><source>IEEE Electronic Library (IEL)</source><creator>Hatakoshi, G. ; Itaya, K. ; Ishikawa, M. ; Okajima, M. ; Uematsu, Y.</creator><creatorcontrib>Hatakoshi, G. ; Itaya, K. ; Ishikawa, M. ; Okajima, M. ; Uematsu, Y.</creatorcontrib><description>Results achieved on the operation of short-wavelength InGaAlP visible-light laser diodes are described. It is found that there is a strong correlation between operation temperature and oscillation wavelength. The deterioration of favorable temperature characteristics in the short-wavelength region is attributed to an increase in the leakage current, which originates in a small conduction-band discontinuity inherent in the InGaAlP material system. The introduction of a highly doped p-cladding layer improves these temperature characteristics. Short-wavelength oscillation at 630-nm-band wavelength was achieved for transverse-mode stabilized InGaAlP lasers.&lt; &gt;</description><identifier>ISSN: 0018-9197</identifier><identifier>EISSN: 1558-1713</identifier><identifier>DOI: 10.1109/3.89966</identifier><identifier>CODEN: IEJQA7</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Diode lasers ; Exact sciences and technology ; Fundamental areas of phenomenology (including applications) ; Information processing ; Laser stability ; Lasers ; Leakage current ; Light sources ; Optical materials ; Optics ; Photonic band gap ; Physics ; Power generation ; Power lasers ; Semiconductor lasers; laser diodes ; Temperature</subject><ispartof>IEEE journal of quantum electronics, 1991-06, Vol.27 (6), p.1476-1482</ispartof><rights>1992 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c301t-f02e6bde5e46f4b950e3ebf111130c8a2e7e3ae2b2fefe63f30629d7413e5d8e3</citedby><cites>FETCH-LOGICAL-c301t-f02e6bde5e46f4b950e3ebf111130c8a2e7e3ae2b2fefe63f30629d7413e5d8e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/89966$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27923,27924,54757</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/89966$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=4955744$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Hatakoshi, G.</creatorcontrib><creatorcontrib>Itaya, K.</creatorcontrib><creatorcontrib>Ishikawa, M.</creatorcontrib><creatorcontrib>Okajima, M.</creatorcontrib><creatorcontrib>Uematsu, Y.</creatorcontrib><title>Short-wavelength InGaAlP visible laser diodes</title><title>IEEE journal of quantum electronics</title><addtitle>JQE</addtitle><description>Results achieved on the operation of short-wavelength InGaAlP visible-light laser diodes are described. It is found that there is a strong correlation between operation temperature and oscillation wavelength. The deterioration of favorable temperature characteristics in the short-wavelength region is attributed to an increase in the leakage current, which originates in a small conduction-band discontinuity inherent in the InGaAlP material system. The introduction of a highly doped p-cladding layer improves these temperature characteristics. Short-wavelength oscillation at 630-nm-band wavelength was achieved for transverse-mode stabilized InGaAlP lasers.&lt; &gt;</description><subject>Diode lasers</subject><subject>Exact sciences and technology</subject><subject>Fundamental areas of phenomenology (including applications)</subject><subject>Information processing</subject><subject>Laser stability</subject><subject>Lasers</subject><subject>Leakage current</subject><subject>Light sources</subject><subject>Optical materials</subject><subject>Optics</subject><subject>Photonic band gap</subject><subject>Physics</subject><subject>Power generation</subject><subject>Power lasers</subject><subject>Semiconductor lasers; laser diodes</subject><subject>Temperature</subject><issn>0018-9197</issn><issn>1558-1713</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1991</creationdate><recordtype>article</recordtype><recordid>eNo9kM9LwzAYhoMoOKd49taD6CkzP9vkOMacg4GCeg5p-8VFsnYm3cT_3mrH3svHy_fwHF6ErimZUEr0A58orfP8BI2olArTgvJTNCKEKqypLs7RRUqffRVCkRHCr-s2dvjb7iFA89Gts2WzsNPwku198mWALNgEMat9W0O6RGfOhgRXhztG74_zt9kTXj0vlrPpClec0A47wiAva5AgcidKLQlwKB3tw0mlLIMCuAVWMgcOcu44yZmuC0E5yFoBH6O7wbuN7dcOUmc2PlUQgm2g3SXDlCxEwWgP3g9gFduUIjizjX5j44-hxPzNYbj5n6Mnbw9KmyobXLRN5dMRF1r2StFjNwPmAeD4HRS_5Ztl3A</recordid><startdate>19910601</startdate><enddate>19910601</enddate><creator>Hatakoshi, G.</creator><creator>Itaya, K.</creator><creator>Ishikawa, M.</creator><creator>Okajima, M.</creator><creator>Uematsu, Y.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>19910601</creationdate><title>Short-wavelength InGaAlP visible laser diodes</title><author>Hatakoshi, G. ; Itaya, K. ; Ishikawa, M. ; Okajima, M. ; Uematsu, Y.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c301t-f02e6bde5e46f4b950e3ebf111130c8a2e7e3ae2b2fefe63f30629d7413e5d8e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1991</creationdate><topic>Diode lasers</topic><topic>Exact sciences and technology</topic><topic>Fundamental areas of phenomenology (including applications)</topic><topic>Information processing</topic><topic>Laser stability</topic><topic>Lasers</topic><topic>Leakage current</topic><topic>Light sources</topic><topic>Optical materials</topic><topic>Optics</topic><topic>Photonic band gap</topic><topic>Physics</topic><topic>Power generation</topic><topic>Power lasers</topic><topic>Semiconductor lasers; laser diodes</topic><topic>Temperature</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Hatakoshi, G.</creatorcontrib><creatorcontrib>Itaya, K.</creatorcontrib><creatorcontrib>Ishikawa, M.</creatorcontrib><creatorcontrib>Okajima, M.</creatorcontrib><creatorcontrib>Uematsu, Y.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE journal of quantum electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Hatakoshi, G.</au><au>Itaya, K.</au><au>Ishikawa, M.</au><au>Okajima, M.</au><au>Uematsu, Y.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Short-wavelength InGaAlP visible laser diodes</atitle><jtitle>IEEE journal of quantum electronics</jtitle><stitle>JQE</stitle><date>1991-06-01</date><risdate>1991</risdate><volume>27</volume><issue>6</issue><spage>1476</spage><epage>1482</epage><pages>1476-1482</pages><issn>0018-9197</issn><eissn>1558-1713</eissn><coden>IEJQA7</coden><abstract>Results achieved on the operation of short-wavelength InGaAlP visible-light laser diodes are described. It is found that there is a strong correlation between operation temperature and oscillation wavelength. The deterioration of favorable temperature characteristics in the short-wavelength region is attributed to an increase in the leakage current, which originates in a small conduction-band discontinuity inherent in the InGaAlP material system. The introduction of a highly doped p-cladding layer improves these temperature characteristics. Short-wavelength oscillation at 630-nm-band wavelength was achieved for transverse-mode stabilized InGaAlP lasers.&lt; &gt;</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/3.89966</doi><tpages>7</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0018-9197
ispartof IEEE journal of quantum electronics, 1991-06, Vol.27 (6), p.1476-1482
issn 0018-9197
1558-1713
language eng
recordid cdi_ieee_primary_89966
source IEEE Electronic Library (IEL)
subjects Diode lasers
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Information processing
Laser stability
Lasers
Leakage current
Light sources
Optical materials
Optics
Photonic band gap
Physics
Power generation
Power lasers
Semiconductor lasers
laser diodes
Temperature
title Short-wavelength InGaAlP visible laser diodes
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-08T07%3A01%3A32IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Short-wavelength%20InGaAlP%20visible%20laser%20diodes&rft.jtitle=IEEE%20journal%20of%20quantum%20electronics&rft.au=Hatakoshi,%20G.&rft.date=1991-06-01&rft.volume=27&rft.issue=6&rft.spage=1476&rft.epage=1482&rft.pages=1476-1482&rft.issn=0018-9197&rft.eissn=1558-1713&rft.coden=IEJQA7&rft_id=info:doi/10.1109/3.89966&rft_dat=%3Cproquest_RIE%3E28574721%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=28574721&rft_id=info:pmid/&rft_ieee_id=89966&rfr_iscdi=true