Correlation Between Anode Area and Sensitivity for the TiN/GaN Schottky Barrier Diode Temperature Sensor

TiN/GaN Schottky barrier diodes with different anode diameters are fabricated to investigate the temperature sensing mechanism. All the circular diodes present good stability over a temperature range of 25 °C-200 °C. In the fully turn-on region, the sensitivity increases with the increasing diameter...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on electron devices 2020-03, Vol.67 (3), p.1171-1175
Hauptverfasser: Li, Xiaobo, Pu, Taofei, Li, Xianjie, Li, Liuan, Ao, Jin-Ping
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 1175
container_issue 3
container_start_page 1171
container_title IEEE transactions on electron devices
container_volume 67
creator Li, Xiaobo
Pu, Taofei
Li, Xianjie
Li, Liuan
Ao, Jin-Ping
description TiN/GaN Schottky barrier diodes with different anode diameters are fabricated to investigate the temperature sensing mechanism. All the circular diodes present good stability over a temperature range of 25 °C-200 °C. In the fully turn-on region, the sensitivity increases with the increasing diameter. Furthermore, the highest sensitivity of 1.22 mV/K is obtained for a 300-μm-diameter device at current of 20 mA, taking into account the series resistance. In the subthreshold region, the forward current (I D ) density determines the sensor sensitivity, in which a larger current density corresponds to a lower sensitivity. In addition, the strong dependence of the leakage current on the temperature indicates that the linearity of ln (I r ) versus temperature can be also used for sensor applications.
doi_str_mv 10.1109/TED.2020.2968358
format Article
fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_ieee_primary_8995794</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>8995794</ieee_id><sourcerecordid>2368182204</sourcerecordid><originalsourceid>FETCH-LOGICAL-c404t-9e475e16efcbb4b85157d230349a770ab97a4117b2a90fd57b0b54056b431f493</originalsourceid><addsrcrecordid>eNo9kE1LAzEQQIMoWKt3wUvA87b53GyO_bIKpR66nkN2d5amtpuaTZX-e7e2eBoG3puBh9AjJQNKiR7ms-mAEUYGTKcZl9kV6lEpVaJTkV6jHiE0SzTP-C26a9tNt6ZCsB5aT3wIsLXR-QaPIf4ANHjU-ArwKIDFtqnwCprWRfft4hHXPuC4Bpy75XBul3hVrn2Mn0c8tiE4CHjqTm4Ouz0EGw8B_nQf7tFNbbctPFxmH328zPLJa7J4n79NRoukFETERINQEmgKdVkUosgklapinHChrVLEFlpZQakqmNWkrqQqSCEFkWkhOK2F5n30fL67D_7rAG00G38ITffSMJ5mNGOMiI4iZ6oMvm0D1GYf3M6Go6HEnHqarqc59TSXnp3ydFYcAPzjmdZSacF_AU11cHU</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2368182204</pqid></control><display><type>article</type><title>Correlation Between Anode Area and Sensitivity for the TiN/GaN Schottky Barrier Diode Temperature Sensor</title><source>IEEE Electronic Library (IEL)</source><creator>Li, Xiaobo ; Pu, Taofei ; Li, Xianjie ; Li, Liuan ; Ao, Jin-Ping</creator><creatorcontrib>Li, Xiaobo ; Pu, Taofei ; Li, Xianjie ; Li, Liuan ; Ao, Jin-Ping</creatorcontrib><description>TiN/GaN Schottky barrier diodes with different anode diameters are fabricated to investigate the temperature sensing mechanism. All the circular diodes present good stability over a temperature range of 25 °C-200 °C. In the fully turn-on region, the sensitivity increases with the increasing diameter. Furthermore, the highest sensitivity of 1.22 mV/K is obtained for a 300-μm-diameter device at current of 20 mA, taking into account the series resistance. In the subthreshold region, the forward current (I D ) density determines the sensor sensitivity, in which a larger current density corresponds to a lower sensitivity. In addition, the strong dependence of the leakage current on the temperature indicates that the linearity of ln (I r ) versus temperature can be also used for sensor applications.</description><identifier>ISSN: 0018-9383</identifier><identifier>EISSN: 1557-9646</identifier><identifier>DOI: 10.1109/TED.2020.2968358</identifier><identifier>CODEN: IETDAI</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Anodes ; Gallium nitride ; Gallium nitrides ; GaN ; Leakage current ; Linearity ; reactive sputtering ; Schottky barrier diode (SBD) ; Schottky diodes ; Sensitivity ; Sensors ; Temperature measurement ; temperature sensor ; Temperature sensors ; TiN</subject><ispartof>IEEE transactions on electron devices, 2020-03, Vol.67 (3), p.1171-1175</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2020</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c404t-9e475e16efcbb4b85157d230349a770ab97a4117b2a90fd57b0b54056b431f493</citedby><cites>FETCH-LOGICAL-c404t-9e475e16efcbb4b85157d230349a770ab97a4117b2a90fd57b0b54056b431f493</cites><orcidid>0000-0002-3407-6404 ; 0000-0003-1685-0168 ; 0000-0002-0549-3508 ; 0000-0002-8964-7518</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/8995794$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/8995794$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Li, Xiaobo</creatorcontrib><creatorcontrib>Pu, Taofei</creatorcontrib><creatorcontrib>Li, Xianjie</creatorcontrib><creatorcontrib>Li, Liuan</creatorcontrib><creatorcontrib>Ao, Jin-Ping</creatorcontrib><title>Correlation Between Anode Area and Sensitivity for the TiN/GaN Schottky Barrier Diode Temperature Sensor</title><title>IEEE transactions on electron devices</title><addtitle>TED</addtitle><description>TiN/GaN Schottky barrier diodes with different anode diameters are fabricated to investigate the temperature sensing mechanism. All the circular diodes present good stability over a temperature range of 25 °C-200 °C. In the fully turn-on region, the sensitivity increases with the increasing diameter. Furthermore, the highest sensitivity of 1.22 mV/K is obtained for a 300-μm-diameter device at current of 20 mA, taking into account the series resistance. In the subthreshold region, the forward current (I D ) density determines the sensor sensitivity, in which a larger current density corresponds to a lower sensitivity. In addition, the strong dependence of the leakage current on the temperature indicates that the linearity of ln (I r ) versus temperature can be also used for sensor applications.</description><subject>Anodes</subject><subject>Gallium nitride</subject><subject>Gallium nitrides</subject><subject>GaN</subject><subject>Leakage current</subject><subject>Linearity</subject><subject>reactive sputtering</subject><subject>Schottky barrier diode (SBD)</subject><subject>Schottky diodes</subject><subject>Sensitivity</subject><subject>Sensors</subject><subject>Temperature measurement</subject><subject>temperature sensor</subject><subject>Temperature sensors</subject><subject>TiN</subject><issn>0018-9383</issn><issn>1557-9646</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kE1LAzEQQIMoWKt3wUvA87b53GyO_bIKpR66nkN2d5amtpuaTZX-e7e2eBoG3puBh9AjJQNKiR7ms-mAEUYGTKcZl9kV6lEpVaJTkV6jHiE0SzTP-C26a9tNt6ZCsB5aT3wIsLXR-QaPIf4ANHjU-ArwKIDFtqnwCprWRfft4hHXPuC4Bpy75XBul3hVrn2Mn0c8tiE4CHjqTm4Ouz0EGw8B_nQf7tFNbbctPFxmH328zPLJa7J4n79NRoukFETERINQEmgKdVkUosgklapinHChrVLEFlpZQakqmNWkrqQqSCEFkWkhOK2F5n30fL67D_7rAG00G38ITffSMJ5mNGOMiI4iZ6oMvm0D1GYf3M6Go6HEnHqarqc59TSXnp3ydFYcAPzjmdZSacF_AU11cHU</recordid><startdate>20200301</startdate><enddate>20200301</enddate><creator>Li, Xiaobo</creator><creator>Pu, Taofei</creator><creator>Li, Xianjie</creator><creator>Li, Liuan</creator><creator>Ao, Jin-Ping</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-3407-6404</orcidid><orcidid>https://orcid.org/0000-0003-1685-0168</orcidid><orcidid>https://orcid.org/0000-0002-0549-3508</orcidid><orcidid>https://orcid.org/0000-0002-8964-7518</orcidid></search><sort><creationdate>20200301</creationdate><title>Correlation Between Anode Area and Sensitivity for the TiN/GaN Schottky Barrier Diode Temperature Sensor</title><author>Li, Xiaobo ; Pu, Taofei ; Li, Xianjie ; Li, Liuan ; Ao, Jin-Ping</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c404t-9e475e16efcbb4b85157d230349a770ab97a4117b2a90fd57b0b54056b431f493</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Anodes</topic><topic>Gallium nitride</topic><topic>Gallium nitrides</topic><topic>GaN</topic><topic>Leakage current</topic><topic>Linearity</topic><topic>reactive sputtering</topic><topic>Schottky barrier diode (SBD)</topic><topic>Schottky diodes</topic><topic>Sensitivity</topic><topic>Sensors</topic><topic>Temperature measurement</topic><topic>temperature sensor</topic><topic>Temperature sensors</topic><topic>TiN</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Li, Xiaobo</creatorcontrib><creatorcontrib>Pu, Taofei</creatorcontrib><creatorcontrib>Li, Xianjie</creatorcontrib><creatorcontrib>Li, Liuan</creatorcontrib><creatorcontrib>Ao, Jin-Ping</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on electron devices</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Li, Xiaobo</au><au>Pu, Taofei</au><au>Li, Xianjie</au><au>Li, Liuan</au><au>Ao, Jin-Ping</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Correlation Between Anode Area and Sensitivity for the TiN/GaN Schottky Barrier Diode Temperature Sensor</atitle><jtitle>IEEE transactions on electron devices</jtitle><stitle>TED</stitle><date>2020-03-01</date><risdate>2020</risdate><volume>67</volume><issue>3</issue><spage>1171</spage><epage>1175</epage><pages>1171-1175</pages><issn>0018-9383</issn><eissn>1557-9646</eissn><coden>IETDAI</coden><abstract>TiN/GaN Schottky barrier diodes with different anode diameters are fabricated to investigate the temperature sensing mechanism. All the circular diodes present good stability over a temperature range of 25 °C-200 °C. In the fully turn-on region, the sensitivity increases with the increasing diameter. Furthermore, the highest sensitivity of 1.22 mV/K is obtained for a 300-μm-diameter device at current of 20 mA, taking into account the series resistance. In the subthreshold region, the forward current (I D ) density determines the sensor sensitivity, in which a larger current density corresponds to a lower sensitivity. In addition, the strong dependence of the leakage current on the temperature indicates that the linearity of ln (I r ) versus temperature can be also used for sensor applications.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TED.2020.2968358</doi><tpages>5</tpages><orcidid>https://orcid.org/0000-0002-3407-6404</orcidid><orcidid>https://orcid.org/0000-0003-1685-0168</orcidid><orcidid>https://orcid.org/0000-0002-0549-3508</orcidid><orcidid>https://orcid.org/0000-0002-8964-7518</orcidid></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0018-9383
ispartof IEEE transactions on electron devices, 2020-03, Vol.67 (3), p.1171-1175
issn 0018-9383
1557-9646
language eng
recordid cdi_ieee_primary_8995794
source IEEE Electronic Library (IEL)
subjects Anodes
Gallium nitride
Gallium nitrides
GaN
Leakage current
Linearity
reactive sputtering
Schottky barrier diode (SBD)
Schottky diodes
Sensitivity
Sensors
Temperature measurement
temperature sensor
Temperature sensors
TiN
title Correlation Between Anode Area and Sensitivity for the TiN/GaN Schottky Barrier Diode Temperature Sensor
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-02T14%3A18%3A31IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Correlation%20Between%20Anode%20Area%20and%20Sensitivity%20for%20the%20TiN/GaN%20Schottky%20Barrier%20Diode%20Temperature%20Sensor&rft.jtitle=IEEE%20transactions%20on%20electron%20devices&rft.au=Li,%20Xiaobo&rft.date=2020-03-01&rft.volume=67&rft.issue=3&rft.spage=1171&rft.epage=1175&rft.pages=1171-1175&rft.issn=0018-9383&rft.eissn=1557-9646&rft.coden=IETDAI&rft_id=info:doi/10.1109/TED.2020.2968358&rft_dat=%3Cproquest_RIE%3E2368182204%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2368182204&rft_id=info:pmid/&rft_ieee_id=8995794&rfr_iscdi=true