Correlation Between Anode Area and Sensitivity for the TiN/GaN Schottky Barrier Diode Temperature Sensor
TiN/GaN Schottky barrier diodes with different anode diameters are fabricated to investigate the temperature sensing mechanism. All the circular diodes present good stability over a temperature range of 25 °C-200 °C. In the fully turn-on region, the sensitivity increases with the increasing diameter...
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Veröffentlicht in: | IEEE transactions on electron devices 2020-03, Vol.67 (3), p.1171-1175 |
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creator | Li, Xiaobo Pu, Taofei Li, Xianjie Li, Liuan Ao, Jin-Ping |
description | TiN/GaN Schottky barrier diodes with different anode diameters are fabricated to investigate the temperature sensing mechanism. All the circular diodes present good stability over a temperature range of 25 °C-200 °C. In the fully turn-on region, the sensitivity increases with the increasing diameter. Furthermore, the highest sensitivity of 1.22 mV/K is obtained for a 300-μm-diameter device at current of 20 mA, taking into account the series resistance. In the subthreshold region, the forward current (I D ) density determines the sensor sensitivity, in which a larger current density corresponds to a lower sensitivity. In addition, the strong dependence of the leakage current on the temperature indicates that the linearity of ln (I r ) versus temperature can be also used for sensor applications. |
doi_str_mv | 10.1109/TED.2020.2968358 |
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All the circular diodes present good stability over a temperature range of 25 °C-200 °C. In the fully turn-on region, the sensitivity increases with the increasing diameter. Furthermore, the highest sensitivity of 1.22 mV/K is obtained for a 300-μm-diameter device at current of 20 mA, taking into account the series resistance. In the subthreshold region, the forward current (I D ) density determines the sensor sensitivity, in which a larger current density corresponds to a lower sensitivity. In addition, the strong dependence of the leakage current on the temperature indicates that the linearity of ln (I r ) versus temperature can be also used for sensor applications.</description><identifier>ISSN: 0018-9383</identifier><identifier>EISSN: 1557-9646</identifier><identifier>DOI: 10.1109/TED.2020.2968358</identifier><identifier>CODEN: IETDAI</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Anodes ; Gallium nitride ; Gallium nitrides ; GaN ; Leakage current ; Linearity ; reactive sputtering ; Schottky barrier diode (SBD) ; Schottky diodes ; Sensitivity ; Sensors ; Temperature measurement ; temperature sensor ; Temperature sensors ; TiN</subject><ispartof>IEEE transactions on electron devices, 2020-03, Vol.67 (3), p.1171-1175</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. 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All the circular diodes present good stability over a temperature range of 25 °C-200 °C. In the fully turn-on region, the sensitivity increases with the increasing diameter. Furthermore, the highest sensitivity of 1.22 mV/K is obtained for a 300-μm-diameter device at current of 20 mA, taking into account the series resistance. In the subthreshold region, the forward current (I D ) density determines the sensor sensitivity, in which a larger current density corresponds to a lower sensitivity. In addition, the strong dependence of the leakage current on the temperature indicates that the linearity of ln (I r ) versus temperature can be also used for sensor applications.</description><subject>Anodes</subject><subject>Gallium nitride</subject><subject>Gallium nitrides</subject><subject>GaN</subject><subject>Leakage current</subject><subject>Linearity</subject><subject>reactive sputtering</subject><subject>Schottky barrier diode (SBD)</subject><subject>Schottky diodes</subject><subject>Sensitivity</subject><subject>Sensors</subject><subject>Temperature measurement</subject><subject>temperature sensor</subject><subject>Temperature sensors</subject><subject>TiN</subject><issn>0018-9383</issn><issn>1557-9646</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kE1LAzEQQIMoWKt3wUvA87b53GyO_bIKpR66nkN2d5amtpuaTZX-e7e2eBoG3puBh9AjJQNKiR7ms-mAEUYGTKcZl9kV6lEpVaJTkV6jHiE0SzTP-C26a9tNt6ZCsB5aT3wIsLXR-QaPIf4ANHjU-ArwKIDFtqnwCprWRfft4hHXPuC4Bpy75XBul3hVrn2Mn0c8tiE4CHjqTm4Ouz0EGw8B_nQf7tFNbbctPFxmH328zPLJa7J4n79NRoukFETERINQEmgKdVkUosgklapinHChrVLEFlpZQakqmNWkrqQqSCEFkWkhOK2F5n30fL67D_7rAG00G38ITffSMJ5mNGOMiI4iZ6oMvm0D1GYf3M6Go6HEnHqarqc59TSXnp3ydFYcAPzjmdZSacF_AU11cHU</recordid><startdate>20200301</startdate><enddate>20200301</enddate><creator>Li, Xiaobo</creator><creator>Pu, Taofei</creator><creator>Li, Xianjie</creator><creator>Li, Liuan</creator><creator>Ao, Jin-Ping</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-3407-6404</orcidid><orcidid>https://orcid.org/0000-0003-1685-0168</orcidid><orcidid>https://orcid.org/0000-0002-0549-3508</orcidid><orcidid>https://orcid.org/0000-0002-8964-7518</orcidid></search><sort><creationdate>20200301</creationdate><title>Correlation Between Anode Area and Sensitivity for the TiN/GaN Schottky Barrier Diode Temperature Sensor</title><author>Li, Xiaobo ; Pu, Taofei ; Li, Xianjie ; Li, Liuan ; Ao, Jin-Ping</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c404t-9e475e16efcbb4b85157d230349a770ab97a4117b2a90fd57b0b54056b431f493</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Anodes</topic><topic>Gallium nitride</topic><topic>Gallium nitrides</topic><topic>GaN</topic><topic>Leakage current</topic><topic>Linearity</topic><topic>reactive sputtering</topic><topic>Schottky barrier diode (SBD)</topic><topic>Schottky diodes</topic><topic>Sensitivity</topic><topic>Sensors</topic><topic>Temperature measurement</topic><topic>temperature sensor</topic><topic>Temperature sensors</topic><topic>TiN</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Li, Xiaobo</creatorcontrib><creatorcontrib>Pu, Taofei</creatorcontrib><creatorcontrib>Li, Xianjie</creatorcontrib><creatorcontrib>Li, Liuan</creatorcontrib><creatorcontrib>Ao, Jin-Ping</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on electron devices</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Li, Xiaobo</au><au>Pu, Taofei</au><au>Li, Xianjie</au><au>Li, Liuan</au><au>Ao, Jin-Ping</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Correlation Between Anode Area and Sensitivity for the TiN/GaN Schottky Barrier Diode Temperature Sensor</atitle><jtitle>IEEE transactions on electron devices</jtitle><stitle>TED</stitle><date>2020-03-01</date><risdate>2020</risdate><volume>67</volume><issue>3</issue><spage>1171</spage><epage>1175</epage><pages>1171-1175</pages><issn>0018-9383</issn><eissn>1557-9646</eissn><coden>IETDAI</coden><abstract>TiN/GaN Schottky barrier diodes with different anode diameters are fabricated to investigate the temperature sensing mechanism. All the circular diodes present good stability over a temperature range of 25 °C-200 °C. In the fully turn-on region, the sensitivity increases with the increasing diameter. Furthermore, the highest sensitivity of 1.22 mV/K is obtained for a 300-μm-diameter device at current of 20 mA, taking into account the series resistance. In the subthreshold region, the forward current (I D ) density determines the sensor sensitivity, in which a larger current density corresponds to a lower sensitivity. In addition, the strong dependence of the leakage current on the temperature indicates that the linearity of ln (I r ) versus temperature can be also used for sensor applications.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TED.2020.2968358</doi><tpages>5</tpages><orcidid>https://orcid.org/0000-0002-3407-6404</orcidid><orcidid>https://orcid.org/0000-0003-1685-0168</orcidid><orcidid>https://orcid.org/0000-0002-0549-3508</orcidid><orcidid>https://orcid.org/0000-0002-8964-7518</orcidid></addata></record> |
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subjects | Anodes Gallium nitride Gallium nitrides GaN Leakage current Linearity reactive sputtering Schottky barrier diode (SBD) Schottky diodes Sensitivity Sensors Temperature measurement temperature sensor Temperature sensors TiN |
title | Correlation Between Anode Area and Sensitivity for the TiN/GaN Schottky Barrier Diode Temperature Sensor |
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