Design of SH Aging Sensor for Real Time and Application in Sensing Network

One of the most important issues in deep nanoscale regime CMOS circuits is related to the time-dependent performance degradation caused by negative bias temperature instability (NBTI). The integration of online aging sensor is becoming attractive methodologies in monitoring performance degradation o...

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Veröffentlicht in:	Canadian journal of electrical and computer engineering 2020-01, Vol.43 (2), p.73-82
Hauptverfasser:	Yuejun, Zhang, Zhicun, Luan, Dailu, Ding, Pengjun, Wang, Zhen, Li, Liwei, Li
Format:	Artikel
Sprache:	eng
Schlagworte:	Aging Aging sensor Circuits CMOS Delays detection window Logic gates Negative bias temperature instability negative bias temperature instability (NBTI) Performance degradation Real time Real-time systems sensing network Sensors Thermal variables control Time dependence
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